Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• . The simultaneously measured frequency shift Δf and tunneling current It give insight into the local surface potential as well as into the local electronic structure. The corresponding results of such an experiment are shown in Figure 7, where the tip scanned across an F0 defect. The three stacked