Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• reliable production of nanowires and other nanostructures [7][10][11][12][13]. By annealing below 700 °C [14], the Si(110)-(16×2) reconstruction is formed over large areas on the Si(110) surface. It has been widely investigated by reflection high-energy electron diffraction (RHEED) analysis [14][15

Proximity effect in [Nb(1.5 nm)/Fe(x)]₁₀/Nb(50 nm) superconductor/ferromagnet heterostructures

• Yury Khaydukov,
• Sabine Pütter,
• Laura Guasco,
• Roman Morari,
• Gideok Kim,
• Thomas Keller,
• Anatolie Sidorenko and
• Bernhard Keimer

Beilstein J. Nanotechnol. 2020, 11, 1254–1263, doi:10.3762/bjnano.11.109

• thermal evaporation from an effusion cell while Nb and Pt were grown by electron beam evaporation. Reflection high-energy electron diffraction (RHEED) was measured in situ during deposition to trace the structure of the atomic layer being deposited. For the RHEED experiment, an electron beam of 15 keV

• ) ± ρm(z), where ρ0 and ρm are the nuclear and magnetic SLDs. The latter is proportional to the magnetization of a layer. Thus in addition to the chemical we can study magnetic depth profiles using PNR. Results Structural study Growth analysis with RHEED The RHEED pattern of the Al2O3() substrate (Figure

• are visible in the RHEED pattern of the Nb layer, which indicate island growth and polycrystallinity (Figure 2d). Subsequently, the Fe/Nb multilayers were grown on the 800 °C Nb buffer. The corresponding RHEED patterns exhibit amorphous growth, i.e., blurred screens (not shown). Increasing the Fe film

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

• Daiki Katsube,
• Hayato Yamashita,
• Satoshi Abo and
• Masayuki Abe

Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63

• electron diffraction (RHEED). Sample preparation and NC-AFM, STM and LEED measurements can be performed while keeping the sample under UHV. The PLD chamber was designed to be as small as possible for easy sample exchange and transfer. In addition, a small design would lead to smaller vibrations during AFM

• and/or STM measurements and, thus, better observations. The PLD chamber the side of which is fitted with an CF203 port includes a PLD target, a shutter, a sample stocker, and a RHEED apparatus. A small size commercial PLD target system (UNISOKU) is installed in the PLD chamber. Piezoelectric motors

• still difficult to find the best sample preparation conditions for PLD for atomic resolution imaging with NC-AFM and STM. Even if a clean diffraction pattern can be seen with RHEED performed during the PLD, it might be that the surface flatness necessary for the NC-AFM observation is not obtained

Dopant-stimulated growth of GaN nanotube-like nanostructures on Si(111) by molecular beam epitaxy

• Alexey D. Bolshakov,
• Alexey M. Mozharov,
• Georgiy A. Sapunov,
• Igor V. Shtrom,
• Nickolay V. Sibirev,
• Vladimir V. Fedorov,
• Evgeniy V. Ubyivovk,
• Maria Tchernycheva,
• George E. Cirlin and
• Ivan S. Mukhin

Beilstein J. Nanotechnol. 2018, 9, 146–154, doi:10.3762/bjnano.9.17

• diffraction (RHEED) patterns: we did not observe (7 × 7) a Si surface reconstruction pattern while cooling down the substrate that was subjected to the low temperature annealing. On the contrary, when the high temperature annealing (at least 920 °С) was applied, we observed a clear (7 × 7) reconstruction

Coexistence of strongly buckled germanene phases on Al(111)

• Weimin Wang and
• Roger I. G. Uhrberg

Beilstein J. Nanotechnol. 2017, 8, 1946–1951, doi:10.3762/bjnano.8.195

• ]. In this study, 1 ML of Ge was deposited on Al(111) held at 350 K. The evaporation rate was ≈0.018 ML/min. These parameters are close to the ones in [13] and the formation of a (3×3) superstructure was confirmed by reflection high energy diffraction (RHEED). Interestingly, Fukaya et al. arrived at a

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

• Ann-Kathrin Kleinschmidt,
• Lars Barzen,
• Johannes Strassner,
• Christoph Doering,
• Henning Fouckhardt,
• Wolfgang Bock,
• Michael Wahl and
• Michael Kopnarski

Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171

• techniques (as, e.g., reflection high-energy electron diffraction (RHEED)), which might not be applicable in some set-ups. Recording a RAS color plot is time-consuming, i.e., monitoring a single RAS spectrum from 1.5–5.0 eV photon energy with a step size of 0.1 eV during reactive ion etching (the substrate

Orientation of FePt nanoparticles on top of a-SiO₂/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size

• Martin Schilling,
• Paul Ziemann,
• Zaoli Zhang,
• Johannes Biskupek,
• Ute Kaiser and
• Ulf Wiedwald

Beilstein J. Nanotechnol. 2016, 7, 591–604, doi:10.3762/bjnano.7.52

• pulsed laser deposition (PLD), served as reference samples. The structural properties were probed in situ, particularly texture formation and epitaxy of the specimens by reflection high-energy electron diffraction (RHEED) and, in case of 3 nm nanoparticles, additionally by high-resolution transmission

• transmission electron microscopy (HRTEM); nanoparticles; reflection high-energy electron diffraction (RHEED); solid-phase epitaxy; texture; Introduction Due to their attractive catalytic properties for oxygen reduction reactions (ORR) [1][2] as well as their high magnetocrystalline anisotropy energy density

• coalescence, growth or Ostwald ripening by annealing can be completely avoided [15]. In the present study we investigate the possibility of a structural (re)orientation of FePt NPs and thin films on a-SiO2/Si(001), MgO(001), and sapphire(0001) after different in situ annealing steps by HRTEM and RHEED

Scanning reflection ion microscopy in a helium ion microscope

• Yuri V. Petrov and
• Oleg F. Vyvenko

Beilstein J. Nanotechnol. 2015, 6, 1125–1137, doi:10.3762/bjnano.6.114

• diffraction (RHEED) [9]. In the late 1960s, scanning reflection electron microscopy (SREM) was developed [10][11] for the scanning electron microscope (SEM). Chromatic aberration does not appear in SEM because the sample is placed outside of the electron optics. Both REM and SREM require a sufficiently long

Stick–slip behaviour on Au(111) with adsorption of copper and sulfate

• Nikolay Podgaynyy,
• Sabine Wezisla,
• Christoph Molls,
• Shahid Iqbal and
• Helmut Baltruschat

Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85

• RHEED [26]. The given results reveal the coverage and the structure of adsorbed copper and sulfate anions on Au(111) and the potential regions at which the different structures can be observed. Gordon et al. [27] found a √3 × √3 copper structure in the 2/3 coverage region using X-ray and QCM methods

Towards precise defect control in layered oxide structures by using oxide molecular beam epitaxy

• Federico Baiutti,
• Georg Christiani and
• Gennady Logvenov

Beilstein J. Nanotechnol. 2014, 5, 596–602, doi:10.3762/bjnano.5.70

• number and species of atoms forming each atomic layer is placed on the growing surface at the right time, so that each of them is deposited singularly and in a sequence defined by the operator. Key tool for the ALL-MBE technique is the reflection high-energy electron diffraction (RHEED) system, which

• source can be opened for service and replacement of a source element without venting the growth chamber within a short period of time, even during the film growth. The differential pumping module is also used to pump the electron gun of the RHEED system and the load locked quartz crystal monitor (QCM

• ) head. The QCM, which is mounted on a linear bellows assembly and is separated from the growth chamber by a gate valve, is used to calibrate the absolute deposition rates for each source before starting the process, while the RHEED system allows for the in-situ monitoring of the growth in real time. The

Structure, morphology, and magnetic properties of Fe nanoparticles deposited onto single-crystalline surfaces

• Armin Kleibert,
• Wolfgang Rosellen,
• Mathias Getzlaff and
• Joachim Bansmann

Beilstein J. Nanotechnol. 2011, 2, 47–56, doi:10.3762/bjnano.2.6

• combined approach of X-ray magnetic circular dichroism (XMCD), reflection high energy electron diffraction (RHEED) and scanning tunneling microscopy (STM) to shed light on the complex and size-dependent relation between magnetic properties, crystallographic structure, orientation and morphology. In

• particular XMCD reveals that Fe particles on Ni(111)/W(110) have a significantly lower (higher) magnetic spin (orbital) moment compared to bulk iron. The reduced spin moments are attributed to the random particle orientation being confirmed by RHEED together with a competition of magnetic exchange energy at

• the interface and magnetic anisotropy energy in the particles. The RHEED data also show that the Fe particles on W(110) – despite of the large lattice mismatch between iron and tungsten – are not strained. Thus, strain is most likely not the origin of the enhanced orbital moments as supposed before