2 article(s) from Mousley, Michael
(a) Schematic representation of the STIM experiment. (b) Picture of the inner part of the chamber. ...
Jump to Figure 1
Micrographs of lacey carbon on carbon film. (a) Secondary electron imaging mode, (b) bright-field S...
Jump to Figure 2
Bright-field image showing contrast due to the dependence of the exit angle on the material and the...
Jump to Figure 3
Helium ion microscopy images of the nanoporous polycrystalline silicon membrane. (a) SE image. (b) ...
Jump to Figure 4
Thallium chloride evaporated on a TEM grid. (a) Secondary electron image. Inset of (a) shows the re...
Jump to Figure 5
STIM images of a single-crystalline silicon ⟨100⟩ membrane in (a) bright-field with θ ≤ 1.09°, and ...
Jump to Figure 6
Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167
Schematic of the transmission helium ion microscope (THIM).
For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...
Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut