1 article(s) from Schmied, Roland
- Full Research Paper
- Published 16 Feb 2015
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Figure 1: (a) Classification of proximal shapes (right hand side). The grey box indicates the intended deposi...
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Figure 2: (a) Radius of the outer halo (AFM-based) of 30 keV PtC deposits as a function of the central pad th...
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Figure 3: Representative AFM height image (a) of a 9 nm thick PtC deposit on Si–SiO2 fabricated at 25 keV tog...
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Figure 4: AFM height images with overlaid current information of PtC pads deposited on an conductive Au elect...
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Figure 5: (a) Functional classification of proximity deposition based on KFM measurements. (b) and (c) show t...
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Figure 6: Edge-broadening effect for 30 keV deposits of different thickness. (a) shows a normalized height re...
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Figure 7: Broadening effects for 5 keV deposits of different thickness. (b) shows the normalized height repre...
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Figure 8: Outer-halo behavior for increasing pad thicknesses of 5 keV deposits (squares) together with an FSE...
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Figure 9: (a) AFM height cross section of a 20 keV deposit. (b) cumulative BSE emission (blue, left axis) and...
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