Supporting Information
| Supporting Information File 1: Additional experimental information. | ||
| Format: PDF | Size: 277.4 KB | Download |
Cite the Following Article
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
François Piquemal, Khaled Kaja, Pascal Chrétien, José Morán-Meza, Frédéric Houzé, Christian Ulysse and Abdelmounaim Harouri
Beilstein J. Nanotechnol. 2023, 14, 1141–1148.
https://doi.org/10.3762/bjnano.14.94
How to Cite
Piquemal, F.; Kaja, K.; Chrétien, P.; Morán-Meza, J.; Houzé, F.; Ulysse, C.; Harouri, A. Beilstein J. Nanotechnol. 2023, 14, 1141–1148. doi:10.3762/bjnano.14.94
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 8.7 MB | Download |
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Piquemal, F.; Chrétien, P.; Morán‐Meza, J.; Houzé, F.; Delvallée, A.; Ulysse, C.; Harouri, A. Calibrating Resistance and Current Measurements in Conductive Probe Atomic Force Microscopy: New Reference Samples and Calibration Methods. physica status solidi (a) 2025, 222. doi:10.1002/pssa.202400711
- Rahe, P.; Bald, I.; Hauptmann, N.; Hoffmann-Vogel, R.; Mönig, H.; Reichling, M. Advanced atomic force microscopy techniques V. Beilstein journal of nanotechnology 2025, 16, 54–56. doi:10.3762/bjnano.16.6
- Sikora, A.; Gajewski, K.; Badura, D.; Pruchnik, B.; Piasecki, T.; Raczkowski, K.; Gotszalk, T. Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors (Basel, Switzerland) 2024, 24, 5649. doi:10.3390/s24175649
