Towards a quantitative theory for transmission X-ray microscopy

• James G. McNally,
• Christoph Pratsch,
• Stephan Werner,
• Stefan Rehbein,
• Andrew Gibbs,
• Jihao Wang,
• Thomas Lunkenbein,
• Peter Guttmann and
• Gerd Schneider

Beilstein J. Nanotechnol. 2025, 16, 1113–1128, doi:10.3762/bjnano.16.82

• ; transmission X-ray microscope; Introduction Transmission X-ray microscopes (TXMs) operating in the soft and tender X-ray energy range are valuable tools for structural analysis in both biomedical and materials science research [1][2][3][4]. These microscopes yield images at a lateral resolution approaching 25

• itself must be extended to phase contrast imaging for hard X-rays. Conclusion We have developed an experimental and theoretical framework to evaluate transmission X-ray microscope models. We find that a relatively simple model of the microscope yields very good qualitative agreement with experimental

High-throughput synthesis of modified Fresnel zone plate arrays via ion beam lithography

• Kahraman Keskinbora,
• Umut Tunca Sanli,
• Margarita Baluktsian,
• Corinne Grévent,
• Markus Weigand and
• Gisela Schütz

Beilstein J. Nanotechnol. 2018, 9, 2049–2056, doi:10.3762/bjnano.9.194

• single-pass, single-pixel exposure (SPSP-E) writing strategy will be discussed. Then, an application of rapid realization of a high-resolution FZP with 30 nm outermost zone width and its imaging performance in a scanning transmission X-ray microscope (STXM) will be presented. Finally, the method is

• realization demonstrates the capabilities of modern focused ion beam instrumentation for direct-write lithography. Soft X-ray microscopy tests using the FZP The imaging resolution and the DE of the FZP were tested using a scanning transmission X-ray microscope (STXM) [43] as described earlier [28]. The

• zones using single-pixel lines in a single-pass milling strategy writing zones as small as 15 ± 3 nm in width. With an outermost L:S ratio of roughly 2.5:1, an effective ∆r of 30 nm was achieved. The FZP was tested by using the optic directly as a focusing optic in a scanning transmission X-ray

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

• Peter Guttmann and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2015, 6, 595–604, doi:10.3762/bjnano.6.61

• from [30]. Copyright 1995 Cambridge University Press. Schematic setup of a scanning transmission X-ray microscope (STXM). A full field transmission X-ray microscope (TXM) for a bending magnet source uses two zone plate lenses, condenser and objective, to form a 2D image on the detector. Additionally, a

X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

• Carla Bittencourt,
• Adam P. Hitchock,
• Xiaoxing Ke,
• Gustaaf Van Tendeloo,
• Chris P. Ewels and
• Peter Guttmann

Beilstein J. Nanotechnol. 2012, 3, 345–350, doi:10.3762/bjnano.3.39

• . Deviation from the expected signal intensity can be associated with nonplanarity, structural defects, etc. [12]. Here we use NEXAFS spectromicroscopy, performed with the Helmholtz Zentrum Berlin (HZB) full-field transmission X-ray microscope (TXM) installed at the electron storage ring BESSY II [19], to