Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization

• Yanping Wei,
• Jiafeng Shen,
• Yirong Yao,
• Xuke Li,
• Ming Li and
• Peiling Ke

Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142

• . Keywords: atomic force microscopy (AFM); high eigenmodes; multifrequency AFM; nanoscale material analysis; surface characterization; Introduction Atomic force microscopy (AFM) has become an indispensable tool for characterizing the morphology and surface properties of materials at the micro- and the