4 article(s) from Klingner, Nico
A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents
- Annalena Wolff,
- Nico Klingner,
- William Thompson,
- Yinghong Zhou,
- Jinying Lin and
- Yin Xiao
Beilstein J. Nanotechnol. 2024, 15, 1197–1207, doi:10.3762/bjnano.15.97
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
- Eduardo Serralta,
- Nico Klingner,
- Olivier De Castro,
- Michael Mousley,
- Santhana Eswara,
- Serge Duarte Pinto,
- Tom Wirtz and
- Gregor Hlawacek
Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167
Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources
- Nico Klingner,
- Gregor Hlawacek,
- Paul Mazarov,
- Wolfgang Pilz,
- Fabian Meyer and
- Lothar Bischoff
Beilstein J. Nanotechnol. 2020, 11, 1742–1749, doi:10.3762/bjnano.11.156
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
- Michael Mousley,
- Santhana Eswara,
- Olivier De Castro,
- Olivier Bouton,
- Nico Klingner,
- Christoph T. Koch,
- Gregor Hlawacek and
- Tom Wirtz
Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160
Other Beilstein-Institut Open Science Activities
