Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• ); mechanical property measurements; surface science; Introduction Atomic force microscopy (AFM) has become an indispensable tool for imaging the surface topography on a variety of surfaces [1]. Since the invention of the AFM [2], several other modes of AFM have been developed, including friction force

• microscopy [3], tapping mode AFM [4], and contact resonance AFM (CR-AFM) [5], each providing unique advantages or insights into a surface and the materials that comprise it. Alongside the developments of the experimental technique, there have been a number of modeling techniques created that can be used to

Relationship between corrosion and nanoscale friction on a metallic glass

• Haoran Ma and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2022, 13, 236–244, doi:10.3762/bjnano.13.18

• friction force microscopy. Here, we apply the same method to investigate differences in corrosion of ZrNiTi MGs after different periods of immersion time between two different solutions. On the one hand, the influence of corrosion on nanoscale friction on MGs is evaluated. On the other hand

Nanoscale friction and wear of a polymer coated with graphene

• Robin Vacher and
• Astrid S. de Wijn

Beilstein J. Nanotechnol. 2022, 13, 63–73, doi:10.3762/bjnano.13.4

• would be able to probe this here. Conclusion We investigate the effect on friction and wear of a graphene coating on a polymer by simulating friction force microscopy experiments with molecular dynamics. A rigid counter-body simulating the tip of the AFM is rubbed against a substrate made of a

Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)

• Carl Drechsel,
• Philipp D’Astolfo,
• Jung-Ching Liu,
• Thilo Glatzel,
• Rémy Pawlak and
• Ernst Meyer

Beilstein J. Nanotechnol. 2022, 13, 1–9, doi:10.3762/bjnano.13.1

• features resemble typical patterns observed in friction force microscopy (FFM) [28][38] or scanning tunneling hydrogen microscopy (SThM) [70][71], since the trapped Fe atom senses the surface potential in analogy to the probing tip of FFM. For clarity, we overlay the Pb(111) surface lattice on top of the

Recent highlights in nanoscale and mesoscale friction

• Andrea Vanossi,
• Dirk Dietzel,
• Andre Schirmeisen,
• Ernst Meyer,
• Rémy Pawlak,
• Thilo Glatzel,
• Marcin Kisiel,
• Shigeki Kawai and
• Nicola Manini

Beilstein J. Nanotechnol. 2018, 9, 1995–2014, doi:10.3762/bjnano.9.190

• of the field foreseeable in the near future. Review Controlled nanomovements Friction force microscopy (FFM) is a well-defined AFM operation mode in which tiny lateral forces acting on the tip, as it scans across the surface, are recorded [9]. Atomic forces involving few-atom contacts can provide

Friction force microscopy of tribochemistry and interfacial ageing for the SiO_x/Si/Au system

• Christiane Petzold,
• Marcus Koch and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2018, 9, 1647–1658, doi:10.3762/bjnano.9.157

• Christiane Petzold Marcus Koch Roland Bennewitz INM – Leibniz Institute for New Materials, Campus D2 2, 66123 Saarbrücken, Germany 10.3762/bjnano.9.157 Abstract Friction force microscopy was performed with oxidized or gold-coated silicon tips sliding on Au(111) or oxidized Si(100) surfaces in

• wear. Friction, wear, and the re-passivation by oxides are discussed based on results for the temporal development of friction forces, on images of the scanned area after friction force microscopy experiments, and on electron microscopy of the tips. Keywords: contact ageing; friction; nanotribology

• structure [10], for which friction maxima have been predicted [11]. Friction force microscopy (FFM) is a key method to investigate the microscopic mechanisms underlying friction, wear, and lubrication as it allows for measurements of static and kinetic friction of single nanometer-scale contacts. In FFM, an

Generalized Hertz model for bimodal nanomechanical mapping

• Aleksander Labuda,
• Marta Kocuń,
• Waiman Meinhold,
• Deron Walters and
• Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

• ][5], force modulation [6][7], phase imaging [8][9], loss tangent imaging [10], friction force microscopy [11], creep compliance [12], shear modulation force microscopy [13], pulsed force microscopy [14] and torsional approaches [15]. These techniques can be broadly classified as either “parametric

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

• Andrzej J. Kulik,
• Małgorzata Lekka,
• Kyumin Lee,
• Grazyna Pyka-Fościak and
• Wieslaw Nowak

Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

• perpendicular (normal) to the surface and a relative position on a sample. In the AFM-FS measurement, force curves are recorded point-by-point, requiring a precise but tedious and very time consuming procedure. Lateral force microscopy (LFM), also called friction force microscopy (FFM) is another operational

Stick–slip behaviour on Au(111) with adsorption of copper and sulfate

• Nikolay Podgaynyy,
• Sabine Wezisla,
• Christoph Molls,
• Shahid Iqbal and
• Helmut Baltruschat

Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85

• the interpretation that the tip penetrates the electrochemical double layer at this point. At the potential (or point) of zero charge (pzc), stick–slip resolution persists at all normal forces investigated. Keywords: AFM; friction; friction force microscopy; nanotribology; underpotential deposition

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• molecules on surfaces. AFM has evolved considerably in the last few years, where new operation modes, such as non-contact force microscopy (nc-AFM), Kelvin probe force microscopy (KPFM) or friction force microscopy (FFM), were developed. One main focus is the high resolution capabilities of nc-AFM, which