Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films

Alexander Gaul,
Daniel Emmrich,
Timo Ueltzhöffer,
Henning Huckfeldt,
Hatice Doğanay,
Johanna Hackl,
Muhammad Imtiaz Khan,
Daniel M. Gottlob,
Gregor Hartmann,
André Beyer,
Dennis Holzinger,
Slavomír Nemšák,
Claus M. Schneider,
Armin Gölzhäuser,
Günter Reiss and
Arno Ehresmann

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Published 03 Dec 2018

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1. Figure 1: Phase contrast MFM images of engineered parallel-stripe domains. Magnetic domains with antiparallel...
  
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2. Figure 2: XMCD signal images of engineered parallel domain stripes. Magnetic domains with antiparallel magnet...
  
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3. Figure 3: Phase contrast MFM signal of domains with stepwise decreased nominal widths and hh and tt magnetiza...
  
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4. Figure 4: Two-dimensional engineered magnetic domain patterns. (a–d) Phase contrast MFM images in 80 nm heigh...
  
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5. Figure 5: Simulated distribution of the energy transfer by ionization per ion. The positions of layer borders...
  
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6. Figure 6: Definition of . is the angle between the domain wall (DW) normal vector and the local unidirectio...
  
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Beilstein J. Nanotechnol. 2018, 9, 2968–2979, doi:10.3762/bjnano.9.276

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Amplified cross-linking efficiency of self-assembled monolayers through targeted dissociative electron attachment for the production of carbon nanomembranes

Sascha Koch,
Christopher D. Kaiser,
Paul Penner,
Michael Barclay,
Lena Frommeyer,
Daniel Emmrich,
Patrick Stohmann,
Tarek Abu-Husein,
Andreas Terfort,
D. Howard Fairbrother,
Oddur Ingólfsson and
Armin Gölzhäuser

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Published 30 Nov 2017

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1. Figure 1: Negative halogen ion yield curves for dissociative electron attachment to 2′-chloro-1,1′-biphenyl (...
  
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2. Figure 2: XP spectra of the Cl 2p, Br 3p doublets and the I 3d_5/2 peak regions of SAMs made of 2-Cl-BPT 2-Br-...
  
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3. Figure 3: (a) Raw XP spectra of the S 2p region of SAMs made from BPT, 2-Cl-BPT 2-Br-BPT and 2-I-BPT before a...
  
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4. Figure 4: Helium ion microscope (HIM) image of a transferred carbon nanomembrane (CNM) made using 3 min (1.8 ...
  
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Beilstein J. Nanotechnol. 2017, 8, 2562–2571, doi:10.3762/bjnano.8.256

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Fundamental properties of high-quality carbon nanofoam: from low to high density

Natalie Frese,
Shelby Taylor Mitchell,
Christof Neumann,
Amanda Bowers,
Armin Gölzhäuser and
Klaus Sattler

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Published 27 Dec 2016

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1. Figure 1: Helium-ion microscopy (HIM) images of low-density (a,b) and high-density (c,d) carbon nanofoams, wi...
  
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2. Figure 2: Raman spectra in the 900–2000 cm⁻¹ range, for low- and high-density carbon nanofoams.
  
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3. Figure 3: XPS spectra of low-density (a,b) and high-density (c,d) carbon nanofoams showing the C1s (a,c) and ...
  
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Beilstein J. Nanotechnol. 2016, 7, 2065–2073, doi:10.3762/bjnano.7.197

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Efficient electron-induced removal of oxalate ions and formation of copper nanoparticles from copper(II) oxalate precursor layers

Kai Rückriem,
Sarah Grotheer,
Henning Vieker,
Paul Penner,
André Beyer,
Armin Gölzhäuser and
Petra Swiderek

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Published 13 Jun 2016

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1. Figure 1: (a) Representative RAIR spectra of surface-grown copper(II) oxalate prepared by the indicated numbe...
  
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2. Figure 2: (a) RAIR spectra recorded before and after irradiation with the indicated electron exposures at 500...
  
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3. Figure 3: Intensity of the asymmetric CO₂ deformation band at 830 cm⁻¹ after increasing electron exposures at...
  
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4. Figure 4: HIM images of samples after different steps of preparation and electron exposure. (a) Au substrate ...
  
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5. Figure 5: Size distribution of nanoparticles formed from surface-grown copper(II) oxalate after an electron e...
  
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6. Figure 6: HIM images of samples after different steps of preparation and electron exposure. (a) Au substrate ...
  
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7. Figure 7: XP survey spectra recorded (a) before and (b) after an electron exposure of 16000 μC/cm² at 50 eV o...
  
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8. Figure 8: XP spectra in the ranges Cu 2p, O 1s, and C 1s recorded before (pristine) and after (irradiated) an...
  
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9. Scheme 1: Proposed mechanism for the electron-induced decomposition of the oxalate ion.
  
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Beilstein J. Nanotechnol. 2016, 7, 852–861, doi:10.3762/bjnano.7.77

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Focused particle beam-induced processing

Michael Huth and
Armin Gölzhäuser

Editorial
Published 09 Sep 2015

Beilstein J. Nanotechnol. 2015, 6, 1883–1885, doi:10.3762/bjnano.6.191

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Imaging of carbon nanomembranes with helium ion microscopy

André Beyer,
Henning Vieker,
Robin Klett,
Hanno Meyer zu Theenhausen,
Polina Angelova and
Armin Gölzhäuser

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Published 12 Aug 2015

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1. Figure 1: (a, b) HIM images of freestanding CNMs on TEM grids, illustrating the importance of the background....
  
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2. Figure 2: Examples of CNMs which were transferred onto copper grids with hexagonal openings. Different types ...
  
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3. Figure 3: Examples of large freestanding CNMs. (a, b) Three intact CNMs are imaged at different magnification...
  
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4. Figure 4: CNMs transferred on (a,b) bare copper TEM grids and (c,d) on grids with carbon films with regular o...
  
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5. Figure 5: CNM on a gold grid. The same spot was imaged with different beam currents but under otherwise ident...
  
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6. Figure 6: The same CNM is imaged (a) without and (b) with charge compensation. Detailed information on all HI...
  
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Beilstein J. Nanotechnol. 2015, 6, 1712–1720, doi:10.3762/bjnano.6.175

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Fabrication of carbon nanomembranes by helium ion beam lithography

Xianghui Zhang,
Henning Vieker,
André Beyer and
Armin Gölzhäuser

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Published 21 Feb 2014

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1. Figure 1: (a–d) A schematic representation of the NBPT SAM cross-linked with He⁺ ions and the transfer onto a...
  
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2. Figure 2: Freestanding CNMs with a dimension of 50 × 50 µm² supported by a TEM grid with a holey carbon film:...
  
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3. Figure 3: A series of HIM images showing the cross-linking of a NBPT SAM induced by helium ion irradiation, w...
  
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4. Figure 4: Percentage of the cross-linked area plotted as a function of the irradiation dose: (1) no CNM forms...
  
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Beilstein J. Nanotechnol. 2014, 5, 188–194, doi:10.3762/bjnano.5.20

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Mechanical characterization of carbon nanomembranes from self-assembled monolayers

Xianghui Zhang,
André Beyer and
Armin Gölzhäuser

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Published 20 Dec 2011

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1. Figure 1: (a) Schematic diagram of a bulge test in AFM; (b) Schematic of a biphenylthiol CNM on a window-stru...
  
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2. Figure 2: (a) Schematic of the central-point method in the bulge test; (b) Comparison of the line-scanning an...
  
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3. Figure 3: (a) Pressure–deflection relationship of an NBPT CNM with three successive loading and unloading cyc...
  
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4. Figure 4: (a) Stress–strain relationship of three loading–unloading measurements on a NBPT CNM with different...
  
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5. Figure 5: (a) Creep rate as a function of tensile strain; creep deformation can be only observed above a cert...
  
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6. Figure 6: (a) Histogram of ultimate tensile strength of circular NBPT CNMs, with a peak at ~567 MPa (Gaussian...
  
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Beilstein J. Nanotechnol. 2011, 2, 826–833, doi:10.3762/bjnano.2.92

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