Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• OTS on Si(111) Particle lithography with an immersion step was used to prepare nanoholes within a film of OTS. A topographic view of the nanoholes is shown in Figure 2a, with the simultaneously acquired phase image (Figure 2b).The ex situ images were acquired with tapping-mode AFM in air. The

• sonication step was repeated 4 times and then the samples were dried under nitrogen. Atomic force microscopy Samples were characterized using a model 5500 atomic force microscope (Keysight Technologies, Santa Rosa, CA). Images of samples were acquired using tapping-mode in ambient air. Silicon nitride tips

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• ., Manchester, UK), UV–vis absorption spectra (Lambda 750 UV/VIS/NIR spectrometer, PerkinElmer, Inc., Waltham, MA, USA) and SPFM. In the SPFM, a DC or AC bias is applied to a tapping mode AFM tip, generating an electrostatic attractive force (polarization force) between the biased tip and the polarized charge

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• a two-dimensional magnetization map can be recorded. MFM analysis was performed with a VEECO EnviroScope system, working in tapping mode with amplitude detection feedback. The MFM maps were acquired in two-pass lift-mode, with the magnetic signal collected about 30 nm above the surface. The probe

Automated image segmentation-assisted flattening of atomic force microscopy images

• Yuliang Wang,
• Tongda Lu,
• Xiaolai Li and
• Huimin Wang

Beilstein J. Nanotechnol. 2018, 9, 975–985, doi:10.3762/bjnano.9.91

• AFM (Resolve, Bruker) in tapping mode with 96% setpoint value. A silicon cantilever (NSC36/ALBS, MikroMasch) with quoted stiffness of 0.6 N/m and tip radius of 8 nm was used for scanning. The scanning frequency and scanning angle were 2 Hz and 0°, respectively. Methods The step-by-step procedure of

Electro-optical interfacial effects on a graphene/π-conjugated organic semiconductor hybrid system

• Karolline A. S. Araujo,
• Luiz A. Cury,
• Matheus J. S. Matos,
• Thales F. D. Fernandes,
• Luiz G. Cançado and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2018, 9, 963–974, doi:10.3762/bjnano.9.90

• peak force or tapping mode. Besides conventional topographic images, peak force mode yields several concomitant images which map mechanical properties of the sample, like adhesion, elastic modulus, dissipation and others [64]. The adhesion channel monitors tip–sample attractive forces along the imaging

Scanning speed phenomenon in contact-resonance atomic force microscopy

• Christopher C. Glover,
• Jason P. Killgore and
• Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

• ] and Tyrell et al. [40] were able to image nanobubbles in tapping mode and found that the bubbles could be easily moved by the probe tip and could not be imaged in contact mode. The presence of nanobubbles on the hydrophobic HOPG sample may prevent a continuous film from forming. The scan speed

Comparative study of antibacterial properties of polystyrene films with TiO_x and Cu nanoparticles fabricated using cluster beam technique

• Vladimir N. Popok,
• Cesarino M. Jeppesen,
• Peter Fojan,
• Anna Kuzminova,
• Jan Hanuš and
• Ondřej Kylián

Beilstein J. Nanotechnol. 2018, 9, 861–869, doi:10.3762/bjnano.9.80

• studied by AFM in tapping mode using Ntegra Aura nanolaboratory (from NT-MDT). Commercial cantilevers with sharp silicon tips (radius of curvature <10 nm, force constant of 3.5–6.0 N/m) are used. SEM analysis is carried out by means of Mira3 (Tescan) microscope operated with accelerating voltage of 30 kV

Graphene composites with dental and biomedical applicability

• Sharali Malik,
• Felicite M. Ruddock,
• Adam H. Dowling,
• Kevin Byrne,
• Wolfgang Schmitt,
• Ivan Khalakhan,
• Yoshihiro Nemoto,
• Hongxuan Guo,
• Lok Kumar Shrestha,
• Katsuhiko Ariga and
• Jonathan P. Hill

Beilstein J. Nanotechnol. 2018, 9, 801–808, doi:10.3762/bjnano.9.73

• ). Characterization The MLG and FLG material was characterized by Raman spectroscopy (Renishaw at 514 nm) and the AFM measurements were performed on a MultiMode V AFM (Veeco) in tapping mode under ambient conditions. RTESP silicon probes (Veeco) were used with a nominal tip radius of 10 nm and nominal spring constant

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

• Daiki Katsube,
• Hayato Yamashita,
• Satoshi Abo and
• Masayuki Abe

Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63

• deposition, a deposited sample was taken out into the ambient atmosphere and its topography was measured with a tapping AFM in air. Although it is difficult to obtain atomic resolution images in tapping mode, the larger scanning area of tapping AFM enabled us to check whether a step-and-terrace surface was

• rate fp = 2.0 Hz on a LaAlO3(100) substrate. The sample was then taken out of vacuum, and its surface was measured with tapping mode AFM in air as shown in Figure 3a. It was found that an atomically flat area did not exist on the surface, instead grain structures appeared on the surface. A peak for

• view of the combined PLD/AFM system. STM measurements can also be performed. LEED and RHEED apparatuses are also installed. The AFM (and also STM) is operated at room temperature in UHV. (a) Sample holder and (b) holder stocker used in the PLD camber. (a–d) Tapping mode AFM images of anatase-TiO2(001

Tuning adhesion forces between functionalized gold colloidal nanoparticles and silicon AFM tips: role of ligands and capillary forces

• Sven Oras,
• Sergei Vlassov,
• Marta Berholts,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2018, 9, 660–670, doi:10.3762/bjnano.9.61

• , but also by the interactions of the NPs and silicon substrate during nanomanipulation in AFM in tapping mode [23]. Despite its inertness [24], Au NPs can be relatively easily functionalized with organic ligands resulting in the formation of stable colloids [23][25]. The possibility of changing the

Kinetics of solvent supported tubule formation of Lotus (Nelumbo nucifera) wax on highly oriented pyrolytic graphite (HOPG) investigated by atomic force microscopy

• Sujit Kumar Dora,
• Kerstin Koch,
• Wilhelm Barthlott and
• Klaus Wandelt

Beilstein J. Nanotechnol. 2018, 9, 468–481, doi:10.3762/bjnano.9.45

• taken in account to understand how different factors affecting self-assembly of these tubules on HOPG. Koch et al. [21] demonstrated that self-assembly of nonacosan-10-ol tubules resulted in an upright orientation of tubules on HOPG. By employing tapping mode atomic force microscopy (AFM), they observed

Wafer-scale bioactive substrate patterning by chemical lift-off lithography

• Chong-You Chen,
• Chang-Ming Wang,
• Hsiang-Hua Li,
• Hong-Hseng Chan and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2018, 9, 311–320, doi:10.3762/bjnano.9.31

• tapping mode atomic force microscopy (AFM, Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Topographic AFM images were collected using a silicon cantilever with a spring constant of 48 N/m and a resonance frequency of 190 kHz (Nanosensors, Neuchatel, Switzerland). The substrates were gently

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

• Weijie Zhang,
• Yuhang Chen,
• Xicheng Xia and
• Jiaru Chu

Beilstein J. Nanotechnol. 2017, 8, 2771–2780, doi:10.3762/bjnano.8.276

• modulation and resonance frequency in contact resonance AFM are used to extract the mechanical properties quantitatively [16][17]. However, the continuous tip–sample contact may cause severe sample damage or tip wear. In tapping mode, the tip can touch the sample periodically. Due to the nonlinear contact

• tapping mode AFM, the contact force and contact time per oscillation period dominate the harmonic signals [27]. These two quantities are assumed to be related to the amplitude set-point. It is well known that the peak force in tapping mode scales with the amplitude feedback settings [28]. However, the

• for applications in numerous research fields such as material science and nanobiology. Experimental The harmonic imaging experiments were performed on a commercial AFM (MFP-3D Origin, Asylum Research, Santa Barbara, CA). The operation was similar to conventional tapping mode. An extra lock-in

Robust nanobubble and nanodroplet segmentation in atomic force microscope images using the spherical Hough transform

• Yuliang Wang,
• Tongda Lu,
• Xiaolai Li,
• Shuai Ren and
• Shusheng Bi

Beilstein J. Nanotechnol. 2017, 8, 2572–2582, doi:10.3762/bjnano.8.257

• both air and DI water using a commercial AFM (Resolve, Bruker) in tapping mode with 96% setpoint value. Silicon cantilevers (NSC36/ALBS, MikroMasch) with a quoted stiffness of 0.6 N/m and tip radius of 8 nm were used for scanning. The measured resonance frequencies of the cantilever were 55 kHz and 16

Comparing postdeposition reactions of electrons and radicals with Pt nanostructures created by focused electron beam induced deposition

• Julie A. Spencer,
• Michael Barclay,
• Miranda J. Gallagher,
• Robert Winkler,
• Ilyas Unlu,
• Yung-Chien Wu,
• Harald Plank,
• Lisa McElwee-White and
• D. Howard Fairbrother

Beilstein J. Nanotechnol. 2017, 8, 2410–2424, doi:10.3762/bjnano.8.240

• times (TET) per pixel. The deposits were created on a 1 × 1 cm² silicon wafer (3 nm surface oxide) and spaced 5 µm apart from one another. The height and roughness characterization was done with via AFM (FastScan Bio, Bruker AXS, USA) in tapping mode and postprocessed with Gwyddion 2.44 software

Increasing the stability of DNA nanostructure templates by atomic layer deposition of Al₂O₃ and its application in imprinting lithography

• Hyojeong Kim,
• Kristin Arbutina,
• Anqin Xu and
• Haitao Liu

Beilstein J. Nanotechnol. 2017, 8, 2363–2375, doi:10.3762/bjnano.8.236

• different locations. Atomic Force Microscopy: The surface morphologies of a DNA nanostructure master template and a PLLA stamp at each step of fabrication process were imaged using tapping-mode on an MFP-3D atomic force microscope with RTESPA-300, NSC15/Al BS, or SSS-FMR-SPL AFM probes in air at room

Tailoring the nanoscale morphology of HKUST-1 thin films via codeposition and seeded growth

• Landon J. Brower,
• Lauren K. Gentry,
• Amanda L. Napier and
• Mary E. Anderson

Beilstein J. Nanotechnol. 2017, 8, 2307–2314, doi:10.3762/bjnano.8.230

• × 500 nm and used a Dimension Icon atomic force microscope (Bruker, Santa Barbara, CA, USA), which was operated in peak force tapping mode. Etched silicon tips, SCANASYST-AIR (Bruker, Santa Barbara, CA, USA), with a spring constant range of 0.2–0.8 N/m and a resonant frequency range of 45–95 kHz were

Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223

• surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By focusing on the material perspective and employing a rigorous rheological approach, we deliver analytical closed

• imaging method. Keywords: atomic force microscopy; harmonic functions; tapping-mode AFM; viscoelasticity; Introduction Several current applications demand physical understanding of soft dissipative materials at the nanoscale [1][2][3][4][5]. This type of materials, such as polymers, biological cells and

• damage induced by constant tip drag. Additionally, these methods are prone to significant tip wear and contamination which could make quantitative characterization unreliable due to constant changes in tip geometry. Dynamic methods have been designed to overcome the above issues, whereby tapping-mode AFM

A comparative study of the nanoscale and macroscale tribological attributes of alumina and stainless steel surfaces immersed in aqueous suspensions of positively or negatively charged nanodiamonds

• Colin K. Curtis,
• Antonin Marek,
• Alex I. Smirnov and
• Jacqueline Krim

Beilstein J. Nanotechnol. 2017, 8, 2045–2059, doi:10.3762/bjnano.8.205

• topology characterization of the QCM electrodes was performed with an Asylum Research MFP 3D AFM equipped with silicon nitride tips (part#NCHV-A, Bruker AFM Probes, Camarillo, CA) and operated in a tapping mode. The 1024 × 1024 images were recorded at a rate of 1 line/s yielding a height profile h = h(xi

Application of visible-light photosensitization to form alkyl-radical-derived thin films on gold

• Rashanique D. Quarels,
• Xianglin Zhai,
• Neepa Kuruppu,
• Jenny K. Hedlund,
• Ashley A. Ellsworth,
• Amy V. Walker,
• Jayne C. Garno and
• Justin R. Ragains

Beilstein J. Nanotechnol. 2017, 8, 1863–1877, doi:10.3762/bjnano.8.187

• spring constant of 40 N/m (Budget Sensors, Innovative Solutions Bulgaria Ltd.) were used to acquire topography and corresponding phase images with tapping mode. Nanoshaving experiments were conducted using a liquid cell containing ethanolic solution. Contact mode in liquid was used for nanoshaving using

• sample in ambient conditions for six months, using tapping mode AFM (Figure 5). The arrangement and locations of nanopores can still be resolved with AFM topographs (Figure 5a). The surface coverage of the Au–NHBoc film measured 83%, which is consistent with the value measured from the freshly prepared

• subjected to contact angle goniometry and IRRAS analysis. Atomic force microscopy (AFM): The deposition of a thin film using phthalimide ester Phth–Me combined with particle lithography produced a periodic arrangement of nanopores within a thin film of Au–Me on Au(111). The sample was imaged with tapping

Methionine-mediated synthesis of magnetic nanoparticles and functionalization with gold quantum dots for theranostic applications

• Arūnas Jagminas,
• Agnė Mikalauskaitė,
• Vitalijus Karabanovas and
• Jūrate Vaičiūnienė

Beilstein J. Nanotechnol. 2017, 8, 1734–1741, doi:10.3762/bjnano.8.174

• ) was used to take three-dimensional (3D) images of gold nanoparticles. TESPA-V2 cantilevers (Veeco Instruments Inc., USA) with a tip curvature of 8 nm were used. Measurements were performed in the tapping mode in air. Images were acquired at the scan rate of 1 Hz per line with the 512 × 512 pixel image

Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy

• Markus Moosmann,
• Thomas Schimmel,
• Wilhelm Barthlott and
• Matthias Mail

Beilstein J. Nanotechnol. 2017, 8, 1671–1679, doi:10.3762/bjnano.8.167

• showing long-term stable air retention, we were able to image the air–water interface by AFM. In Figure 5, the data measured from the ideal sample in ambient conditions and in water are compared. The image of Figure 5a was taken in ambient conditions in tapping mode. It shows a row of pillars validating

• . Characterization by atomic force microscopy (AFM) AFM images were made with a commercial AFM system (Dimension ICON, Bruker) operated by a Nanoscope V controller (Bruker). Imaging under ambient conditions was conducted in tapping mode with NSC 15 cantilevers (MikroMasch) with a nominal force constant of 40 N/m and

• , the interfaces separating the wetted areas from the air-retaining areas followed exactly the alignment of the micro-pillars. AFM images (a, c) and the corresponding cross-sections (red lines in b, d) of the sample. The image in a) was taken in ambient conditions in tapping mode and confirms the pillar

High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

• Juan Ren and
• Qingze Zou

Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158

• ) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced

• quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging. Keywords: adaptive multiloop mode; atomic force microscopy (AFM); heterogeneous polymer sample; tapping-mode

• imaging; Introduction In this paper, the adaptive-multiloop imaging mode of atomic force microscopy (AFM) is tested and evaluated by imaging three largely different heterogeneous polymer samples. AMLM imaging substantially increases the speed of tapping mode (TM) imaging (by over an order of magnitude

A nanocomplex of C₆₀ fullerene with cisplatin: design, characterization and toxicity

• Svitlana Prylutska,
• Svitlana Politenkova,
• Kateryna Afanasieva,
• Volodymyr Korolovych,
• Kateryna Bogutska,
• Andriy Sivolob,
• Larysa Skivka,
• Maxim Evstigneev,
• Viktor Kostjukov,
• Yuriy Prylutskyy and
• Uwe Ritter

Beilstein J. Nanotechnol. 2017, 8, 1494–1501, doi:10.3762/bjnano.8.149

• , Russia) in the “light” tapping mode according to the well-established procedure. For the sample preparation, a drop of solution was placed onto a pre-cleaned microscope glass slide and dried in air prior to AFM imaging. Cell isolation and cultivation Human peripheral blood from healthy donors was

A review of demodulation techniques for amplitude-modulation atomic force microscopy

• Michael G. Ruppert,
• David M. Harcombe,
• Michael R. P. Ragazzon,
• S. O. Reza Moheimani and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2017, 8, 1407–1426, doi:10.3762/bjnano.8.142

• performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode atomic force microscopy experiments in

• amplitude estimate as a function of the tracking bandwidth. The experimental analysis is concluded by high-speed constant-height tapping-mode AFM experiments which highlight the case where the demodulator is the bandwidth bottleneck in the z-axis feedback loop. Fundamentals of amplitude modulation and

• RMS-to-DC converter, the output needs to be scaled by to obtain the amplitude as evident from Equation 15. This method has increasing latency for decreasing tracking bandwidth. Mean absolute deviation In tapping-mode AFM, RMS-to-DC conversion was typically performed using a precision rectifier