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Search for "nanoprobing" in Full Text gives 3 result(s) in Beilstein Journal of Nanotechnology.

The nanomorphology of cell surfaces of adhered osteoblasts

  • Christian Voelkner,
  • Mirco Wendt,
  • Regina Lange,
  • Max Ulbrich,
  • Martina Gruening,
  • Susanne Staehlke,
  • Barbara Nebe,
  • Ingo Barke and
  • Sylvia Speller

Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20

Graphical Abstract
  • present a comprehensive characterization of the 3D nanomorphology of living, as well as fixed, osteoblastic cells using scanning ion conductance microscopy (SICM), which is a nanoprobing method that largely avoids mechanical perturbations. Dynamic ruffles are observed, manifesting themselves in
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Published 12 Mar 2021

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

  • Rosine Coq Germanicus,
  • Peter De Wolf,
  • Florent Lallemand,
  • Catherine Bunel,
  • Serge Bardy,
  • Hugues Murray and
  • Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

Graphical Abstract
  • ; integrated PIN diode; nanoprobing; scanning probe microscopy (SPM); scanning microwave impedance microscopy (sMIM); spectroscopy; Introduction In “front end of line” (FEOL) processing, the control, detection, and quantification of the effective 2D distributions of active dopants in semiconductors are
  • contrast in the scan. The mappings of the equivalent resistance (i.e., sMIM-R) and capacitance (i.e., sMIM-C) of the nanoprobing system, during interaction with the incident 3 GHz microwave, are represented in Figure 3c and Figure 3d, respectively. These sMIM signals reveal the complete structure of the
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Published 23 Nov 2020

Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times

  • Enrique A. López-Guerra and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223

Graphical Abstract
  • surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By focusing on the material perspective and employing a rigorous rheological approach, we deliver analytical closed
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Published 26 Oct 2017
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