3 article(s) from Fowlkes, Jason D
- Full Research Paper
- Published 07 Apr 2017
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Figure 1: Schematic illustrating the experimental system which includes a laser delivery system, precursor an...
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Figure 2: Segment angle plotted as a function of dwell time per pixel grown under six different conditions: 1...
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Figure 3: BF STEM images of a) an as-deposited EBID segment with a 10.4 ms dwell time per pixel and in situ L...
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Figure 4: SEM images (scale bar length is 100 nm) of suspended nanowires grown across a ≈500 nm gap using a d...
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Figure 5: COMSOL™ simulation results showing the preferential heating at of the EBID deposit. a) is a plot of...
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- Full Research Paper
- Published 08 Apr 2015
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Figure 1: In situ EDS spectra of deposits purified using an electron beam with an energy of 5 keV, a current ...
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Figure 2: a) Cross-section SEM images of 400 nm thick PtCx deposits that were purified for 1, 2, 4, 6, 8, and...
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Figure 3: Normalized carbon peak area plotted as a function of a) curing time for the indicated pixel resolut...
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Figure 4: a) Normalized carbon peak area plotted as a function of dose for the beam energies shown. b) Monte ...
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Figure 5: a) Images of wire deposits with different initial thicknesses (wires 1–4) purified at 1 min interva...
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Figure 6: a) EDS measurements of the samples deposited and purified on the TEM membranes. TEM images of an b)...
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Figure 7: Selected area electron diffraction (SAED) patterns for O2 E-beam uncured (left) and cured (right) d...
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Figure 8: Bar graph comparing the simulated and experimental purification rates for varying beam parameters.
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- Full Research Paper
- Published 16 Feb 2015
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Figure 1: (a) Classification of proximal shapes (right hand side). The grey box indicates the intended deposi...
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Figure 2: (a) Radius of the outer halo (AFM-based) of 30 keV PtC deposits as a function of the central pad th...
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Figure 3: Representative AFM height image (a) of a 9 nm thick PtC deposit on Si–SiO2 fabricated at 25 keV tog...
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Figure 4: AFM height images with overlaid current information of PtC pads deposited on an conductive Au elect...
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Figure 5: (a) Functional classification of proximity deposition based on KFM measurements. (b) and (c) show t...
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Figure 6: Edge-broadening effect for 30 keV deposits of different thickness. (a) shows a normalized height re...
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Figure 7: Broadening effects for 5 keV deposits of different thickness. (b) shows the normalized height repre...
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Figure 8: Outer-halo behavior for increasing pad thicknesses of 5 keV deposits (squares) together with an FSE...
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Figure 9: (a) AFM height cross section of a 20 keV deposit. (b) cumulative BSE emission (blue, left axis) and...
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