3 article(s) from Shen, Wanfu
Beilstein J. Nanotechnol. 2019, 10, 1922–1922, doi:10.3762/bjnano.10.187
Topological phase and characterization of 1T’-WTe2. a) Side and top views of lattice structures of ...
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Identification of the lattice anisotropy of an exfoliated 1T’-WTe2 flake. a) AFM image of the 1T’-W...
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Angle-resolved DC conductivity of a 1T’-WTe2 thin film. a) Optical image of s WTe2 flake with 12 el...
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Wavelength- and angle-dependent photoelectric properties of 1T’-WTe2. a,b) The I–V curves of test a...
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Angle-resolved photocurrent response of the photodetector based on 1T’-WTe2. a) Real-time photocurr...
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Wavelength-resolved photocurrent response of the photodetector fabricated with 1T’-WTe2. a,b) The r...
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Beilstein J. Nanotechnol. 2019, 10, 1745–1753, doi:10.3762/bjnano.10.170
The results of the ex situ characterization. (a) A photograph representing the 10 × 10 mm substrate...
(a) Differential transmittance (DT) spectra (ΔT/T) recorded during CVD growth. The time interval be...
(a) Schematic for the CVD growth of monolayer MoS2. (b) Temperature profiles for the substrate, MoO3...
Beilstein J. Nanotechnol. 2019, 10, 557–564, doi:10.3762/bjnano.10.57
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