Dr. Ray Duffy

Guest Editor

Tyndall National Institute/University College Cork


Thematic Issue

Dr. Duffy edited the thematic issue in the Beilstein Journal of Nanotechnology:

Metrology and technology computer aided design for the sub-10 nm technology node

Back to Editorial Board

Other Beilstein-Institut Open Science Activities

Keep Informed

RSS Feed

Subscribe to our Latest Articles RSS Feed.


Follow the Beilstein-Institut


Twitter: @BeilsteinInst