1 article(s) from Ke, Peiling
Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization
- Yanping Wei,
- Jiafeng Shen,
- Yirong Yao,
- Xuke Li,
- Ming Li and
- Peiling Ke
Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142
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