2 article(s) from Grütter, Peter

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

  1. Aaron Mascaro,
  2. Yoichi Miyahara,
  3. Tyler Enright,
  4. Omur E. Dagdeviren and
  5. Peter Grütter
  • Review
  • Published 01 Mar 2019

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

Improved atomic force microscopy cantilever performance by partial reflective coating

  1. Zeno Schumacher,
  2. Yoichi Miyahara,
  3. Laure Aeschimann and
  4. Peter Grütter
  • Full Research Paper
  • Published 03 Jul 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

Keep Informed

RSS Feed

Subscribe to our Latest Articles RSS Feed.

Subscribe

Follow the Beilstein-Institut

LinkedIn

Twitter: @BeilsteinInst