3 article(s) from Dagdeviren, Omur E.

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

  1. Aaron Mascaro,
  2. Yoichi Miyahara,
  3. Tyler Enright,
  4. Omur E. Dagdeviren and
  5. Peter Grütter
  • Review
  • Published 01 Mar 2019

  • PDF

  • Supp. Info
Graphical Abstract

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

  • Full Research Paper
  • Published 20 Mar 2017

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

  1. Mehmet Z. Baykara,
  2. Omur E. Dagdeviren,
  3. Todd C. Schwendemann,
  4. Harry Mönig,
  5. Eric I. Altman and
  6. Udo D. Schwarz
  • Full Research Paper
  • Published 11 Sep 2012

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

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