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Search for "surface topography" in Full Text gives 123 result(s) in Beilstein Journal of Nanotechnology.

Digging gold: keV He+ ion interaction with Au

  • Vasilisa Veligura,
  • Gregor Hlawacek,
  • Robin P. Berkelaar,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2013, 4, 453–460, doi:10.3762/bjnano.4.53

Graphical Abstract
  • extremely small [16][17]. This makes the microscope highly suited for obtaining high-resolution images of the surface topography. An image can further be recorded by simultaneous collection of the backscattered He with a microchannel plate [18]. The microscope is also equipped with a silicon drift detector
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Published 24 Jul 2013

Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes

  • Alex Henning,
  • Gino Günzburger,
  • Res Jöhr,
  • Yossi Rosenwaks,
  • Biljana Bozic-Weber,
  • Catherine E. Housecroft,
  • Edwin C. Constable,
  • Ernst Meyer and
  • Thilo Glatzel

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

Graphical Abstract
  • ., surface topography and potential, are still unclear and have the potential to increase the efficiency and long-term stability of the devices. Investigations of nanoscaled photovoltaic devices require nanometer-scale measuring methods, including time-resolved measurements of the carrier dynamics [15][16
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Published 01 Jul 2013

Polynomial force approximations and multifrequency atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

Graphical Abstract
  • that macroscopic force models, such as the DMT model, might not be applicable on the nanoscale [27] and that tip shape and surface topography lead to an interaction geometry that is different from the model geometry of a perfect sphere and a perfectly flat plane [20]. Moreover, the DMT model does not
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Published 10 Jun 2013

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

  • Mark Cronin-Golomb and
  • Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

Graphical Abstract
  • the surface topography and local mechanical response with high spatial resolution [20][31]. This mode uses a T-shaped cantilever with an offset tip. When used in dynamic AFM, the cantilever vibrates up and down, similar to conventional cantilevers. In addition to the vertical motion, tip–sample
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Published 05 Apr 2013

Effect of normal load and roughness on the nanoscale friction coefficient in the elastic and plastic contact regime

  • Aditya Kumar,
  • Thorsten Staedler and
  • Xin Jiang

Beilstein J. Nanotechnol. 2013, 4, 66–71, doi:10.3762/bjnano.4.7

Graphical Abstract
  • models of rough surface topography are based on the relative distribution of asperities within the contact. In order to understand the effect of roughness, statistical rough surface contact modes have been introduced starting from the very early work of Abbot and Firestone in 1933 [4] for purely plastic
  • detailed information about surface topography and surface roughness. The samples were imaged with commercial tips featuring a nominal tip radius of 10 nm in a feedback-controlled mode on all three axes. Five 8 × 8 μm2 images with a pixel resolution of 512 × 512 were taken at different surface positions on
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Published 28 Jan 2013

Sub-10 nm colloidal lithography for circuit-integrated spin-photo-electronic devices

  • Adrian Iovan,
  • Marco Fischer,
  • Roberto Lo Conte and
  • Vladislav Korenivski

Beilstein J. Nanotechnol. 2012, 3, 884–892, doi:10.3762/bjnano.3.98

Graphical Abstract
  • the etching procedure is shown in Figure 3, imaged by AFM for etching quality, surface topography, and particle size. The height of the particles is measured accurately, but not the diameter, since the convolution of a small particle and the tip produces a width distortion. Keeping all the process
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Published 19 Dec 2012

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

  • Blake W. Erickson,
  • Séverine Coquoz,
  • Jonathan D. Adams,
  • Daniel J. Burns and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

Graphical Abstract
  • method uses an iterative thresholded processing algorithm for rapid and accurate separation of background and surface topography. This separation prevents artificial bias from topographic features and ensures the best possible coherence between the different images in a sequence. This method is equally
  • generate a single image of a sample surface or surfaces of multiple samples. The resulting data sets are relatively small and easy to correct by hand. In an emerging part of the field, the goal is no longer to see just the detailed surface topography; but rather, to also see how this topography changes as
  • regions, and not real topography), the minimization of will improve the image. Commonly used methods for correction of inherent distortions The goal of AFM image processing is to correct the inherent distortions mentioned above and recover an accurate representation of the undistorted surface topography
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Published 13 Nov 2012

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

  • Jianming Zhang,
  • Zehra Parlak,
  • Carleen M. Bowers,
  • Terrence Oas and
  • Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

Graphical Abstract
  • lateral resolution is important for a broad range of applications in materials science [1][2][3][4][5][6][7][8][9][10] and in the life sciences [11][12][13][14][15][16][17][18][19][20]. The atomic force microscope (AFM) [21], due to its force sensitivity and ability to image surface topography with high
  • from the surface-topography-induced deflection response of the cantilever, thus precluding clear signal deconvolution [29]. Both the first and second harmonics, however, do not interfere with the feedback loop and can be detected by lock-in techniques. At low forces, the second-harmonic factor (β
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Published 26 Jun 2012

Junction formation of Cu3BiS3 investigated by Kelvin probe force microscopy and surface photovoltage measurements

  • Fredy Mesa,
  • William Chamorro,
  • William Vallejo,
  • Robert Baier,
  • Thomas Dittrich,
  • Alexander Grimm,
  • Martha C. Lux-Steiner and
  • Sascha Sadewasser

Beilstein J. Nanotechnol. 2012, 3, 277–284, doi:10.3762/bjnano.3.31

Graphical Abstract
  • Figure 2 provide additional information about the buffer layers and the Cu3BiS3 film. The presented images represent the raw data, shifted only by the constant work function of the tip. Due to the rough surface topography, sporadic tip changes could not be avoided (visible as the horizontal streaks
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Published 23 Mar 2012

Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

  • Christian Held,
  • Thomas Seyller and
  • Roland Bennewitz

Beilstein J. Nanotechnol. 2012, 3, 179–185, doi:10.3762/bjnano.3.19

Graphical Abstract
  • comparison of samples prepared in UHV and in an argon atmosphere reveals huge differences in the surface topography (Figure 2a and Figure 2b). While the sample prepared in UHV exhibits the pitted structure described above, the sample prepared in an argon atmosphere shows only a few straight step bunches
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Published 29 Feb 2012

Electron-beam patterned self-assembled monolayers as templates for Cu electrodeposition and lift-off

  • Zhe She,
  • Andrea DiFalco,
  • Georg Hähner and
  • Manfred Buck

Beilstein J. Nanotechnol. 2012, 3, 101–113, doi:10.3762/bjnano.3.11

Graphical Abstract
  • -off (Figure 7b). We ascribe this to nonvertical growth of the trench walls due to transport-limited deposition, similar to subconformal Cu deposition in microelectronics [55][56]. Besides the definition of the lateral dimensions, another point of interest is the surface topography. Reminding ourselves
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Published 06 Feb 2012

Fabrication of multi-parametric platforms based on nanocone arrays for determination of cellular response

  • Lindarti Purwaningsih,
  • Tobias Schoen,
  • Tobias Wolfram,
  • Claudia Pacholski and
  • Joachim P. Spatz

Beilstein J. Nanotechnol. 2011, 2, 545–551, doi:10.3762/bjnano.2.58

Graphical Abstract
  • Lindarti Purwaningsih Tobias Schoen Tobias Wolfram Claudia Pacholski Joachim P. Spatz Department of New Materials and Biosystems, Max Planck Institute for Intelligent Systems, Heisenbergstraße 3, 70569 Stuttgart, Germany 10.3762/bjnano.2.58 Abstract Cellular response to both surface topography
  • finding for research dealing with the reactions of neuron-like tissue in the immediate moments after direct contact with an implanted surface. Keywords: block copolymer nanolithography; cell adhesion; nanostructures; surface chemistry; surface topography; Introduction Nanostructured materials for
  • medical applications are intended to be in contact with human tissue and therefore to influence cell function by their surface topography as well as by their surface chemistry. Countless studies on cellular response to nanoscale topographies [1][2][3][4], chemical gradients [5][6], and combinations of
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Published 06 Sep 2011

The effect of surface anisotropy in the slippery zone of Nepenthes alata pitchers on beetle attachment

  • Elena V. Gorb and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2011, 2, 302–310, doi:10.3762/bjnano.2.35

Graphical Abstract
  • effects on insect attachment and examine the contribution of surface topography, we prepared replicas of the de-waxed pitchers and tested them together with de-waxed plant samples in the second type of traction experiments. Replicas were obtained by applying the two-component dental wax (Coltène President
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Published 16 Jun 2011

The role of the cantilever in Kelvin probe force microscopy measurements

  • George Elias,
  • Thilo Glatzel,
  • Ernst Meyer,
  • Alex Schwarzman,
  • Amir Boag and
  • Yossi Rosenwaks

Beilstein J. Nanotechnol. 2011, 2, 252–260, doi:10.3762/bjnano.2.29

Graphical Abstract
  • measure the surface topography, while the oscillations due to the electrostatic force (in amplitude modulated AM-KPFM at the second resonance or in frequency modulated FM-KPFM at several hundred Hz [16]) are nullified by adjusting Vdc(r). The first resonance oscillations have a strong effect on the
  • discussed below. The effect of the first resonance In either the single or dual pass KPFM methods the cantilever oscillates at the frequency of its first resonance in order to measure the surface topography in the non-contact mode. In the previous sections the cantilever was considered rigid, meaning that
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Published 18 May 2011

Moisture harvesting and water transport through specialized micro-structures on the integument of lizards

  • Philipp Comanns,
  • Christian Effertz,
  • Florian Hischen,
  • Konrad Staudt,
  • Wolfgang Böhme and
  • Werner Baumgartner

Beilstein J. Nanotechnol. 2011, 2, 204–214, doi:10.3762/bjnano.2.24

Graphical Abstract
  • . We further tried to mimic the properties and effects of the natural integument by manufacturing replicas of the surface topography. We found that in fact this micro ornamentation yields a super-wettable (superhydrophilic) surface, and the semi-tubular capillaries allow for an efficient – and in the
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Published 13 Apr 2011

Superhydrophobicity in perfection: the outstanding properties of the lotus leaf

  • Hans J. Ensikat,
  • Petra Ditsche-Kuru,
  • Christoph Neinhuis and
  • Wilhelm Barthlott

Beilstein J. Nanotechnol. 2011, 2, 152–161, doi:10.3762/bjnano.2.19

Graphical Abstract
  • as the surface topography, robustness and the unique properties of the epicuticular wax. The aim of this article is to integrate the relevant features of the lotus leaf, and to compare them with superhydrophobic leaves of other plant species in order to illustrate their significance. Results and
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Published 10 Mar 2011

Capillary origami: superhydrophobic ribbon surfaces and liquid marbles

  • Glen McHale,
  • Michael I. Newton,
  • Neil J. Shirtcliffe and
  • Nicasio R. Geraldi

Beilstein J. Nanotechnol. 2011, 2, 145–151, doi:10.3762/bjnano.2.18

Graphical Abstract
  • flexible solid possessing no curvature (or stretching) energy and, hence, a vanishing elastocapillary length. In the study of liquid marbles, the simplest assumption is that each grain is spherical in shape and has no particular surface topography. As a consequence all grains, irrespective of their surface
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Published 10 Mar 2011

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

  • Samer Darwich,
  • Karine Mougin,
  • Akshata Rao,
  • Enrico Gnecco,
  • Shrisudersan Jayaraman and
  • Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

Graphical Abstract
  • the effect of functional (hydrophilic vs hydrophobic) molecules grafted on the Au nanoparticles on their mobility. In addition, we will address the important issue of environmental conditions (T, RH%), surface topography and tip scan velocities on the manipulation performance of gold nanoparticles
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Published 04 Feb 2011

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

  • Sergei Magonov and
  • John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

Graphical Abstract
  • contact regime. In other words, imaging at the set-point amplitude (Asp) below its transition value will insure a profiling of surface topography, and at higher Asp the imaging will proceed in the non-contact mode when the probe experiences long-range forces such as electrostatic forces. This is
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Published 06 Jan 2011

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

  • Thomas König,
  • Georg H. Simon,
  • Lars Heinke,
  • Leonid Lichtenstein and
  • Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

Graphical Abstract
  • makes atomic resolution on conductors [7] as well as on insulators [8] possible. In addition to investigations on the surface topography, site specific spectroscopy measurements can be performed [8]. The whole setup is placed in a sound absorber cabin and is carried on a wooden frame, which, in turn, is
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Published 03 Jan 2011

Tip-sample interactions on graphite studied using the wavelet transform

  • Giovanna Malegori and
  • Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

Graphical Abstract
  • microscopy (NC-AFM) is a powerful tool to study not only the surface topography, but also the mechanical and chemical characteristics of the sample at the nanoscale [1][2][3]. The tip of an excited cantilever is sensitive to both forces and force gradients, when approaching the sample surface. The response
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Published 22 Dec 2010

Precursor concentration and temperature controlled formation of polyvinyl alcohol-capped CdSe-quantum dots

  • Chetan P. Shah,
  • Madhabchandra Rath,
  • Manmohan Kumar and
  • Parma N. Bajaj

Beilstein J. Nanotechnol. 2010, 1, 119–127, doi:10.3762/bjnano.1.14

Graphical Abstract
  • -section of Cd and Se, indicate the stoichiometry of the cadmium selenide quantum dots formed as 1:1, i.e., Cd1Se1. TEM and AFM studies Transmission electron microscopy and atomic force microscopy are very important techniques for providing information about particle size, shape, surface topography, etc
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Published 07 Dec 2010

Sensing surface PEGylation with microcantilevers

  • Natalija Backmann,
  • Natascha Kappeler,
  • Thomas Braun,
  • François Huber,
  • Hans-Peter Lang,
  • Christoph Gerber and
  • Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

Graphical Abstract
  • polymer brush are less likely obtained by the “grafting to” approach [42]. AFM images of the PEGylated Au surface taken under different solvent conditions reinforce the interpretation that a brush-like layer has formed. In PBS buffer (good solvent), we find that the surface topography is strongly
  • surface structure (Figure 6). In contrast, the Au surface topography does not change regardless of the scanning force used in 20% 2-propanol (poor solvent). This is due to the collapsed conformation of tethered PEG chains that offers minimal resistance against the AFM tip. The influence of solvent quality
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Published 22 Nov 2010
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