3 article(s) from Eswara, Santhana
- Full Research Paper
- Published 11 Dec 2020
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Figure 1: (a) Schematic representation of the STIM experiment. (b) Picture of the inner part of the chamber. ...
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Figure 2: Micrographs of lacey carbon on carbon film. (a) Secondary electron imaging mode, (b) bright-field S...
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Figure 3: Bright-field image showing contrast due to the dependence of the exit angle on the material and the...
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Figure 4: Helium ion microscopy images of the nanoporous polycrystalline silicon membrane. (a) SE image. (b) ...
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Figure 5: Thallium chloride evaporated on a TEM grid. (a) Secondary electron image. Inset of (a) shows the re...
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Figure 6: STIM images of a single-crystalline silicon ⟨100⟩ membrane in (a) bright-field with θ ≤ 1.09°, and ...
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- Full Research Paper
- Published 07 Aug 2019
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Figure 1: Schematic of the transmission helium ion microscope (THIM).
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Figure 2: For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
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Figure 3: Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
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Figure 4: A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
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Figure 5: A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...
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- Full Research Paper
- Published 09 Jul 2018
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Figure 1: Raman spectra of multiwalled carbon nanotubes after irradiation with different fluences of a) 25 ke...
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Figure 2: a) Ratio of intensities of D to G band as a function of fluence for 25 keV He and Ne irradiation, a...
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Figure 3: TEM images and Raman spectra after: (A–C) 25 keV He+ irradiation with a fluence of 1018 ions/cm2 (D...
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Figure 4: Nuclear and electronic energy loss as a function of sample thickness for a) He+ and b) Ne+ irradiat...
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Figure 5: Sputter yield a) at the top, and b) at the bottom of the sample as a function of fluence for Ne irr...
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Figure 6: Backscatter yield as a function of gold thickness for He and Ne irradiation of a 30 nm carbon film ...
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Figure 7: Displacements into the carbon layer normalised to incident ion as a function of gold thickness for ...
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Figure 8: Schematic illustration of the sample configuration and the sequence of techniques used in this inve...
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