3 article(s) from Zhang, Yi

Scanning probe microscopy for energy-related materials

  1. Rüdiger Berger,
  2. Benjamin Grévin,
  3. Philippe Leclère and
  4. Yi Zhang
  • Editorial
  • Published 10 Jan 2019

Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12

  • Full Research Paper
  • Published 11 Apr 2018

  • PDF

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

  1. Ying Wang,
  2. Yue Shen,
  3. Xingya Wang,
  4. Zhiwei Shen,
  5. Bin Li,
  6. Jun Hu and
  7. Yi Zhang
  • Full Research Paper
  • Published 16 Mar 2018

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

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