3 article(s) from Zhang, Yi
Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12
Characterizing the degree of reduction of GO sheets reduced using various methods. C 1s XPS spectra...
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Characterizing the degree of reduction of GO sheets using EFM imaging and EFS: (a) tapping AFM imag...
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Illustrative diagram of EFM imaging and EFS: (a) schematic depiction of EFM, (b) electrostatic forc...
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Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106
Schematic representation of the experimental principle. (a) A dc voltage can be applied to the AFM ...
AFM height and adhesion images of single-layered CRGO sheets under different tip biases obtained in...
Discrimination of GO and CRGO on mica by adhesion mapping with a biased AFM tip. (a) Height and (b)...
The dependence of the adhesion force on the AFM tip bias for three types of single-layered GO and R...
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Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84
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