Optical contrast and refractive index of natural van der Waals heterostructure nanosheets of franckeite

• Patricia Gant,
• Foad Ghasemi,
• David Maeso,
• Carmen Munuera,
• Elena López-Elvira,
• Riccardo Frisenda,
• David Pérez De Lara,
• Gabino Rubio-Bollinger,
• Mar Garcia-Hernandez and
• Andres Castellanos-Gomez

Beilstein J. Nanotechnol. 2017, 8, 2357–2362, doi:10.3762/bjnano.8.235

• visible spectrum through a fit of the acquired spectra to a model based on the Fresnel law. Keywords: complex refractive index; franckeite; optical contrast; optical identification; van der Waals heterostructure; Introduction Mechanical exfoliation is a very powerful technique to produce a large variety

• Gelpak®) carrier substrate and then transferred to a SiO2/Si substrate by means of an all-dry transfer technique [24]. We employed two different nominal SiO2 thicknesses (ca. 90 and ca. 290 nm) to probe the role of the SiO2 thickness on the optical identification process. We selected those thickness

• available in the literature yet and it results crucial to further analysis of the optical properties of a material. For example, knowing the refractive index of a 2D material allows one to determine the substrate that optimizes its optical identification. This is done by calculating the optical contrast of

Modeling noncontact atomic force microscopy resolution on corrugated surfaces

• Kristen M. Burson,
• Mahito Yamamoto and
• William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

• /6z2). SiO2 resolution controversy Graphene was brought to prominence by the pioneering work of Geim and Novoselov in developing a fabrication technique for graphene devices involving optical identification of exfoliated flakes on 300 nm thick SiO2/Si [8]. As a result, much of the early scanning probe