Calibration of piezo actuators and systems by dynamic interferometry

• Knarik Khachatryan and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143

• parts with high accuracy. This is commonly accomplished by piezo actuators, for instance, in the form of tube piezos for positioning the tip or optics. For their calibration, we propose an approach based on the dynamic response signal from a fiber interferometer used for cantilever displacement

• oscillation amplitude calibration under conditions of various amounts of tube piezo contraction and extension. The merits and limits of accuracy for such type of calibration are discussed. Keywords: cantilever excitation; fiber interferometer; NC-AFM; piezo calibration; non-contact atomic force microscopy

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• ]. Experimental Our setup is a commercial STM/AFM operated in ultrahigh vacuum (UHV) that was modified and improved by the implementation of a Fabry–Pérot fiber interferometer in order to achieve high sensitivity in detecting lever deflection and measuring the oscillation amplitude, which in turn allows us to