2 article(s) from Meier, Tobias
Figure 1: (a) Summary of optical characterization. The transmittance for the different samples is plotted ver...
Figure 2: Summary of mechanical parameters for all samples, obtained using CRFM: (a) thick and (b) thin sampl...
Figure 3: Typical correlated electro-mechanical properties of the thin samples: PEDOT:PSS (a–d), Laponite RD ...
Figure 4: Measurement of virial and dissipated power for the second eigenmode of the cantilever in bimodal AF...
Figure 5: (a) Strain (vertical axis) produced by bimodal AFM in the nanocomposite film for different Laponite...
Figure 6: (a) Schematic illustration of the overall sample structure and the consecutive imaging of C-AFM and...
Figure 7: Transmission probability for a multibarrier system for the energy levels of the PCEO model. Three d...
Figure 8: Electro-mechanical response of the transparent (thin) Laponite RD nanocomposite to the high-pressur...
Figure 1: Schematic and photo of the setup including the optical beam deflection and the nested scanner desig...
Figure 2: A crucial precondition for a nested high resolution scanner design is the stability of the housing ...
Figure 3: a) Optical microscopy image of a SiOx calibration grating with various feature sizes. Demonstration...
Figure 4: a) Overlay of the optical microscope image with the AFM topography of an optical grating structure ...
Figure 5: Characterization of AFM cantilevers equipped with strain sensitive TMR sensors. a) The cantilevers ...
Figure 6: a) To improve lateral resolution, tips with a tip radius of 30 nm were grown by a combination of fo...
Figure 7: Dynamic mode imaging of FDTS-SAM samples using a TMR sensor with the feedback on amplitude and phas...