1 article(s) from Schmied, Roland
(a) Classification of proximal shapes (right hand side). The grey box indicates the intended deposi...
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(a) Radius of the outer halo (AFM-based) of 30 keV PtC deposits as a function of the central pad th...
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Representative AFM height image (a) of a 9 nm thick PtC deposit on Si–SiO2 fabricated at 25 keV tog...
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AFM height images with overlaid current information of PtC pads deposited on an conductive Au elect...
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(a) Functional classification of proximity deposition based on KFM measurements. (b) and (c) show t...
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Edge-broadening effect for 30 keV deposits of different thickness. (a) shows a normalized height re...
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Broadening effects for 5 keV deposits of different thickness. (b) shows the normalized height repre...
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Outer-halo behavior for increasing pad thicknesses of 5 keV deposits (squares) together with an FSE...
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(a) AFM height cross section of a 20 keV deposit. (b) cumulative BSE emission (blue, left axis) and...
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Beilstein J. Nanotechnol. 2015, 6, 462–471, doi:10.3762/bjnano.6.47
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