Entropy effects in the collective dynamic behavior of alkyl monolayers tethered to Si(111)

• Christian Godet

Beilstein J. Nanotechnol. 2015, 6, 583–594, doi:10.3762/bjnano.6.60

• modulation or dipole rotation [32][39][40][50]. In the following, the low dc bias situation is briefly recalled, before considering the effect of increasing the reverse bias, |VDC|, and the spectral analysis method. Dipolar relaxation at low applied bias Two classes of relaxation mechanisms, A and B, have

X-ray photoelectron spectroscopy of graphitic carbon nanomaterials doped with heteroatoms

• Toma Susi,
• Thomas Pichler and
• Paola Ayala

Beilstein J. Nanotechnol. 2015, 6, 177–192, doi:10.3762/bjnano.6.17

• work is still ongoing to identify its precise atomic bonding configurations. In general, care should be taken in the preparation of a suitable sample, consideration of the intrinsic photoemission response of the material in question, and the appropriate spectral analysis. If this is not the case

Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM

• Kfir Kuchuk and
• Uri Sivan

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

• harmonics to a convolution over Fts, have been derived [15][17], but existing methods to recover Fts from higher harmonics rely on spectral analysis of the AFM signal [18][19], and require the measurement of a significant number of harmonics to obtain reasonable accuracy [5][17]. Although measurement of all

Size-dependent density of zirconia nanoparticles

• Agnieszka Opalinska,
• Iwona Malka,
• Wojciech Dzwolak,
• Tadeusz Chudoba,
• Adam Presz and
• Witold Lojkowski

Beilstein J. Nanotechnol. 2015, 6, 27–35, doi:10.3762/bjnano.6.4

• prepared for FTIR spectral analysis. FTIR commonly shows a strong infrared absorption around 3400 cm−1 that corresponds to stretching vibrations of the –OH bonds. Studies of the annealing effect on –OH groups on the nanoparticle surfaces are typically carried out in vacuum [19][27] since water vapor and

Determining cantilever stiffness from thermal noise

• Jannis Lübbe,
• Matthias Temmen,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23

• analysis requires a sophisticated spectral analysis, we introduce a new method to determine kn from a spectral analysis of the demodulated oscillation signal of the excited cantilever that can be performed in the frequency range of 10 Hz to 1 kHz regardless of the eigenfrequency of the cantilever. We

• demonstrate that the latter method is in particular useful for noncontact atomic force microscopy (NC-AFM) where the required simple instrumentation for spectral analysis is available in most experimental systems. Keywords: AFM; cantilever; noncontact atomic force microscopy (NC-AFM); Q-factor; thermal

• excitation; resonance; spectral analysis; stiffness; Introduction Noise as a result of thermal fluctuations is a ubiquitous phenomenon present in any physical system kept at a finite temperature. The seminal work of Nyquist established the simple framework of thermodynamic considerations for a quantitative

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

• Jannis Lübbe,
• Matthias Temmen,
• Sebastian Rode,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

• , Zurich, Switzerland) for spectral analysis. System C is a UHV 750 variable temperature STM/AFM with a PLLPro2 (software version 0.20.0) as the demodulator (RHK Technology, Inc., Troy, MI, USA). The light source is a laser source type 51nanoFCM (Schäfter+Kirchhoff GmbH, Hamburg, Germany) operated in the

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• driven at two distinct frequencies. This effect can be used to measure mechanical sample properties with an AFM [9][31]. In bimodal force microscopy, a spectral analysis of the system response allows one to distinguish between stable (quasi-) periodic and chaotic regimes. The time series shown in Figure

Nano-FTIR chemical mapping of minerals in biological materials

• Sergiu Amarie,
• Paul Zaslansky,
• Yusuke Kajihara,
• Erika Griesshaber,
• Wolfgang W. Schmahl and
• Fritz Keilmann

Beilstein J. Nanotechnol. 2012, 3, 312–323, doi:10.3762/bjnano.3.35

• and spectral analysis of the backscattered light is by an asymmetric Michelson interferometer that generates, by online Fourier transformation, infrared amplitude and phase spectra simultaneously; a switchable reference path ensures an absolute quantification of backscattering [3]. Note that while