2 article(s) from De Castro, Olivier
- Full Research Paper
- Published 11 Dec 2020
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Figure 1: (a) Schematic representation of the STIM experiment. (b) Picture of the inner part of the chamber. ...
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Figure 2: Micrographs of lacey carbon on carbon film. (a) Secondary electron imaging mode, (b) bright-field S...
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Figure 3: Bright-field image showing contrast due to the dependence of the exit angle on the material and the...
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Figure 4: Helium ion microscopy images of the nanoporous polycrystalline silicon membrane. (a) SE image. (b) ...
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Figure 5: Thallium chloride evaporated on a TEM grid. (a) Secondary electron image. Inset of (a) shows the re...
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Figure 6: STIM images of a single-crystalline silicon ⟨100⟩ membrane in (a) bright-field with θ ≤ 1.09°, and ...
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- Full Research Paper
- Published 07 Aug 2019
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Figure 1: Schematic of the transmission helium ion microscope (THIM).
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Figure 2: For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
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Figure 3: Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
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Figure 4: A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
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Figure 5: A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...
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