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Search for "STEM-HAADF" in Full Text gives 14 result(s) in Beilstein Journal of Nanotechnology.

Density functional theory study of Au-fcc/Ge and Au-hcp/Ge interfaces

  • Olga Sikora,
  • Małgorzata Sternik,
  • Benedykt R. Jany,
  • Franciszek Krok,
  • Przemysław Piekarz and
  • Andrzej M. Oleś

Beilstein J. Nanotechnol. 2023, 14, 1093–1105, doi:10.3762/bjnano.14.90

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  • , stable hcp nanoislands were obtained under controlled annealing conditions on the germanium substrate [23]. After initial crystallization of the fcc gold phase, the hcp phase grows from the eutectic Au/Ge liquid. The atomically resolved STEM-HAADF measurements as well as electron backscatter diffraction
  • order of magnitude as in other considered interfaces. Experimentally observed heterostructures In this section we present our results of ab initio calculations for the Au/Ge interfaces observed in experimentally grown gold nanoislands on a germanium substrate [23]. Available STEM-HAADF images
  • rumpling parameter of the Ge layer up to 0.49 Å. The interface energy of variant B is higher than that of variant A by 0.23 J/m2. These findings confirm that structures with some Au atoms located directly above the Ge atoms tend to be energetically expensive. Atomically resolved STEM-HAADF images of gold
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Published 15 Nov 2023

Fabrication and characterization of Si1−xGex nanocrystals in as-grown and annealed structures: a comparative study

  • Muhammad Taha Sultan,
  • Adrian Valentin Maraloiu,
  • Ionel Stavarache,
  • Jón Tómas Gudmundsson,
  • Andrei Manolescu,
  • Valentin Serban Teodorescu,
  • Magdalena Lidia Ciurea and
  • Halldór Gudfinnur Svavarsson

Beilstein J. Nanotechnol. 2019, 10, 1873–1882, doi:10.3762/bjnano.10.182

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  • consequential interface characteristics and its effect on the photocurrent spectra. Keywords: grazing incidence XRD (GIXRD); high-power impulse magnetron sputtering (HiPIMS); HRTEM; magnetron sputtering; photocurrent spectra; SiGe nanocrystals in SiO2/SiGe/SiO2 multilayers; STEM-HAADF; TEM; Introduction
  • pattern taken on annealed MLs (600 °C, 1 min). (a) XTEM image of MLs annealed at 600 °C (1 min) showing columnar morphology of SiGe NCs in the film. The crystallites have a periodicity of ≈12.5 nm. (b) STEM-HAADF image. (c) HRTEM image with SiGe NCs separated by amorphous regions (with SiGeO). (a) TEM low
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Published 17 Sep 2019

Alloyed Pt3M (M = Co, Ni) nanoparticles supported on S- and N-doped carbon nanotubes for the oxygen reduction reaction

  • Stéphane Louisia,
  • Yohann R. J. Thomas,
  • Pierre Lecante,
  • Marie Heitzmann,
  • M. Rosa Axet,
  • Pierre-André Jacques and
  • Philippe Serp

Beilstein J. Nanotechnol. 2019, 10, 1251–1269, doi:10.3762/bjnano.10.125

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  • Co islands (Supporting Information File 1, Figure S7a,b) were identified using the scanning transmission electron microscopy/high-angle annular dark-field imaging (STEM-HAADF) technique. Energy-dispersive X-ray spectroscopy (EDX) analysis on the N-CNT surface or in the Co aggregates confirmed the
  • presence of Co. The same analysis was made on the sample Ni/N-CNTHT. There also, despite the high Ni loading (48% w/w), no Ni NPs were observed (Figure 6c,d). STEM-HAADF analysis shed light into the presence of non-crystallized Ni at the surface of the carbon support. EDX analysis confirmed the presence of
  • also evidenced by STEM-HAADF images of Pt3Co/N-CNT (Figure 7b, 001 selected area). In the same way, the Pt3Ni composition was determine by EDX analysis for the sample Pt3Ni/N-CNTHT (Supporting Information File 1, Figure S9). This sample also displays some residual nickel atoms or clusters
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Published 21 Jun 2019

CuInSe2 quantum dots grown by molecular beam epitaxy on amorphous SiO2 surfaces

  • Henrique Limborço,
  • Pedro M.P. Salomé,
  • Rodrigo Ribeiro-Andrade,
  • Jennifer P. Teixeira,
  • Nicoleta Nicoara,
  • Kamal Abderrafi,
  • Joaquim P. Leitão,
  • Juan C. Gonzalez and
  • Sascha Sadewasser

Beilstein J. Nanotechnol. 2019, 10, 1103–1111, doi:10.3762/bjnano.10.110

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  • ) and Si substrate (red). Chemical analysis of the sample grown at 530 °C. (a) Low-resolution cross-section STEM HAADF image of a region of the 530 °C sample studied by EDS. (b–f) EDS mapping of Se, Cu, In, Si, and O. (g) EDS line profile across a nanodot (blue rectangle in (a)). (h) EDS line profile
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Published 22 May 2019

Amorphous NixCoyP-supported TiO2 nanotube arrays as an efficient hydrogen evolution reaction electrocatalyst in acidic solution

  • Yong Li,
  • Peng Yang,
  • Bin Wang and
  • Zhongqing Liu

Beilstein J. Nanotechnol. 2019, 10, 62–70, doi:10.3762/bjnano.10.6

Graphical Abstract
  • TiO2 (101) phase, as shown in the upper left and square areas. The STEM-HAADF and corresponding EDS maps of single tube NixCoyP/TNAs are revealed in Figure 4. From the figure, the diameter of the TiO2 nanotube was determined to be about 150 nm with a chemical composition of Ti, O, Ni, Co, and P evenly
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Published 07 Jan 2019

Accurate control of the covalent functionalization of single-walled carbon nanotubes for the electro-enzymatically controlled oxidation of biomolecules

  • Naoual Allali,
  • Veronika Urbanova,
  • Mathieu Etienne,
  • Xavier Devaux,
  • Martine Mallet,
  • Brigitte Vigolo,
  • Jean-Joseph Adjizian,
  • Chris P. Ewels,
  • Sven Oberg,
  • Alexander V. Soldatov,
  • Edward McRae,
  • Yves Fort,
  • Manuel Dossot and
  • Victor Mamane

Beilstein J. Nanotechnol. 2018, 9, 2750–2762, doi:10.3762/bjnano.9.257

Graphical Abstract
  • of raw and f-SWCNTs taken with a laser at 514 nm. An example of a STEM HAADF image of the HIPCO-HNO3-FcETG2 sample. Inset: EELS spectra of the catalyst particle (blue arrow) and of the bundle recorded in the area of the red square. HIPCO-HNO3-FcETG2 sample analyzed by STEM: a) HAADF image. The inset
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Published 26 Oct 2018

Role of oxygen in wetting of copper nanoparticles on silicon surfaces at elevated temperature

  • Tapas Ghosh and
  • Biswarup Satpati

Beilstein J. Nanotechnol. 2017, 8, 425–433, doi:10.3762/bjnano.8.45

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  • the high-angle annular dark-field scanning transmission electron microscopy (STEM-HAADF). After the TEM analysis, the same samples were transferred to a rapid thermal annealing unit (model: JETFIRST100 jipelec) and annealing was performed in air, oxygen and nitrogen atmospheres, one by one. The rapid
  • field TEM image in Figure 1a and the STEM-HAADF image in Figure 1b show the deposited copper nanoparticles on a silicon substrate. The elemental composition is presented by the EDX mapping. Figure 1e and Figure 1f show the silicon (yellow) and copper (blue) elemental mapping, respectively, collected
  • from a region marked by an orange rectangle in the STEM-HAADF image in Figure 1b. The thermal oxidation was performed in a rapid thermal annealing system at 500 °C for 1 min. We have analyzed the phase of the as-deposited material and the samples annealed under oxygen atmosphere by selected area
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Published 13 Feb 2017

Thickness-modulated tungsten–carbon superconducting nanostructures grown by focused ion beam induced deposition for vortex pinning up to high magnetic fields

  • Ismael García Serrano,
  • Javier Sesé,
  • Isabel Guillamón,
  • Hermann Suderow,
  • Sebastián Vieira,
  • Manuel Ricardo Ibarra and
  • José María De Teresa

Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162

Graphical Abstract
  • the sample with pitch 100 nm. (a) STEM-HAADF image of the sample, including a red arrow signaling the full linear beam scan performed for the compositional analysis shown in (c). (b) Compositional data obtained from EDX spectroscopy measurements performed at the red cross and red square shown in (a
  • ) after analyzing all the observed peaks. (c) STEM-HAADF intensity along the red arrow shown in (a). The intensity modulation is related to the slight changes in composition caused by the thickness modulation. The overall slope is a result of the small thickness variation of the lamella where the STEM
  • by means of energy dispersive X-ray (EDX) spectroscopy has been performed in the thicker and thinner parts of the deposits. A 3% higher Ga content and 8% lower W content is observed in the thicker parts of the deposits compared to the thinner parts. Such differences give rise to the periodic STEM
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Published 14 Nov 2016

Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

  • Aleksandra Szkudlarek,
  • Alfredo Rodrigues Vaz,
  • Yucheng Zhang,
  • Andrzej Rudkowski,
  • Czesław Kapusta,
  • Rolf Erni,
  • Stanislav Moshkalev and
  • Ivo Utke

Beilstein J. Nanotechnol. 2015, 6, 1508–1517, doi:10.3762/bjnano.6.156

Graphical Abstract
  • on a line deposit from Cu(hfac)2 shown in Figure 2. a) STEM high angle annular dark field (STEM-HAADF) image of Cu nanocrystals forming from the deposit material. b) HAADF image showing distribution of Cu nanocrystals. c) High-resolution TEM (HR-TEM) image of 15 nm sized polycrystalline Cu
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Published 13 Jul 2015

Nanostructuring of GeTiO amorphous films by pulsed laser irradiation

  • Valentin S. Teodorescu,
  • Cornel Ghica,
  • Adrian V. Maraloiu,
  • Mihai Vlaicu,
  • Andrei Kuncser,
  • Magdalena L. Ciurea,
  • Ionel Stavarache,
  • Ana M. Lepadatu,
  • Nicu D. Scarisoreanu,
  • Andreea Andrei,
  • Valentin Ion and
  • Maria Dinescu

Beilstein J. Nanotechnol. 2015, 6, 893–900, doi:10.3762/bjnano.6.92

Graphical Abstract
  • annular dark field (STEM-HAADF) imaging and energy-dispersive X-ray spectroscopy (EDX). The estimation of the film surface temperature was performed by using the Heat Flow software [24]. Results A quasi-coherent wave relief with a periodicity of about 200 nm and 10 nm amplitude was observed on the surface
  • area viewed by STEM-HAADF method. STEM-HAADF image (left) and a detail from the same image correlated with line scan EDX analyse (right) performed on the XTEM specimen prepared from the GeTiO film irradiated with 100 laser pulses at a fluence of 15 mJ/cm2. Size distribution of the Ge nanoparticles in
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Published 07 Apr 2015

Influence of size, shape and core–shell interface on surface plasmon resonance in Ag and Ag@MgO nanoparticle films deposited on Si/SiOx

  • Sergio D’Addato,
  • Daniele Pinotti,
  • Maria Chiara Spadaro,
  • Guido Paolicelli,
  • Vincenzo Grillo,
  • Sergio Valeri,
  • Luca Pasquali,
  • Luca Bergamini and
  • Stefano Corni

Beilstein J. Nanotechnol. 2015, 6, 404–413, doi:10.3762/bjnano.6.40

Graphical Abstract
  • same situation holds for the case of Figure 1d, although the higher quantity of deposited Ag NPs gives rise to more diffused agglomerates, covering most of the substrate area. Aggregation of the NPs was also observed with scanning TEM–high angle annular dark field (STEMHAADF) (Figure 2a) and TEM (see
  • deposition chamber. A value tSiOx ≈ 0.5 nm for the oxide layer thickness was estimated from XPS analysis of the Si 2p core level peaks. As previously reported in the works on different NP films [22][23][24], SEM images were taken with a dual beam system (FEI Strata DB235M), while TEM and STEMHAADF mode
  • in equivalent thickness), (b) bare Ag NPs, with tAg = 1.5 nm, (c) Ag NPs co-deposited with Mg in O atmosphere with tAg = 0.8 nm/tMgO = 1.3 nm, (d) Ag NPs co-deposited with Mg in O atmosphere tAg = 3.3 nm/tMgO = 4.8 nm. (a) STEMHAADF image of Ag NPs, (b) atomically resolved TEM image of a single NP
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Published 09 Feb 2015

Synthesis, characterization, and growth simulations of Cu–Pt bimetallic nanoclusters

  • Subarna Khanal,
  • Ana Spitale,
  • Nabraj Bhattarai,
  • Daniel Bahena,
  • J. Jesus Velazquez-Salazar,
  • Sergio Mejía-Rosales,
  • Marcelo M. Mariscal and
  • Miguel José-Yacaman

Beilstein J. Nanotechnol. 2014, 5, 1371–1379, doi:10.3762/bjnano.5.150

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  • (FFT) of the image. The FFT was used to measure the interplanar distances corresponding to (111) (b, d) and (200) (c, e) planes. (a) Cs-corrected STEM-HAADF image of a bimetallic Cu–Pt nanoparticle oriented along the [011] zone axis, and (b) intensity profile (in arbitrary units) measured over the
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Published 27 Aug 2014

Growth and characterization of CNT–TiO2 heterostructures

  • Yucheng Zhang,
  • Ivo Utke,
  • Johann Michler,
  • Gabriele Ilari,
  • Marta D. Rossell and
  • Rolf Erni

Beilstein J. Nanotechnol. 2014, 5, 946–955, doi:10.3762/bjnano.5.108

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  • particle size. (a), (c) and (e) are the high-resolution TEM images after 20, 200 and 750 cycles, respectively. The inset shows selected area diffraction pattern (SADP). (b), (d) and (f) are the respective STEM-HAADF images providing a higher contrast between the TiO2 particles and the MW-CNTs. A schematic
  • illustration of the principle in STEM-EELS: (a) the microscope configuration in the STEM mode; (b) the inelastic scattering processes in the TEM sample contributing to the low-loss and the core-loss EELS signals; (c) an atomic-resolution STEM-HAADF image of a GaN–Ge interface; (d) a EELS core-loss spectrum
  • corresponding RGB map. Reprinted with permission from [49]. Copyright (2012) The American Chemical Society. An example of electron beam damage during EELS acquisition. Note that there is a chemical shift in the Ti_L2,3 edge after the damage. The damage is also visible in the STEM-HAADF image. Acknowledgements
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Published 02 Jul 2014

Enhanced photocatalytic activity of Ag–ZnO hybrid plasmonic nanostructures prepared by a facile wet chemical method

  • Sini Kuriakose,
  • Vandana Choudhary,
  • Biswarup Satpati and
  • Satyabrata Mohapatra

Beilstein J. Nanotechnol. 2014, 5, 639–650, doi:10.3762/bjnano.5.75

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  • also spots corresponding to Ag and one of them is marked in Figure 4a. STEM-HAADF analysis was carried out to investigate the chemical composition of the Ag–ZnO hybrid nanostructures. STEM-HAADF analysis provides the Z-contrast image, where the intensity of scattered electrons is proportional to the
  • square of the atomic number Z. Figure 3c shows the STEM-HAADF image of ZnO nanostructures in sample PZ. Energy dispersive X-ray spectroscopy (EDX) data from the regions marked by area 1 in Figure 3c and area 2 in Figure 4c is plotted in Figure 3d for ZnO and Ag–ZnO. The C and Cu signals in the EDX
  • prepared with varying AgNO3 concentrations and different [Ag+]/[citrate] ratios (a) 1:1, (b) 1:10. (a) Low-magnification TEM image of ZnO nanostructures in sample PZ. (b) HRTEM image showing lattice fringes. (c) STEM-HAADF image from the same area of TEM image. (d) EDX spectra from a region marked by area
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Published 15 May 2014
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