5 article(s) from Cohen, Sidney R
- Full Research Paper
- Published 04 Jan 2017
-
PDF -
Album-
![]()
Figure 1: MFM imaging of a HDD featuring PMR with magnetic domains being aligned parallel or antiparallel to ...
-
![]()
Figure 2: Magnetic recording medium: (a) TEM cross-section image with indication of the stack setup used for ...
-
![]()
Figure 3: Polarization dependence of absorptivity (λ = 785 nm): p-polarized light is 3.5–4 times better absor...
-
![]()
Figure 4: Influence of the DC bias field during laser illumination (λ = 532 nm, CW, P = 8 mW) on an as-is HDD...
-
![]()
Figure 5: (a) Free-hand writing of magnetic features at CW illumination (p-polarized, 785 nm, 12 mW), yieldin...
-
![]()
Figure 6: MFM phase scans and intensity profiles of “dots” laser-written at 785 nm. The laser power was kept ...
-
![]()
Figure 7: Power absorption per volume within the magnetic stack. (a) Cross-sectional absorption per layer of ...
-
![]()
Figure 8: Comsol thermal modelling of a Gaussian laser pulse (P = 40 mW; λ = 785 nm; τ = 50 ns, γ = 70°) bein...
-
- Full Research Paper
- Published 10 Jul 2014
-
PDF -
Album-
![]()
Figure 1: Friction from plowing of wear particles [16] a) materials of same hardness, b) top material harder than...
-
![]()
Figure 2: SEM images of titania coating on a) Si, b) kapton and c) PDMS. rms roughness measured by AFM and th...
-
![]()
Figure 3: AFM images of titania on Si (I, II), kapton (III, IV) and PDMS (V, VI) before and after scratching ...
-
![]()
Figure 4: Wear volumes (in µm3) resulting from different loads for the titania coatings on Si and kapton.
-
![]()
Figure 5: SEM images of titania coating on a) PC, b) PC and PDMS.
-
![]()
Figure 6: UV–vis spectra for PC with and without titania/PDMS coating. Blue is uncoated PC and green is coate...
-
![]()
Figure 7: AFM images showing results of scratch tests on coated and uncoated PC at the loads indicated. (a) n...
-
![]()
Figure 8: Dependence of scratch resistance on sliding speed. a) AFM image of PC + TiO2 after scratching. b) C...
-
![]()
Figure 9: Applied load vs friction force curves and µ evaluated by lateral force microscopy.
-
![]()
Figure 10: FEA model for 7 nm titania layer for 10 nN force showing z-component of global stress distribution ...
-
![]()
Figure 11: Model used for finite element calculations, for 7 nm titania film thickness. (a) Substrate is seen ...
-
- Review
- Published 29 Nov 2013
-
PDF -
Album-
![]()
Figure 1: Adhesion-induced hysteretic negative unloading force observed on indenting PDMS (4% cross-linked) b...
-
![]()
Figure 2: (a) Schematic of instrumented nanoindenter, including P - calibrated force; L - support springs; D ...
-
![]()
Figure 3: Load-vs-displacement curve taken by nanoindentation with a Berkovich indenter tip on a polyurethane...
-
![]()
Figure 4: Fundamental models for a viscoelastic mechanical system. (a) Voigt model (b) Maxwell model (c) Gene...
-
![]()
Figure 5: Modulus measurements on polypropylene (A) Load-vs-deformation curve (B) Reduced storage modulus det...
-
![]()
Figure 6: Calibration of the system damping for INI. The damping was computed for each frequency at different...
-
![]()
Figure 7: Dynamic INI of iPP as a function of the frequency. The error bars indicate the standard deviation c...
-
![]()
Figure 8: AFM tip modulation: (a) Phase shift and (b) amplitude in air (dashed line) and on sample (solid lin...
-
![]()
Figure 9: Dynamic AFM measurements of iPP as a function of the frequency. The measurements were made at a dep...
-
![]()
Figure 10: AFM probe creep test showing the creep compliance calculated using Equation 11 for PMMA. (a) A 10 second creep...
-
- Full Research Paper
- Published 20 Dec 2011
-
PDF -
Album-
![]()
Figure 1: (a) Topography (color bar: 0–70 nm), (b) phase (color bar: 0–15 degrees), (c) error signal (scale i...
-
![]()
Figure 2: (a) Topography (color bar: 0–70 nm), (b) phase (color bar: 0–15 degrees), (c) error signal (scale i...
-
![]()
Figure 3: (a) Topography (color bar: 0–15 nm), (b) phase (color bar: 0–20 degrees), (c) error signal (scale i...
-
![]()
Figure 4: Histogram of the normalized modulus for different illumination conditions: As prepared, at 365 nm f...
-
![]()
Figure 5: Displacement vectors for the normal mode that dominates the averaged force constant of (a) trans- a...
-
![]()
Figure 6: (a) Arrangement of the fixed sulfur atoms in the MD model of the SAM. The unit cell that has been p...
-
![]()
Figure 7: Compound 1 and compound 2 (2-DA-thiol), showing the deprotection reaction yielding the molecule use...
-
![]()
Figure 8: AFM images of (a) clean evaporated Au surface (500 × 500 nm2 color bar 12 nm) and (b) surface coate...
-
![]()
Figure 9: UV–vis spectra for thio-2-DA in chloroform solution after exposure to 365 nm light (cis form) and 4...
-
![]()
Figure 10: Sketch of the model used to derive SAM stiffness from QM results on the single molecule. (a) A is t...
-
![]()
Figure 11: Computational compression procedure: Force acting on the indenter as a function of the distance bet...
-
