5 article(s) from Giessibl, Franz J

Determining amplitude and tilt of a lateral force microscopy sensor

  1. Oliver Gretz,
  2. Alfred J. Weymouth,
  3. Thomas Holzmann,
  4. Korbinian P├╝rckhauer and
  5. Franz J. Giessibl
  • Full Research Paper
  • Published 01 Jun 2021

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

Ion mobility and material transport on KBr in air as a function of the relative humidity

  1. Dominik J. Kirpal,
  2. Korbinian P├╝rckhauer,
  3. Alfred J. Weymouth and
  4. Franz J. Giessibl
  • Full Research Paper
  • Published 30 Oct 2019

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

  1. Florian Pielmeier,
  2. Daniel Meuer,
  3. Daniel Schmid,
  4. Christoph Strunk and
  5. Franz J. Giessibl
  • Letter
  • Published 04 Apr 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

  • Full Research Paper
  • Published 14 Mar 2012

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

  1. Maximilian Schneiderbauer,
  2. Daniel Wastl and
  3. Franz J. Giessibl
  • Letter
  • Published 29 Feb 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

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