AFM as an analysis tool for high-capacity sulfur cathodes for Li–S batteries

• Renate Hiesgen,
• Seniz Sörgel,
• Rémi Costa,
• Linus Carlé,
• Ines Galm,
• Natalia Cañas,
• Brigitta Pascucci and
• K. Andreas Friedrich

Beilstein J. Nanotechnol. 2013, 4, 611–624, doi:10.3762/bjnano.4.68

• smaller energy dissipation and a slightly increased adhesion. It is noted, that the measured DMT modulus has values out of the recommended range for this type of tip. Therefore, the accuracy of those values is not very high. However, the large differences allowed a good differentiation from carbon. No

• regions exhibit high energy dissipation (not shown) and are quite ductile. The magnitude of the current (QNM™ current) decreased from approximately 30 nA before cycling to less than 1.5 nA (average values). In the adhesion image (not shown), three different magnitudes are distinguishable: a very high

• the previous measurement of SC-PVDF, the combination of high stiffness and conductivity indicates the presence of carbon-coated sulfur at the surface. The surface areas with a high energy dissipation and a low current exhibit mostly high adhesion. In the adhesion image (not shown), several small

Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

• Daniel Kiracofe,
• Arvind Raman and
• Dalia Yablon

Beilstein J. Nanotechnol. 2013, 4, 385–393, doi:10.3762/bjnano.4.45

• obtain the value at 250 kHz) for polypropylene and polyethylene at 250 kHz, respectively. Both materials have a surface energy hysteresis term of 0.06 J/m2 (chosen to approximately match the average energy dissipation in AM-AFM experiments). The same first eigenmode amplitude is used for both simulations

• (i.e., Hertz contact without energy dissipation). The result is shown in Figure 7. In this case there are no discontinuous jumps. There is a point at which the slope of the amplitude and phase curves change, but there is no contrast reversal in either. Also, there is essentially no change in the first

• contrast reversal for the elastic case in Figure 7 suggests that the tip–sample energy dissipation plays a key role in the contrast reversal. Presumably, an energy transfer between the eigenmodes is involved. Practically, this result reinforces the suggestion of Stark [18] that energy ratios and not

Selective surface modification of lithographic silicon oxide nanostructures by organofunctional silanes

• Thomas Baumgärtel,
• Christian von Borczyskowski and
• Harald Graaf

Beilstein J. Nanotechnol. 2013, 4, 218–226, doi:10.3762/bjnano.4.22

• AFM measurement (water adsorption or the energy dissipation of the AFM tip) should be investigated in detail in further statistical studies. Covalent binding of FITC to silicon oxide nanostructures Once suitable conditions for the controlled silanization of LAO nanostructures had been found

Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20

• in the AM-mode. To be able to compare the contrast in the different modes more quantitatively, we converted the measured phase/frequency shifts and amplitudes into virial and energy dissipation, which are the time averages of the conservative and dissipative tip–sample interactions, respectively (see

• , e.g., equations (1a) and (1b) in [7] and references therein. Here we converted the dissipated power into energy dissipation per oscillation cycle by multiplying the power by the period length). These quantities are depicted in the two bottom rows of Figure 3 for one scan line. For the specific sample

• oscillation amplitude (AM-OL), frequency shift and oscillation amplitude (AM-FM (CE)), or frequency shift and drive amplitude (AM-FM (CA)). In the two bottom rows the virial and energy dissipation for the scan line indicated are depicted. Parameters: rectangular silicon cantilever (PPP-NCSTAuD, Nanosensors

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

• Daniel Platz,
• Daniel Forchheimer,
• Erik A. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5

• , corresponding to a increasingly dissipative tip–surface interaction. However, the maximum dissipation does not coincide with the maximum repulsive conservative force, and the energy dissipation is largest at peak amplitude for piezo extensions between 2 and 6 nm. Another interesting feature of the FI map is the

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

• strength using [31]. Comparison of the different evaluation methods. Acknowledgements Financial support from the Deutsche Forschungsgemeinschaft through SFB616 “‘Energy dissipation at surfaces”’ is gratefully acknowledged. The authors would like to thank D. Utzat for improving the electronics.

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• establishing a method to separate attractive and repulsive contributions to the interaction force. To this end, it has to be proven whether such low setpoint ratios lead to stable imaging conditions. Bimodal APD curves may also give further insight into the various modes of energy dissipation because bimodal

Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation

• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33

• response and the driving signal under reasonable assumptions [15]. In the last few years, the investigation of phase-analysis techniques [16][17] contributed to the understanding of energy-dissipation processes and elastic response in heterogeneous samples, an important topic in biological research, where

A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

• Manfred Lange,
• Dennis van Vörden and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 207–212, doi:10.3762/bjnano.3.23

• about 0.22 eV/cycle. Keywords: atomic force microscopy; energy dissipation; force spectroscopy; hysteresis loop; PTCDA/Ag/Si(111) √3 × √3; Introduction Noncontact atomic force microscopy (NC-AFM) is a powerful tool for the study of surface properties. The invention of the frequency-modulation mode (FM

• signal is found during the retraction. (b) Dissipation signal for the retraction together with the calculated force–distance curves. Acknowledgements Financial support from the Deutsche Forschungsgemeinschaft through SFB616 ‘Energy dissipation at surfaces’ is gratefully acknowledged. The authors would

Molecular-resolution imaging of pentacene on KCl(001)

• Julia L. Neff,
• Jan Götzen,
• Enhui Li,
• Michael Marz and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2012, 3, 186–191, doi:10.3762/bjnano.3.20

• the molecules on the surface. Another possibility is that the line defect results from a twinned growth. The line defect also has a profound effect on the energy dissipation (Figure 2b). The dissipated energy per oscillation cycle can be estimated by Ediss ≈ E0(Aexc − Aexc,0)/Aexc,0 with E0 = πkA2/Q

• oscillation cycle. The increased energy dissipation could be due to extra uncompensated electrostatic charge that induces currents in the tip in each oscillation cycle. In this case, we would expect to see strong effects from this charge in the topographic image,which we do not observe. Another possibility is

• that in the first part of the defect (B) mobile molecules are clamped due to the locally occurring strain, thus resulting in a row of reduced energy dissipation. This would imply that the defect also contains rows of more loosely bound molecules (C), which cause enhanced energy dissipation compared to

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

• Samer Darwich,
• Karine Mougin,
• Akshata Rao,
• Enrico Gnecco,
• Shrisudersan Jayaraman and
• Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

• RH%, are presented and discussed. The dependency of the energy dissipation during the manipulation was particularly studied as a function of size, coating of particles, substrate and temperature. Finally, interpretation of the physico-chemical mechanisms involved at both interfaces – tip–particle and

• nanoparticles or nanoparticles and surface, and independent of the size of the spherical particles, the logarithm of the dissipated power during the manipulation systematically decreases linearly, when the scan velocity increases. This linear dependence is generally attributed to a decrease of the energy

• dissipation in the contact as the velocity increases, in a way similar to the velocity (frequency)-dependent viscoelastic and/or plastic dissipation in polymers (as well as metals), as is described for instance through the time-temperature superposition principle for polymers [50][51][52]. However, from this

Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• force, and Q to the energy dissipation [2][6]. The thermal motion (or Brownian motion) of the cantilever’s tip is connected to the local mechanical compliance via the fluctuation-dissipation theorem. The cantilever thermal fluctuations are modified by the tip-surface interaction forces: monitoring these

The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl–Tomlinson model and the simulation of vibration-induced friction reduction

• W. Merlijn van Spengen,
• Viviane Turq and
• Joost W. M. Frenken

Beilstein J. Nanotechnol. 2010, 1, 163–171, doi:10.3762/bjnano.1.20

• in this study. The area enclosed by the friction loop corresponds to the energy dissipated during the friction process. To obtain an accurate measure for the energy dissipation, we have cut off the side lobes of the friction loop, where the device becomes stuck in one direction, taking the average

• rise to the energy dissipation) it is able to predict the important features of the typical motion observed of a polycrystalline silicon MEMS slider as it slides against an on-chip counter-surface of same material. This proves that the overall sliding behaviour is governed by the mechanical locking