4 article(s) from Philipp, Patrick
- Full Research Paper
- Published 21 Sep 2022
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Figure 1: Fit of the DFT data for the argon–silicon potential in (a) the 1–5 Å region, with the potential wel...
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Figure 2: Visualisations of the samples during equilibration steps: (a) represents the silicon sample after S...
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Figure 3: Representations of (a) clean and (b) contaminated samples. The silicon atoms are shown in yellow, o...
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Figure 4: Bond length distributions for the pristine sample (blue) and the contaminated sample (pink) regardl...
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Figure 5: Evolution of bond lengths in the contaminated sample under bombardment. (a) The first graph shows b...
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Figure 6: Evolution of the clean (a, b, c) and contaminated (d, e, f) samples under ion irradiation, before t...
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Figure 7: Representation of each region in the sample, the amorphous region is the one with the highest disor...
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Figure 8: Evolution of the μ coefficient with respect to the angle for (a) pristine and (b) contaminated samp...
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Figure 9: Radial distribution function for (a) clean and (b) contaminated samples for all previously determin...
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Figure 10: Comparison of the radial distribution function for both samples in the amorphous layer. The same cu...
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Figure 11: Comparison of the radial distribution function in the amorphous slab of the contaminated sample wit...
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Figure 12: Comparison between samples after irradiation with an incident beam at 100 eV and 85° for (a) the pr...
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Figure 13: Distribution of implanted contaminants, (a) oxygen, (b) hydrogen and (c) argon, with respect to the...
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Figure 14: Number of argon atoms retained in the sample, regardless of the depth of implantation, with respect...
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Figure 15: Evolution of the Si–O (a) and Si–H (b) products with respect to the fluence and the angle.
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Figure 16: Sputtering yields of pristine and contaminated samples with respect to the incidence angle. For the...
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Figure 17: Fraction of the contaminants sputtered after 500 impacts with respect to the angle. The values are ...
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Figure 18: Sputtering yields for (a) silicon-related and (b) oxygen-related clusters.
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Figure 19: Graph showing the probability to dissociate at least one water cluster per impact, with respect to ...
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- Full Research Paper
- Published 09 Jul 2018
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Figure 1: Raman spectra of multiwalled carbon nanotubes after irradiation with different fluences of a) 25 ke...
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Figure 2: a) Ratio of intensities of D to G band as a function of fluence for 25 keV He and Ne irradiation, a...
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Figure 3: TEM images and Raman spectra after: (A–C) 25 keV He+ irradiation with a fluence of 1018 ions/cm2 (D...
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Figure 4: Nuclear and electronic energy loss as a function of sample thickness for a) He+ and b) Ne+ irradiat...
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Figure 5: Sputter yield a) at the top, and b) at the bottom of the sample as a function of fluence for Ne irr...
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Figure 6: Backscatter yield as a function of gold thickness for He and Ne irradiation of a 30 nm carbon film ...
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Figure 7: Displacements into the carbon layer normalised to incident ion as a function of gold thickness for ...
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Figure 8: Schematic illustration of the sample configuration and the sequence of techniques used in this inve...
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- Full Research Paper
- Published 17 Nov 2016
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Figure 1: Initial sample composition for a) sample #1, b) sample #2, and c) sample #3. All samples have inter...
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Figure 2: Sample composition as a function of depth and primary ion fluence for 1 keV He+ irradiation of samp...
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Figure 3: Sample composition as a function of depth and primary ion fluence for 1 keV He+ irradiation of samp...
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Figure 4: Sample composition as a function of depth and primary ion fluence for 20 keV Ne+ irradiation of sam...
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Figure 5: Sample composition as a function of depth and primary ion fluence for 20 keV Ar+ irradiation of sam...
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Figure 6: Simulated depth profiles for a) 20 keV Ne+ irradiation of sample #1 with 10 nm and 20 nm inter-laye...
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Figure 7: Sample composition as a function of depth and primary ion fluence for 1 keV Ne+ irradiation of samp...
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Figure 8: Sample composition as a function of depth and primary ion fluence for 1 keV Ne+ irradiation of samp...
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Figure 9: Simulated depth profiles for a) 1 keV Ne+ irradiation of sample #1, b) 1 keV Ne+ irradiation of sam...
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Figure 10: Simulated depth profiles for a) 1 keV Ne+ irradiation of sample #2, b) 1 keV Ar+ irradiation of sam...
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- Full Research Paper
- Published 02 Aug 2016
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Figure 1: Changing topography of PMMA bombarded by 5.5 keV Ne+ as a function of fluence (FOV: 1 × 1 µm2).
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Figure 2: RMS roughness changing with primary He+ and Ne+ fluence when bombarding (a) PMMA and (b) PS.
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Figure 3: Displacement of He, Ne and Ar from their initial positions in HD-PMMA sample at 300 K. No periodic ...
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Figure 4: Mean square displacement (MSD) of helium, neon and argon at 300 K in a) HD-PE, b) HD-PS, c) HD-PMMA...
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Figure 5: Implantation profiles in polyethylene obtained by SD_TRIM_SP for diffusion coefficient ranging from...
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Figure 6: Surface sputtering vs swelling for different diffusion coefficients for helium irradiation of PE.
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Figure 7: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PE at ...
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Figure 8: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PTFE a...
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Figure 9: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PMMA a...
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Figure 10: Partial sputter yields for the different chemical elements sputtered from a) PTFE, b) PE, c) PMMA, ...
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Figure 11: Surface composition as a function of impact energy for helium, neon and argon bombardment of a) F a...
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Figure 12: Concentration profiles of F and C at a fluence of 1018 ions/cm2 for He, Ne and Ar bombardment of PT...
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Figure 13: Concentration profiles of H and C at a fluence of 1018 ions/cm2 for He, Ne and Ar bombardment of PE...
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