Beilstein J. Nanotechnol.2016,7, 572–580, doi:10.3762/bjnano.7.50
rupture of the film. In conclusion, conventional deformation mechanisms are still active in nanocrystalline metals but with different weighting as compared with conventional materials with coarser grains.
Keywords: ACOM-STEM; deformation mechanisms; in situ straining; nanocrystalline metals; orientation
be separated from real local crystallographic changes [38].
In situ ACOM-STEM is applied to magnetron-sputtered NC thin film samples exhibiting a predominately columnar grain structure. In the following, we concentrate on results from an annealed NC Pd (ncPda) thin film with ≈50 nm thickness
defined as the smallest volume with one crystal orientation within a disorientation tolerance of 3° and grains are either single crystallites or multiple crystallites connected by twin boundaries.
Results and Discussion
All presented ACOM-STEM orientation maps (color coding according to the inverse pole