2 article(s) from Beyer, Hannes

  • Full Research Paper
  • Published 15 Mar 2016

  • PDF

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  1. Tino Wagner,
  2. Hannes Beyer,
  3. Patrick Reissner,
  4. Philipp Mensch,
  5. Heike Riel,
  6. Bernd Gotsmann and
  7. Andreas Stemmer
  • Full Research Paper
  • Published 23 Nov 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

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