Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

• Jens Falter,
• Marvin Stiefermann,
• Gernot Langewisch,
• Philipp Schurig,
• Hendrik Hölscher,
• Harald Fuchs and
• André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

• -Leopoldshafen, Germany 10.3762/bjnano.5.59 Abstract Quartz tuning forks are being increasingly employed as sensors in non-contact atomic force microscopy especially in the “qPlus” design. In this study a new and easily applicable setup has been used to determine the static spring constant at several positions

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

• Adam Sweetman and
• Andrew Stannard

Beilstein J. Nanotechnol. 2014, 5, 386–393, doi:10.3762/bjnano.5.45

• Adam Sweetman Andrew Stannard The School of Physics and Astronomy, The University of Nottingham, Nottingham, NG7 2RD, U.K. 10.3762/bjnano.5.45 Abstract In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the

• extrapolation method. Keywords: background subtraction; DFM; F(z); force; atomic resolution; NC-AFM; Si(111); STM; van der Waals; Introduction Non-contact atomic force microscopy (NC-AFM) is now the tool of choice for surface scientists wishing to investigate interatomic and intermolecular forces on surfaces

Effect of contaminations and surface preparation on the work function of single layer MoS₂

• Oliver Ochedowski,
• Kolyo Marinov,
• Nils Scheuschner,
• Artur Poloczek,
• Benedict Kleine Bussmann,
• Janina Maultzsch and
• Marika Schleberger

Beilstein J. Nanotechnol. 2014, 5, 291–297, doi:10.3762/bjnano.5.32

• measurements were performed under ambient conditions using amplitude modulated KPFM, both having a great impact on the results. In this work we study the work function of SLM on a standard SiO2/Si substrate using non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy in situ. In our

Noncontact atomic force microscopy II

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31

• community gradually grew with each passing year. To provide a forum for exchange between researchers, progress in the field has been discussed since 1998 at annual conferences held in various cities around the world. The latest meeting in that series, the 16th International Conference on Non-Contact Atomic

• Force Microscopy hosted by the University of Maryland in August 2013, demonstrated once again rapid progress in the field. For this Thematic Series, many of the leading groups have provided contributions with the goal of assembling a collection of papers that provide an overview of the current state-of

Influence of the adsorption geometry of PTCDA on Ag(111) on the tip–molecule forces in non-contact atomic force microscopy

• Gernot Langewisch,
• Jens Falter,
• André Schirmeisen and
• Harald Fuchs

Beilstein J. Nanotechnol. 2014, 5, 98–104, doi:10.3762/bjnano.5.9

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

• M. Temmen,
• O. Ochedowski,
• B. Kleine Bussmann,
• M. Schleberger,
• M. Reichling and
• T. R. J. Bollmann

Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69

• mechanically exfoliated under ambient conditions on 6H-SiC(0001) are modified by (i) swift heavy ion (SHI) irradiation, (ii) by a force microscope tip and (iii) by severe heating. The resulting surface topography and the surface potential are investigated with non-contact atomic force microscopy (NC-AFM) and

• ) measured by KPFM. Keywords: graphene; Kelvin probe force microscopy (KPFM), local contact potential difference (LCPD); non-contact atomic force microscopy (NC-AFM); SiC; Introduction Since its discovery in 2004 [1], graphene, the 2D crystal with a honeycomb lattice of sp2-bonded carbon atoms, has been

• different BLG stackings, we investigate the topography by non-contact atomic force microscopy (NC-AFM) combined with measuring the local contact potential differences (LCPD) using Kelvin probe force microscopy (KPFM). Experimental Graphene is exfoliated from a HOPG crystal (Momentive Performance Materials

Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM

• Thilo Glatzel,
• Lars Zimmerli,
• Shigeki Kawai,
• Ernst Meyer,
• Leslie-Anne Fendt and
• Francois Diederich

Beilstein J. Nanotechnol. 2011, 2, 34–39, doi:10.3762/bjnano.2.4

• studies by non-contact atomic force microscopy (nc-AFM) were done on ionic crystals with adsorbed PTCDA [17][18][19][20][21][22], PTCDI [23] or C60 [24]. In the case of porphyrins, the growth [25][26][27] and electronic properties [28] of stable, monolayered molecular wires on KBr(001) with a length of up

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• defects in oxide surfaces was studied by non-contact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). Furthermore, the contact potential was determined by Kelvin probe force microscopy (KPFM). This technique has a high spatial resolution, thus avoiding averaging over various

• applied on thin oxide films beyond imaging the topography of the surface atoms. Keywords: aluminum oxide; charge state; contact potential; defects; domain boundaries; dynamic force microscopy; frequency modulation atomic force microscopy; Kelvin probe force microscopy; magnesium oxide; non-contact atomic

• force microscopy; scanning tunneling microscopy; thin films; work function; Review Introduction The chemical properties of many crystal surfaces, especially oxides, are significantly influenced by defects in the perfectly ordered structure [1][2][3][4][5]. These defects can be impurities in the surface

Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• oscillations of a cantilever with an interacting tip. This analysis allows to retrieve the force gradients, the forces and the Hamaker constant in a measurement time of less than 40 ms. Keywords: AFM; force; graphite; thermal excitation; wavelet transforms; Introduction The non-contact atomic force

• microscopy (NC-AFM) is a powerful tool to study not only the surface topography, but also the mechanical and chemical characteristics of the sample at the nanoscale [1][2][3]. The tip of an excited cantilever is sensitive to both forces and force gradients, when approaching the sample surface. The response