2 article(s) from Pollard, Andrew J

Time of flight secondary ion mass spectrometry imaging of contaminant species in chemical vapour deposited graphene on copper

  • Barry Brennan,
  • Vlad-Petru Veigang-Radulescu,
  • Philipp Braeuninger-Weimer,
  • Stephan Hofmann and
  • Andrew J. Pollard

Beilstein J. Nanotechnol. 2026, 17, 200–213, doi:10.3762/bjnano.17.13

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Published 21 Jan 2026

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

  • Keith R. Paton,
  • Konstantinos Despotelis,
  • Naresh Kumar,
  • Piers Turner and
  • Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

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Published 24 Apr 2023
 
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