1 article(s) from Boonpuek, Perawat
Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function
- Perawat Boonpuek and
- Jonathan R. Felts
Beilstein J. Nanotechnol. 2023, 14, 1200–1207, doi:10.3762/bjnano.14.99
Other Beilstein-Institut Open Science Activities
