2 article(s) from Tal, Oren
(a) Schematic of a mechanically controllable break junction device. Inset: Schematic of a vanadocen...
Jump to Figure 1
(a) Differential conductance vs applied voltage (dI/dV vs V) spectra measured at ≈0.6 G0 zero-volta...
Jump to Figure 2
(a,b) Conductance traces measured for the Ag–vanadocene junction (black curve) and the experimental...
Jump to Figure 3
(a−h) Examples for sets of conductance traces taken during repeated junction breaking with differen...
Jump to Figure 4
Beilstein J. Nanotechnol. 2018, 9, 1471–1477, doi:10.3762/bjnano.9.138
(a) Differential conductance vs applied bias voltage (dI/dV vs V) measured for a silver/copper–phth...
(a) Differential conductance curves measured during the elongation process of the junction. The red...
Conductance–length histograms, indicating the most probable conductance of the junction during the ...
Beilstein J. Nanotechnol. 2015, 6, 2417–2422, doi:10.3762/bjnano.6.249
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut