Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• ; low resolution; super resolution; Introduction The capability of atomic force microscopy (AFM) to achieve high resolution at the nanometer level in plane (xy) and at the angstrom level in height (z), on a variety of surfaces, is one of its major advantages. AFM topographical imaging enables high

Single-layer graphene oxide film grown on α-Al₂O₃(0001) for use as an adsorbent

• Shiro Entani,
• Mitsunori Honda,
• Masaru Takizawa and
• Makoto Kohda

Beilstein J. Nanotechnol. 2025, 16, 1082–1087, doi:10.3762/bjnano.16.79

• Figure 1 shows an atomic force microscopy (AFM) image of SLG and SLGO on α-Al2O3(0001) substrates. The as-grown SLG film has an atomically flat surface and wrinkles with its height less than 0.4 nm [18]. The single layer of graphene was confirmed through X-ray photoelectron spectroscopy (XPS) peak

• was removed from the SLGO surface by water rinsing and then the Cs-adsorbed SLGO specimen was introduced in the XPS chamber kept at ultra-high vacuum. The surface morphology of SLGO was examined using atomic force microscopy (AFM, SII SAP300). AFM images of (a) SLG/α-Al2O3(0001) and (b) SLGO/α-Al2O3

Soft materials nanoarchitectonics: liquid crystals, polymers, gels, biomaterials, and others

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2025, 16, 1025–1067, doi:10.3762/bjnano.16.77

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• processes and warrants further investigation. Scanning probe microscopy (SPM) methods, such as atomic force microscopy (AFM), have been employed to image mitochondria in liquid, showing features of both the inner and outer membrane [22][23][24]. However, AFM measurements are influenced by the cantilever

Focused ion beam-induced platinum deposition with a low-temperature cesium ion source

• Thomas Henning Loeber,
• Bert Laegel,
• Meltem Sezen,
• Feray Bakan Misirlioglu,
• Edgar J. D. Vredenbregt and
• Yang Li

Beilstein J. Nanotechnol. 2025, 16, 910–920, doi:10.3762/bjnano.16.69

• magnetic or superconductive structures can be created [1][2][3][4]. Also, specific mechanical structures on atomic force microscopy (AFM) cantilevers can be made [5][6]. In the literature, four mechanisms are used to explain the complex process of focused ion beam-induced deposition (FIBID) [5][7]; the

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• using a WITec alpha300 RA Raman spectrometer under excitation with a 532 nm solid-state diode laser operated at 10 mW. The topography of the films is examined using atomic force microscopy (AFM) with a Bruker Multimode 8 instrument. The surface morphology of pristine and implanted films is further

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• suitable substrates for characterization by scanning probe microscopy and SPEM. An atomic force microscopy (AFM) image of a typical InP p–n junction nanowire is shown in Figure 2a, confirming a homogeneous shape with a nanowire length of about 2.5 µm and a diameter of about 200 nm, fluctuating only by a

High-temperature epitaxial growth of tantalum nitride thin films on MgO: structural evolution and potential for SQUID applications

• Michelle Cedillo Rosillo,
• Oscar Contreras López,
• Jesús Antonio Díaz,
• Agustín Conde Gallardo and
• Harvi A. Castillo Cuero

Beilstein J. Nanotechnol. 2025, 16, 690–699, doi:10.3762/bjnano.16.53

• . Atomic force microscopy (AFM, XE-70 Park Systems) in contact mode was used to study the surface morphology of the films. The synthesis protocol used in this study was modified from the work reported by Quintanar-Zamora et al. [15] by varying the substrate temperature and the nitrogen pressure. Results

The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination

• Konstantinos Bidinakis and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52

• scanning electron microscopy (SEM) and atomic force microscopy (AFM) images (See Supporting Information File 1, Section 4). The lateral resolution for both AFM and SEM measurements is a few nanometers. The AFM channel that exhibited the clearest contrast between the layers was the amplitude error signal

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• features. Scanning probe techniques have revolutionized nanoscale material characterization. Since the invention of scanning tunneling microscopy (STM) [16] and atomic force microscopy (AFM) [17], various electric force-based methods, called electrostatic force microscopy (EFM) methods, have emerged to

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• Oxford Instruments. EDX was performed with 6 keV electron beam at 500 pA, and the signals were collected for 60 s. Atomic force microscopy (AFM) measurements were conducted on an NT-MDT NTEGRA Spectra system, and data was analyzed using Gwyddion and Origin software. To accurately obtain the composition

N₂⁺-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films

• Usha Rani,
• Kafi Devi,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 495–509, doi:10.3762/bjnano.16.38

• of 1.5405 Å. Measurements were conducted with a fixed incident angle of 0.5°, and the X-ray tube was operated at 40 kV and 40 mA. The surface morphology was analyzed using a Bruker Multimode-8 atomic force microscopy (AFM). The optical characteristics of the molybdenum thin films were analyzed using

Performance optimization of a microwave-coupled plasma-based ultralow-energy ECR ion source for silicon nanostructuring

• Joy Mukherjee,
• Safiul Alam Mollick,
• Tanmoy Basu and
• Tapobrata Som

Beilstein J. Nanotechnol. 2025, 16, 484–494, doi:10.3762/bjnano.16.37

• confirm the formation of nanostructures as observed from atomic force microscopy (AFM) images. The thickness of the amorphous thin layer is in good agreement with Monte Carlo simulations (SRIM) [31]. The article further investigates and explains the optical response (by UV–vis spectrometry) of the

ReactorAFM/STM – dynamic reactions on surfaces at elevated temperature and atmospheric pressure

• Tycho Roorda,
• Hamed Achour,
• Matthijs A. van Spronsen,
• Marta E. Cañas-Ventura,
• Sander B. Roobol,
• Willem Onderwaater,
• Mirthe Bergman,
• Peter van der Tuijn,
• Gertjan van Baarle,
• Johan W. Bakker,
• Joost W. M. Frenken and
• Irene M. N. Groot

Beilstein J. Nanotechnol. 2025, 16, 397–406, doi:10.3762/bjnano.16.30

• , capable of studying materials under industrially relevant conditions. Here we show current developments of the ReactorAFM/STM, implementing a qPlus sensor to add the ability of combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to study the geometric and electronic

• conductive substrate limits STM techniques in relevant industrial applications involving such more complex catalysts. For this reason, an atomic force microscopy (AFM) version of the high-pressure STM employing a quartz tuning fork (QTF) was introduced to overcome this limitation [16]. Unlike STM, which uses

Tailoring of physical properties of RF-sputtered ZnTe films: role of substrate temperature

• Kafi Devi,
• Usha Rani,
• Arun Kumar,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 333–348, doi:10.3762/bjnano.16.25

• ) spectrophotometer under 320 nm excitation produced by a xenon arc lamp. For investigating the surface topography, atomic force microscopy (AFM) micrographs of ZnTe/Qz films were recorded (scan area 2 × 2 µm2) using a Bruker multimode-8 AFM in the ScanAsyst mode at the Ion Beam Centre, Kurukshetra University. The

Probing the potential of rare earth elements in the development of new anticancer drugs: single molecule studies

• Josiane A. D. Batista,
• Rayane M. de Oliveira,
• Carlos H. M. Lima,
• Milton L. Lana Júnior,
• Virgílio C. dos Anjos,
• Maria J. V. Bell and
• Márcio S. Rocha

Beilstein J. Nanotechnol. 2025, 16, 187–194, doi:10.3762/bjnano.16.15

• extracted as well, providing robust information about the effects of the rare earths on the DNA double helix [19][16]. In addition, atomic force microscopy (AFM) imaging assays were also performed to confirm DNA compaction/condensation by erbium and neodymium, allowing for a direct visualization of these

• parameters and the local persistence lengths are left as adjustable parameters to be determined from the fit. The details of this methodology can be found in [19][21]. Atomic force microscopy assays The samples for atomic force microscopy (AFM) assays consist of 3 kbp DNA molecules (ThermoFischer Scientific

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• meetings on atomic force microscopy (AFM), the 23rd International Conference on Non-Contact Atomic Force Microscopy (NC-AFM) held in Nijmegen (Netherlands) and the 6th International Workshop on Advanced Atomic Force Microscopy Techniques held in Potsdam (Germany). The strong advance in the field and the

Natural nanofibers embedded in the seed mucilage envelope: composite hydrogels with specific adhesive and frictional properties

• Agnieszka Kreitschitz and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2024, 15, 1603–1618, doi:10.3762/bjnano.15.126

• atomic force microscopy (AFM), transmission electron microscopy (TEM), SEM, or cryo-SEM [45][57][63][64][65][66]. Very often, the procedures for preparing mucilage envelope samples can destroy and/or influence the organisation of polysaccharides, making the analysis of spatial structure of the mucilage

A biomimetic approach towards a universal slippery liquid infused surface coating

• Ryan A. Faase,
• Madeleine H. Hummel,
• AnneMarie V. Hasbrook,
• Andrew P. Carpenter and
• Joe E. Baio

Beilstein J. Nanotechnol. 2024, 15, 1376–1389, doi:10.3762/bjnano.15.111

• measurements were conducted with the sessile drop method. Droplets of 5 µL were pipetted onto the surface, and an image was captured. Eight images from two duplicates of each sample type were acquired on a smartphone device and processed in ImageJ (NIH). Atomic force microscopy AFM was conducted on a Veeco di

• force microscopy (AFM), sum frequency generation spectroscopy (SFG), and X-ray photoelectron spectroscopy (XPS). Measuring static water contact angles is a straightforward method to determine the relative wettability of a material and allows for a quick check if our surface modifications were successful

• copolymer (COC), silicon, and 316 stainless steel (SS) as our substrates. These substrates were first coated with PDA; then, a fluorinated thiol was attached to serve as the anchor for the infused fluid. The resulting surface modifications were then characterized by water contact angle measurements, atomic

Interaction of graphene oxide with tannic acid: computational modeling and toxicity mitigation in C. elegans

• Romana Petry,
• James M. de Almeida,
• Francine Côa,
• Felipe Crasto de Lima,
• Diego Stéfani T. Martinez and
• Adalberto Fazzio

Beilstein J. Nanotechnol. 2024, 15, 1297–1311, doi:10.3762/bjnano.15.105

• complete characterization of the GO sample is available in [36]. Atomic force microscopy (AFM), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS) were used to assess size, morphology, number of layers, and surface chemistry of GO. The GO sample used in this study consists of single layers with

• Agency (EPA), herein named EPA medium, in absence and presence of TA. Atomic force microscopy AFM has been extensively used to characterize the distribution and morphology of biomolecules on the surface of nanomaterials, especially 2D materials [37]. Figure 1a and Figure 1b show AFM images of GO sheets

The role of a tantalum interlayer in enhancing the properties of Fe₃O₄ thin films

• Hai Dang Ngo,
• Vo Doan Thanh Truong,
• Van Qui Le,
• Hoai Phuong Pham and
• Thi Kim Hang Pham

Beilstein J. Nanotechnol. 2024, 15, 1253–1259, doi:10.3762/bjnano.15.101

• films on three different types of substrates, namely an amorphous SiO2/Si(100) substrate, a single crystal MgO(100) substrate, and a buffer layer consisting of MgO/Ta/SiO2/Si(100). The properties of Fe3O4 thin films were analyzed using atomic force microscopy (AFM), X-ray diffractometry (XRD), and

Unveiling the potential of alginate-based nanomaterials in sensing technology and smart delivery applications

• Shakhzodjon Uzokboev,
• Khojimukhammad Akhmadbekov,
• Ra’no Nuritdinova,
• Salah M. Tawfik and
• Yong-Ill Lee

Beilstein J. Nanotechnol. 2024, 15, 1077–1104, doi:10.3762/bjnano.15.88

• wall [60]. Another important morphological feature of polymers is the surface of the polymers, and atomic force microscopy (AFM) can be utilized to detect surface features of polymeric nanoparticles. It is very useful tool that offers high-resolution images in three dimensions at the nanometer scale

Exploring surface charge dynamics: implications for AFM height measurements in 2D materials

• Mario Navarro-Rodriguez,
• Andres M. Somoza and
• Elisa Palacios-Lidon

Beilstein J. Nanotechnol. 2024, 15, 767–780, doi:10.3762/bjnano.15.64

• [23][24], or electrochemical properties [25] is a key topic of research. Factors such as flake size and shape, composition, density of defects, or doping significantly influence the response of 2D materials. Given the nanoscopic scale underlying the functionality of 2D materials, atomic force

• microscopy (AFM) techniques emerge as ideal tools to investigate them [26][27]. Depending on the operation mode and under controlled environmental conditions, AFM offers the possibility to record morphology along with relevant electronic, mechanical, or magnetic properties with nanoscale resolution. In

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• , which allowed for the investigation of both topography and electrical properties of the films. Surface topography analysis was performed by utilizing an atomic force microscopy (AFM) operating in Peak Force Tapping mode. The surface was scanned at a resolution of 1024 × 1024 measurement points using a

Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system

• Wendong Sun,
• Jianqiang Qian,
• Yingzi Li,
• Yanan Chen,
• Zhipeng Dou,
• Rui Lin,
• Peng Cheng,
• Xiaodong Gao,
• Quan Yuan and
• Yifan Hu

Beilstein J. Nanotechnol. 2024, 15, 694–703, doi:10.3762/bjnano.15.57

• , Chinese Academy of Sciences, Dalian 116023, P. R. China 10.3762/bjnano.15.57 Abstract Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of cantilevers to achieve rapid high-resolution imaging and extract multiple properties. However, the higher-order modal response of

• ; Introduction Multifrequency atomic force microscopy (AFM) has become an important tool for nanoscale imaging and characterization [1][2]. This technique involves the excitation and detection of multiple frequencies to improve data acquisition speed, sensitivity, and resolution, as well as to enable material