1 article(s) from Wang, Xingya

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

  1. Ying Wang,
  2. Yue Shen,
  3. Xingya Wang,
  4. Zhiwei Shen,
  5. Bin Li,
  6. Jun Hu and
  7. Yi Zhang
  • Full Research Paper
  • Published 16 Mar 2018

  • PDF

  • Supp. Info
Graphical Abstract

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

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