Two-dimensional and tubular structures of misfit compounds: Structural and electronic properties

• Tommy Lorenz,
• Jan-Ole Joswig and
• Gotthard Seifert

Beilstein J. Nanotechnol. 2014, 5, 2171–2178, doi:10.3762/bjnano.5.226

• Tommy Lorenz Jan-Ole Joswig Gotthard Seifert Theoretische Chemie, Technische Universität Dresden, 01069 Dresden, Germany Helmholtz-Zentrum Dresden-Rossendorf e.V., Institute of Ion Beam Physics and Materials Research, P.O. Box 51 01 19, 01314 Dresden, Germany 10.3762/bjnano.5.226 Abstract Misfit

Properties of plasmonic arrays produced by pulsed-laser nanostructuring of thin Au films

• Katarzyna Grochowska,
• Katarzyna Siuzdak,
• Peter A. Atanasov,
• Carla Bittencourt,
• Anna Dikovska,
• Nikolay N. Nedyalkov and
• Gerard Śliwiński

Beilstein J. Nanotechnol. 2014, 5, 2102–2112, doi:10.3762/bjnano.5.219

• nanostructuring by nanosecond laser irradiation of thin metal films is a simple and cost-effective approach, providing a reasonable alternative to the relatively expensive and time-consuming fabrication of NP arrays of regular geometries with the use of ion beam and plasma techniques [26][27]. In this paper, the

• , including those produced by other techniques such as ion beam lithography and colloidal synthesis [47]. Mid-field enhancement Measurements of the micro-Raman spectra and quantitative data on the SERS effect provide a reliable check of the sensing capability from the point of view of the ultrasensitive

Photodetectors based on carbon nanotubes deposited by using a spray technique on semi-insulating gallium arsenide

• Domenico Melisi,
• Maria Angela Nitti,
• Marco Valentini,
• Antonio Valentini,
• Teresa Ligonzo,
• Giuseppe De Pascali and
• Marianna Ambrico

Beilstein J. Nanotechnol. 2014, 5, 1999–2006, doi:10.3762/bjnano.5.208

• layouts were used for the realization of the photodetectors (Figure 1). The first configuration, named single face sample (SFS), has a CNT layer sprayed on one face and a titanium/gold layer (30/50 nm), deposited by ion beam sputtering (IBS) [16], on the other face. The second one, named double face

PVP-coated, negatively charged silver nanoparticles: A multi-center study of their physicochemical characteristics, cell culture and in vivo experiments

• Sebastian Ahlberg,
• Alexandra Antonopulos,
• Jörg Diendorf,
• Ralf Dringen,
• Matthias Epple,
• Rebekka Flöck,
• Wolfgang Goedecke,
• Christina Graf,
• Nadine Haberl,
• Jens Helmlinger,
• Fabian Herzog,
• Frederike Heuer,
• Stephanie Hirn,
• Christian Johannes,
• Stefanie Kittler,
• Manfred Köller,
• Katrin Korn,
• Wolfgang G. Kreyling,
• Fritz Krombach,
• Jürgen Lademann,
• Kateryna Loza,
• Eva M. Luther,
• Marcelina Malissek,
• Martina C. Meinke,
• Daniel Nordmeyer,
• Anne Pailliart,
• Jörg Raabe,
• Fiorenza Rancan,
• Barbara Rothen-Rutishauser,
• Eckart Rühl,
• Carsten Schleh,
• Andreas Seibel,
• Christina Sengstock,
• Lennart Treuel,
• Annika Vogt,
• Katrin Weber and
• Reinhard Zellner

Beilstein J. Nanotechnol. 2014, 5, 1944–1965, doi:10.3762/bjnano.5.205

• dissolution process in cells (including the localization of low concentrations of small nanoparticles as well as silver ions) imaging at the Ag L3,2 edges is a promising option for future work. Focused ion beam (FIB) and optical microscopy (phase contrast microscopy; fluorescence microscopy; confocal laser

• reveal any formation of silver agglomerates (Figure 6A). In order to prove that the silver agglomerates are located inside the cells, focused ion beam milling (FIB) was applied which permits the view on cross sections of various materials by a beam of high-energy gallium ions [77][78]. After culturing

Patterning a hydrogen-bonded molecular monolayer with a hand-controlled scanning probe microscope

• Matthew F. B. Green,
• Taner Esat,
• Christian Wagner,
• Philipp Leinen,
• Alexander Grötsch,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2014, 5, 1926–1932, doi:10.3762/bjnano.5.203

• used a qPlus sensor [17] manufactured by CREATEC. The AFM/STM tip was made from a 0.3 mm long and 15 μm thick PtIr wire glued to the tuning fork of the qPlus sensor, and sharpened with a gallium focused ion beam (FIB). The resulting resonance frequency of the qPlus sensor was f0 = 30,300 Hz with a

Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

• Pravin Kumar,
• Udai Bhan Singh,
• Kedar Mal,
• Sunil Ojha,
• Indra Sulania,
• Dinakar Kanjilal,
• Dinesh Singh and
• Vidya Nand Singh

Beilstein J. Nanotechnol. 2014, 5, 1864–1872, doi:10.3762/bjnano.5.197

• film irradiated with Se/Sn = 1 shows ≈5 nm Pt NPs were buried up to ≈240 nm into the silicon. No silicide phase was detected in the XRD pattern of the film irradiated at the highest value of Se/Sn. The synergistic effect of the energy losses of the ion beam (molten zones are produced by Se, and

• -dimensional structures of various elements with narrow size distribution is a big challenge for scientists [9][10][11]. Due to certain advantages, namely, the control of growth parameters and spatial distribution, ion beam synthesis of buried nanoparticles (NPs) has received considerable attention in recent

• desired particle distribution profile (longitudinal) in the matrix. The multiple energy implantations of the ions are used to increase this distribution profile further [16]. The transverse distribution is controlled by scanning the ion beam over the sample (desired matrix). The ion fluence and the

Silicon and germanium nanocrystals: properties and characterization

• Ivana Capan,
• Alexandra Carvalho and
• José Coutinho

Beilstein J. Nanotechnol. 2014, 5, 1787–1794, doi:10.3762/bjnano.5.189

• significantly decreases the thermal budget, when compared to other growth techniques. Moreover, it implies that PLD should be considered as an excellent alternative to the widely used magnetron co-sputtering technique for the deposition of complex oxide thin films and NCs. II.2 Ion implantation An ion beam

Experimental techniques for the characterization of carbon nanoparticles – a brief overview

• Wojciech Kempiński,
• Szymon Łoś,
• Mateusz Kempiński and
• Damian Markowski

Beilstein J. Nanotechnol. 2014, 5, 1760–1766, doi:10.3762/bjnano.5.186

• mentioned carbon types has a full width at half-maximum of approximately 30 cm−1. For the sonicated sample, a third signal appears (marked with NG). Its position is shifted towards shorter wavenumbers. A similar peak was previously observed on graphene treated with an argon ion beam [29]. The width of the

Nanocrystalline ceria coatings on solid oxide fuel cell anodes: the role of organic surfactant pretreatments on coating microstructures and sulfur tolerance

• Chieh-Chun Wu,
• Ling Tang and
• Mark R. De Guire

Beilstein J. Nanotechnol. 2014, 5, 1712–1724, doi:10.3762/bjnano.5.181

• same procedures as for the nickel-GDC anodes. Then cross-sections were prepared by using a focused ion beam unit, and EDXS maps were superimposed on the cross-sectional images (Figure 6). With YSZ replacing the GDC as the ionically conducting phase in the anode, the ceria coating could easily be

• obtained by using the focused ion beam unit of the Nova Nanolab. Output voltage and ASR at low current density, showing sulfur tolerance. Yellow shading denotes 24 h periods of H2S exposure in the anode stream at the concentration indicated. (Treatment-1 cell (no ceria coating) with no interlayer.) Output

A study on the consequence of swift heavy ion irradiation of Zn–silica nanocomposite thin films: electronic sputtering

• Compesh Pannu,
• Udai B. Singh,
• Dinesh. C. Agarwal,
• Saif A. Khan,
• Sunil Ojha,
• Ramesh Chandra,
• Hiro Amekura,
• Debdulal Kabiraj and
• Devesh. K. Avasthi

Beilstein J. Nanotechnol. 2014, 5, 1691–1698, doi:10.3762/bjnano.5.179

• . But in case of metals, experimentally measured sputtering yields indicate a synergetic effect of electronic excitations and nuclear collision cascades. The emission of clusters raised great scientific interest in the field of ion beam interaction with matter in order to understand the fundamental

• dependence on the size of nanoparticles. Apart from electronic sputtering, the sputtered species collected on a catcher are also studied. In this report, an effort is made for understanding the interaction of the ion beam with nanodimensional material in light of the results obtained on the sputtering

• pressure spike inside the ion track, initiated by a thermal spike. Experimental setup. The ion beam is incident perpendicularly to the nanocomposite thin film and catcher is placed at an angle of 60° from thin film surface. RBS spectra of Zn–silica nanocomposite thin film before and after irradiation, (a

Probing the electronic transport on the reconstructed Au/Ge(001) surface

• Franciszek Krok,
• Mark R. Kaspers,
• Alexander M. Bernhart,
• Marek Nikiel,
• Benedykt R. Jany,
• Paulina Indyka,
• Mateusz Wojtaszek,
• Rolf Möller and
• Christian A. Bobisch

Beilstein J. Nanotechnol. 2014, 5, 1463–1471, doi:10.3762/bjnano.5.159

• source software GSxM [17] and data processing was done by using WxSM [18]. For the transmission electron microscope (TEM) measurements lamellas of the Au/Ge(001) of the very same sample were prepared with the use of an FEI Quanta 3D FEG scanning electron microscope equipped with a 30 keV Ga+ focused ion

• beam gun (FIB). In order to preserve the surface of the Au/Ge sample against the standard FIB operation during the lamella preparation, the sample surface at first was covered (capped) with a 20 nm layer of thermally evaporated carbon. Then, on top of the cap layer, a platinum layer was deposited using

Microstructural and plasmonic modifications in Ag–TiO₂ and Au–TiO₂ nanocomposites through ion beam irradiation

• Venkata Sai Kiran Chakravadhanula,
• Yogendra Kumar Mishra,
• Venkata Girish Kotnur,
• Devesh Kumar Avasthi,
• Thomas Strunskus,
• Vladimir Zaporotchenko,
• Dietmar Fink,
• Lorenz Kienle and
• Franz Faupel

Beilstein J. Nanotechnol. 2014, 5, 1419–1431, doi:10.3762/bjnano.5.154

• swift heavy ions. Au–TiO2 and Ag–TiO2 nanocomposite thin films with varying metal volume fractions were deposited by co-sputtering and were subsequently irradiated by 100 MeV Ag8+ ions at various ion fluences. The morphology of these nanocomposite thin films before and after ion beam irradiation has

• ion beam induced growth of nanoparticles and structural modifications in the titania matrix. Keywords: noble metal–titania nanocomposite; surface plasmon resonance; swift heavy ions; Introduction Metal nanoparticles embedded in dielectric matrices in the form of nanocomposites have gained

• , whereas if the inter particle distance is larger a size reduction occurs. If the particles are larger than the diameter of ion track, but smaller than a particular size, they elongate along the ion beam direction, resulting in parallel elongated nanoparticles [22][27][30][31][32]. SHI irradiation can

Nanocavity crossbar arrays for parallel electrochemical sensing on a chip

• Enno Kätelhön,
• Dirk Mayer,
• Marko Banzet,
• Andreas Offenhäusser and
• Bernhard Wolfrum

Beilstein J. Nanotechnol. 2014, 5, 1137–1143, doi:10.3762/bjnano.5.124

• sections of the nanocavity sensor, cut by a focused ion beam (FIB), can be found in Figure 6. Fabrication Devices are structured by means of optical lithography and are processed in class-100 cleanroom facilities. Nanocavities at the intersections between platinum electrodes are formed via the deposition

Nanoforging – Innovation in three-dimensional processing and shaping of nanoscaled structures

• Andreas Landefeld and
• Joachim Rösler

Beilstein J. Nanotechnol. 2014, 5, 1066–1070, doi:10.3762/bjnano.5.118

• . The technique used, called nanoforging, is very similar to the macroscopic forging process. Results: With spring actuated tools produced by focused ion beam milling, controlled forging is demonstrated. With only three steps, a conical bar stock is transformed to a flat- and semicircular bent bar stock

• as complex shapes can be more readily achieved. Single crystalline silicon, processed by focused ion beam milling, is used for durable spring actuated forging tools. Furthermore, high strength metals can be processed and high deformation degrees of the bar stock can be realized without heating. This

• axis [13]. The forging tools were machined by focused ion beam milling at the corner of a single crystalline Si-substrate. Varying tools in different positions were produced to allow several forging steps after each other (Figure 1). All of these tools are based on a spring principle similar to so

A nanometric cushion for enhancing scratch and wear resistance of hard films

• Katya Gotlib-Vainshtein,
• Olga Girshevitz,
• Chaim N. Sukenik,
• David Barlam and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

• compensated by a thin Au coating (8 nm). NDFv9.4e software was used to fit the data [48]. Focused Ion Beam (FIB). The PDMS thickness was obtained using a dual beam FIB (FEI, Helios 600), with electron and ion beams operating simultaneously and independently at energies up to 30 kV (52 degrees between the

Integration of ZnO and CuO nanowires into a thermoelectric module

• Dario Zappa,
• Simone Dalola,
• Guido Faglia,
• Elisabetta Comini,
• Matteo Ferroni,
• Caterina Soldano,
• Vittorio Ferrari and
• Giorgio Sberveglieri

Beilstein J. Nanotechnol. 2014, 5, 927–936, doi:10.3762/bjnano.5.106

• , it is possible to use focused ion beam (FIB) lithography to deposit actively each gold nanoparticles, but it is very time consuming and there is no demonstration of improved performances of the device. The ability to control the size and dispersion of the catalyst is a key parameter to control both

Scale effects of nanomechanical properties and deformation behavior of Au nanoparticle and thin film using depth sensing nanoindentation

• Dave Maharaj and
• Bharat Bhushan

Beilstein J. Nanotechnol. 2014, 5, 822–836, doi:10.3762/bjnano.5.94

• operating pressure of about 0.001 Pa, substrate temperature of 100 °C at a rate of approximately 0.4 nm/s. To observe the grains within the Au film and nanoparticles, focused ion beam (FIB) milling and transmission electron microscopy (TEM) were employed. Cross-sections of samples were cut out by FIB

• milling (Nova NanoLab 600, FEI, Hillsboro, OR) by using a Ga+ ion beam accelerated at a voltage of 30 kV with currents ranging from 0.03 to 28 nA. A Pt coating was deposited on both sets of samples to protect the surfaces during milling. The cross-sections were then lifted out by using a micro manipulator

Hole-mask colloidal nanolithography combined with tilted-angle-rotation evaporation: A versatile method for fabrication of low-cost and large-area complex plasmonic nanostructures and metamaterials

• Jun Zhao,
• Bettina Frank,
• Frank Neubrech,
• Chunjie Zhang,
• Paul V. Braun and
• Harald Giessen

Beilstein J. Nanotechnol. 2014, 5, 577–586, doi:10.3762/bjnano.5.68

• demonstrated with samples fabricated by electron-beam or ion-beam lithography. This method is quite advantageous for high-quality samples of limited size (typically of the order of 100 × 100 µm²), but it is very costly and not really suited for mass fabrication. In particular, nanostructures with small gaps

Nanoscale patterning of a self-assembled monolayer by modification of the molecule–substrate bond

• Cai Shen and
• Manfred Buck

Beilstein J. Nanotechnol. 2014, 5, 258–267, doi:10.3762/bjnano.5.28

• can be made and how well the diffusion of both the thiols and the intercalated Cu can be controlled. The use of, for example, an ion beam for SAM patterning instead of the voltage induced generation of defects is anticipated to further improve the accuracy and reproducibility of the Cu-UPD. The timing

Fabrication of carbon nanomembranes by helium ion beam lithography

• Xianghui Zhang,
• Henning Vieker,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2014, 5, 188–194, doi:10.3762/bjnano.5.20

• attachment; helium ion microscopy; ion beam-organic molecules interactions; self-assembled monolayers; Introduction Carbon nanomembranes (CNMs) with monomolecular thickness and macroscopic lateral size represent a new type of functional two-dimensional (2D) materials [1]. A universal scheme to fabricate

• a higher resolution and the small convergence angle of the ion beam leads to a larger depth of field. As an imaging tool, this instrument has a high surface sensitivity and is particularly advantageous to distinguish monolayers from the supporting substrate [18][19]. As a tool for nanofabrication

• approaches have been used to exploit the capabilities of HIM, such as ion milling [21], scanning helium ion beam lithography (SHIBL) [22], and helium ion beam induced deposition (HIBID) [20]. Here we used 4'-nitro-1,1'-biphenyl-4-thiol (NBPT) as a molecular precursor to form SAMs on a Au substrate and

Optical near-fields & nearfield optics

• Alfred J. Meixner and
• Paul Leiderer

Beilstein J. Nanotechnol. 2014, 5, 186–187, doi:10.3762/bjnano.5.19

• “optical antenna”. Since the fabrication of suitable structures with electron beam or focused ion beam lithography is a tedious and time-consuming task, the experiments are more and more supported by modeling with numerical methods such as Finite Difference Time Domain (FDTD) and Discrete Dipole

Synthesis of embedded Au nanostructures by ion irradiation: influence of ion induced viscous flow and sputtering

• Udai B. Singh,
• D. C. Agarwal,
• S. A. Khan,
• S. Mohapatra,
• H. Amekura,
• D. P. Datta,
• Ajay Kumar,
• R. K. Choudhury,
• T. K. Chan,
• Thomas Osipowicz and
• D. K. Avasthi

Beilstein J. Nanotechnol. 2014, 5, 105–110, doi:10.3762/bjnano.5.10

• Au nanoparticles into the glass substrate. Keywords: embedded nanoparticles; ion beam irradiation; recoil implantation; Introduction Noble-metal nanoparticles (NPs) are of great interest due to their large surface-to-volume ratio and their enhanced absorption of visible light. The shape- and size

• for the synthesis of embedded Au NPs in a silica matrix [12][13][14][15][16]. Ion implantation is one of the standard ways for the synthesis of noble metal NPs embedded in a matrix and offers the control over the depth distribution of the NPs by properly adjusting the parameters of the ion beam such

• into a solid by means of atomic recoils through a thin surface layer of the desired metal when using an ion beam from only one ion source. When an energetic ion strikes a thin film deposited on a substrate, it loses its energy through a sequence of collisions with the atoms in the film. The recoiling

Dye-doped spheres with plasmonic semi-shells: Lasing modes and scattering at realistic gain levels

• Nikita Arnold,
• Boyang Ding,
• Calin Hrelescu and
• Thomas A. Klar

Beilstein J. Nanotechnol. 2013, 4, 974–987, doi:10.3762/bjnano.4.110

• dielectric spheres [7], via the attachment of seed particles to dielectric spheres that are partially embedded in a polymer matrix and a subsequent electroless plating [8], or via opening holes in originally closed shells via e-beam sputtering [9] or ion beam milling [10]. The semi-shells show a rich

STM tip-assisted engineering of molecular nanostructures: PTCDA islands on Ge(001):H surfaces

• Amir A. Ahmad Zebari,
• Marek Kolmer and
• Jakub S. Prauzner-Bechcicki

Beilstein J. Nanotechnol. 2013, 4, 927–932, doi:10.3762/bjnano.4.104

• exception of the microscope chamber where the pressure was 4–5 × 10−11 mbar. Atomically flat Ge(001) surfaces were prepared by a few cycles of simultaneous annealing of the samples at 780 °C (as measured by infrared pyrometer) and ion beam bombardment (1 keV Ar+, at 45° off-normal) for 20 minutes. The ion

Challenges in realizing ultraflat materials surfaces

• Takashi Yatsui,
• Wataru Nomura,
• Fabrice Stehlin,
• Olivier Soppera,
• Makoto Naruse and
• Motoichi Ohtsu

Beilstein J. Nanotechnol. 2013, 4, 875–885, doi:10.3762/bjnano.4.99

• approach for reducing the surface roughness is ion-beam smoothing [15]. Ion-beam irradiation at angles that are near grazing incidence preferentially removes large protrusions from the surface. This way a smoothing of wide areas can be achieved, while the surface damage is reduced. In addition, the use of

• a clustered ion beam to reduce the surface damage can lead to ultraflat surfaces of several hundred mm in diameter with a small Ra of 1 Å [16]. Although ion-beam smoothing does not require a polishing pad, it can still cause damage due to ion bombardment, and this technique also requires high-vacuum