Scanning probe microscopy studies on the adsorption of selected molecular dyes on titania

• Jakub S. Prauzner-Bechcicki,
• Lukasz Zajac,
• Piotr Olszowski,
• Res Jöhr,
• Antoine Hinaut,
• Thilo Glatzel,
• Bartosz Such,
• Ernst Meyer and
• Marek Szymonski

Beilstein J. Nanotechnol. 2016, 7, 1642–1653, doi:10.3762/bjnano.7.156

• organic adsorbate are necessary. The method of choice for investigating the local environment of a single dye molecule is high-resolution scanning probe microscopy. Microscopic results combined with the outcome of common spectroscopic methods provide a better understanding of the mechanism taking place at

• dianhydride (PTCDA); phtalocyanines; porphyrins; rutile; scanning probe microscopy; scanning tunneling microscopy (STM); titanium dioxide (TiO2); Introduction Today it comes as no surprise that photovoltaic devices can be made of materials other than silicon. Nanocrystalline materials accompanied by organic

• ) islands. Pc molecules There are very few reports available for TiO2 and phthalocyanines in planar heterojunction solar cell applications (see [42] and the references therein). In a few cases among these studies, scanning probe microscopy was used to examine the properties of the Pc/TiO2 interface itself

Dynamic of cold-atom tips in anharmonic potentials

• Tobias Menold,
• Peter Federsel,
• Carola Rogulj,
• Hendrik Hölscher,
• József Fortágh and
• Andreas Günther

Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148

• 10.3762/bjnano.7.148 Abstract Background: Understanding the dynamics of ultracold quantum gases in an anharmonic potential is essential for applications in the new field of cold-atom scanning probe microscopy. Therein, cold atomic ensembles are used as sensitive probe tips to investigate nanostructured

• -control. Keywords: anharmonic motion; cold-atom scanning probe microscopy; dephasing; dynamic mode; tip oscillation; Introduction The development of novel scanning probe techniques has lead to tremendous improvements in investigating nanomaterials [1]. Starting with conventional force and tunneling

• surface probing [23][24][25][26][27][28] and finally allowed for the realization of cold-atom scanning probe microscopy [29][30][31]. Here, an ultracold cloud of atoms is used as sensitive probe tip in a scanning microscope. First realizations have demonstrated this to be suitable for topographic [29] and

Noncontact atomic force microscopy III

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86

• publication of two installments in the Thematic Series titled “Noncontact Atomic Force Microscopy” in the Beilstein Journal of Nanotechnology [1][2]. This Thematic Series focusing on NC-AFM complements two other series titled “Advanced Atomic Force Microscopy Techniques” [3][4] and “Scanning Probe Microscopy

• and Related Methods” [5], making the Beilstein Journal of Nanotechnology a well-recognized outlet for scanning probe microscopy research. The current and third installment in the “Noncontact Atomic Force Microscopy” Thematic Series again demonstrates the constant development in the field. In

Correlative infrared nanospectroscopic and nanomechanical imaging of block copolymer microdomains

• Benjamin Pollard and
• Markus B. Raschke

Beilstein J. Nanotechnol. 2016, 7, 605–612, doi:10.3762/bjnano.7.53

• , hybrid imaging, near-field infrared spectroscopy, scanning probe microscopy; Introduction Functional soft-matter and polymer systems often exhibit novel phenomena due to nanoscale chemical heterogeneity and the resulting intermolecular interactions. Infrared vibrational scattering scanning near-field

Rigid multipodal platforms for metal surfaces

• Michal Valášek,
• Marcin Lindner and
• Marcel Mayor

Beilstein J. Nanotechnol. 2016, 7, 374–405, doi:10.3762/bjnano.7.34

• scanning probe microscopy [75][81][91], a crosslinker for the creation of arrays of gold nanoparticles, and to anchor several active tail molecules as complex ligands [79][80], fullerenes [77][78][92], rotaxanes [93], pseudorotaxanes and artificial molecular rotors [94][95][96][97] to the surface. Although

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• voltage; Introduction Scanning probe microscopy (SPM) is nowadays an established technological approach for surface analysis in many different research fields. Applications can be found in areas of life science measuring the properties of cells in buffer solution, submolecular structure of single

• distinguish between different materials in metallic or differently doped regions in semiconductors several scanning probe microscopy methods are implemented in our novel microscope. KPFM measures the difference of the contact potential difference (CPD) between the tip and the sample by applying a dc voltage

Au nanoparticle-based sensor for apomorphine detection in plasma

• Chiara Zanchi,
• Andrea Lucotti,
• Matteo Tommasini,
• Sebastiano Trusso,
• Ugo de Grazia,
• Emilio Ciusani and
• Paolo M. Ossi

Beilstein J. Nanotechnol. 2015, 6, 2224–2232, doi:10.3762/bjnano.6.228

• functionalized for the selective and sensitive detection of, for example, tumor cells [4]. Combining the SERS effect with scanning probe microscopy techniques (tip-enhanced Raman spectroscopy, TERS), molecular information can be obtained with high spatial resolution to show differences in the local chemical

Virtual reality visual feedback for hand-controlled scanning probe microscopy manipulation of single molecules

• Philipp Leinen,
• Matthew F. B. Green,
• Taner Esat,
• Christian Wagner,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2015, 6, 2148–2153, doi:10.3762/bjnano.6.220

• .6.220 Abstract Controlled manipulation of single molecules is an important step towards the fabrication of single molecule devices and nanoscale molecular machines. Currently, scanning probe microscopy (SPM) is the only technique that facilitates direct imaging and manipulations of nanometer-sized

• (PTCDA); scanning probe microscopy (SPM); scanning tunnelling microscopy (STM); single-molecule manipulation; virtual reality interface; Introduction The recently introduced scanning probe microscopy (SPM) technique of hand controlled manipulation (HCM) allows the operator of the SPM to manipulate

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

• Eyup Cinar,
• Ferat Sahin and
• Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

• nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation experiments performed with conventional AFM systems

• nanoindentation. Zhao et al. present a nanoindentation device that is designed to operate inside an SEM chamber in order to perform in situ indentation tests of indium phosphide [14]. We report a novel approach using a multi-probe scanning probe microscopy (SPM) system with tuning-fork probe technology in an

Electrospray deposition of organic molecules on bulk insulator surfaces

• Antoine Hinaut,
• Rémy Pawlak,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

• surfaces. This leads to the possibility to access molecular electronic properties at the single molecule level with scanning probe microscopy. We first demonstrated that solvent deposition from ESI has a weak influence on the KBr(001) surface. Then a complex molecule based on a triply fused diporphyrin was

Electrical properties and mechanical stability of anchoring groups for single-molecule electronics

• Riccardo Frisenda,
• Simge Tarkuç,
• Elena Galán,
• Mickael L. Perrin,
• Rienk Eelkema,
• Ferdinand C. Grozema and
• Herre S. J. van der Zant

Beilstein J. Nanotechnol. 2015, 6, 1558–1567, doi:10.3762/bjnano.6.159

• an enormous growth thanks to the development of reliable techniques to trap and electrically contact single molecules [1][2][3]. One such a technique involves the break-junction (BJ) methods; two widely used BJ methods are the mechanically controlled (MCBJ) and the scanning probe microscopy (SPMBJ

Nano-contact microscopy of supracrystals

• Adam Sweetman,
• Nicolas Goubet,
• Ioannis Lekkas,
• Marie Paule Pileni and
• Philip Moriarty

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

• tunnelling microscopy and spectroscopy. Keywords: dynamic force microscopy; nanoparticle; non-contact atomic force microscopy; point contact imaging; scanning probe microscopy; supracrystal; Introduction Artificial solids comprising extended assemblies of nanocrystals with a narrow size distribution

• for the first time and demonstrate that subparticle resolution images can be acquired in constant height mode, despite the high curvature of the particle surfaces. There remains, of course, the perennial issue plaguing the interpretation of scanning probe microscopy images: the convolution of the tip

High sensitivity and high resolution element 3D analysis by a combined SIMS–SPM instrument

• Yves Fleming and
• Tom Wirtz

Beilstein J. Nanotechnol. 2015, 6, 1091–1099, doi:10.3762/bjnano.6.110

• spectrometry (SIMS) data was combined with topographical data from the scanning probe microscopy (SPM) module for five test structures in order to obtain accurate chemical 3D maps: a polystyrene/polyvinylpyrrolidone (PS/PVP) polymer blend, a nickel-based super-alloy, a titanium carbonitride-based cermet, a

• of the TiCN cermet. Keywords: alloy; atomic force microscopy (AFM); correlative microscopy; differential sputtering; in situ; multimodal imaging; nano-cluster; polymer blend; secondary ion mass spectrometry (SIMS); scanning probe microscopy (SPM); SIMS artefacts; sputter-induced effects; sputter

• the depth scale, which are more or less important. This then causes distortions in the reconstructed 3D maps of the sample. To achieve actual high-resolution SIMS 3D analyses without risking the artefacts mentioned above, we developed a scanning probe microscopy (SPM) module that we integrated into

Electrocatalysis on the nm scale

• R. Jürgen Behm

Beilstein J. Nanotechnol. 2015, 6, 1008–1009, doi:10.3762/bjnano.6.103

• pushed by the rapid development of modern in situ spectroscopy and microscopy tools, such as in situ vibrational spectroscopy, in situ X-ray spectroscopy/diffraction, and in situ scanning probe microscopy, just to name a few, as well as the enormous progress that has been made in the theoretical

In situ scanning tunneling microscopy study of Ca-modified rutile TiO₂(110) in bulk water

• Giulia Serrano,
• Beatrice Bonanni,
• Tomasz Kosmala,
• Marco Di Giovannantonio,
• Ulrike Diebold,
• Klaus Wandelt and
• Claudio Goletti

Beilstein J. Nanotechnol. 2015, 6, 438–443, doi:10.3762/bjnano.6.44

• results from the literature. Prolonged immersion (two days) in the liquid leads to degradation of the overlayer, resulting in a disordered surface. X-ray photoelectron spectroscopy, performed after immersion in water, confirms the presence of calcium. Keywords: alkali earth metals; scanning probe

• microscopy; solid/liquid interface; titanium dioxide reconstruction; Introduction Metal oxide surfaces (in particular titanium dioxide (TiO2) surfaces) covered by an alkaline-earth-metal overlayer have been investigated in recent years in experiments [1][2][3][4][5] and theoretical studies [6], considering

Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

• Gemma Rius,
• Matteo Lorenzoni,
• Soichiro Matsui,
• Masaki Tanemura and
• Francesc Perez-Murano

Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20

• nanofabrication methods based on scanning probe microscopy have been developed during the last decades. Local anodic oxidation (LAO) is one of such methods: Upon application of an electric field between tip and surface under ambient conditions, oxide patterning with nanometer-scale resolution can be performed

Kelvin probe force microscopy in liquid using electrochemical force microscopy

• Liam Collins,
• Stephen Jesse,
• Jason I. Kilpatrick,
• Alexander Tselev,
• M. Baris Okatan,
• Sergei V. Kalinin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

• level, few techniques are capable of operating below the micron length scale [11]. Scanning probe microscopy (SPM) techniques are uniquely positioned to probe structure on nano- to micrometer length scales and can do so under vacuum, ambient or liquid environments. Thus, the development of SPM

Advanced atomic force microscopy techniques II

• Thilo Glatzel,
• Ricardo Garcia and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 2326–2327, doi:10.3762/bjnano.5.241

• surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools for measurements of all kind of nanoscale properties are scanning probe microscopy (SPM) techniques, which were triggered by the

Nanoforging – Innovation in three-dimensional processing and shaping of nanoscaled structures

• Andreas Landefeld and
• Joachim Rösler

Beilstein J. Nanotechnol. 2014, 5, 1066–1070, doi:10.3762/bjnano.5.118

• often used for tough and sharp probes in scanning probe microscopy. An electrochemical process described in [12] is applied here to produce the essentially conical bar stock, having a diameter of 100 to 300 nm at the tip and 1000 to 4000 nm at the forging tail. Figure 2b illustrates a possible

A nanometric cushion for enhancing scratch and wear resistance of hard films

• Katya Gotlib-Vainshtein,
• Olga Girshevitz,
• Chaim N. Sukenik,
• David Barlam and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

• element analysis; hard coating; scanning probe microscopy; scratch; thin films; tribology; Introduction Polymers are versatile materials within an extraordinary range of properties. In many tribological applications, they are often preferred relative to metal alternatives [1][2][3]. However, their

• beams) enables simultaneous work using both beams. Atomic force microscopy (AFM). All scanning probe microscopy was done using an ICON instrument (Bruker AXS SAS). The deflection sensitivity of each probe was measured by pressing the probe on a hard surface and spring constant was calibrated by the

Control theory for scanning probe microscopy revisited

• Julian Stirling

Beilstein J. Nanotechnol. 2014, 5, 337–345, doi:10.3762/bjnano.5.38

• a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation. Keywords: AFM; control theory; feedback; scanning probe microscopy

• ; Introduction Scanning probe microscopy (SPM) imaging relies on feedback loops to maintain a constant interaction between the tip and the sample [1][2]. Many well known artefacts can arise from improper feedback settings [3][4][5]. Thus, for reliable SPM operation and analysis the characteristics and behaviour

The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

• Christian Wagner,
• Norman Fournier,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2014, 5, 202–209, doi:10.3762/bjnano.5.22

• Future Information Technology, 52425 Jülich, Germany 10.3762/bjnano.5.22 Abstract Scanning probe microscopy (SPM) plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule–surface interaction while tuning its strength through SPM tip-induced single

• rapid development of scanning probe microscopy (SPM) techniques, investigations of adsorbate–surface interactions on a single-molecule level have become possible [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. Especially interesting is the possibility of probing the molecule–surface

Exploring the retention properties of CaF₂ nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

• Matthias Wasem,
• Joachim Köser,
• Sylvia Hess,
• Enrico Gnecco and
• Ernst Meyer

Beilstein J. Nanotechnol. 2014, 5, 36–43, doi:10.3762/bjnano.5.4

• substrate roughness, morphology and size of the particles. Keywords: AM-AFM in liquid; nanodentistry; nanoparticles; Introduction Amplitude-modulation atomic force microscopy (AM-AFM), also known as tapping mode AFM, is a variant of scanning probe microscopy. In this dynamic technique imaging is achieved

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• knowledge has not yet been applied to noise propagation in scanning probe microscopy. The PLL output noise PSD is now obtained using the noise gain formalism: Regarding the PLL forward gain APLL, Equation 7, it is noteworthy that the open loop gain of the phase as function of frequency excursion has the

• resonator to cryogenic temperatures, possibly using laser cooling. These works aim at the Heisenberg limit and are not specific to scanning probe microscopy. Practical SPM systems seem to be still further away from the ultimate limit. Conclusion The dynamic behavior of an FM-KFM has been measured and

• microscope (UHV-VT-AFM). It is operated by a Nanonis scanning probe microscopy (SPM) controller entirely based on digital signal processing (DSP). The probe that was used in these experiments is a platinum-iridium coated Nanosensors Point Probe Plus EFM tip with a spring constant between 1 and 3 N/m. Its

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• limited to, optical tweezers [1], surface force apparatus [2][3], nanomanipulators [4], electron and other microscopy techniques. Two techniques which have made great advances in the studies of nanomechanics are instrumented nanoindentation and scanning probe microscopy. The versatility and utility of

• works [16][17][18][19] paved the way for two new point-probe nanomechanical testing devices which were developed in the 1980s – instrumented nanoindentation (INI, also known as depth-sensing instrumentation) [19][20] and atomic force microscopy (AFM, also known by the more general term of scanning probe

• microscopy, SPM) [21]. These developments facilitated the measurement of mechanical properties of very small volumes of materials, opening new avenues of research. Reducing dimensions to the nanoscale gave birth to new paradigms in mechanical measurements and interpretation: In addition to the increased