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Search for "force sensing" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

Low-temperature AFM with a microwave cavity optomechanical transducer

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

fulfills the specific requirements of the application. The latter is indeed the case for force sensing in atomic force microscopy (AFM). Force transduction at maximum sensitivity requires detecting the position of a “test mass”, while minimizing the added noise introduced by the detection itself [14][15

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Published 24 Oct 2025

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

-induced deposition of platinum. Finally, we present measurements that characterize the spread of mechanical resonant frequency, the temperature dependence of the microwave resonance, and the sensor’s operation as an electromechanical transducer of force. Keywords: atomic force microscopy; force sensing

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Published 15 Feb 2024

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