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3 article(s) from Grutter, Peter

afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy

Nicholas J. Sullivan,
Julio J. Valdés,
Kirk H. Bevan and
Peter Grutter

Beilstein J. Nanotechnol. 2026, 17, 653–667, doi:10.3762/bjnano.17.45

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Figure 1: (a) Script-free experiment running, where a user interacts with the SPM controller directly, sendin...

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Figure 2: Sample script delineating various aspects of a script. Here, we see that for the set of instruction...

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Figure 3: (a) Today, SPM scripts are usually written using manufacturer-specific software interfaces, requiri...

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Figure 4: System diagrams of the various scripting interfaces types (a–c) and how microscope translators can ...

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Figure 5: Pseudocode (a) and system diagram (b) for an experiment script talking to a translator without a co...

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Figure 6: Pseudocode (a) and configuration file (b) for an experiment with system diagram matching Figure 5 using a c...

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Figure 7: Pseudocode (a, b), configuration file (c), and system diagram (d) for an experiment involving two d...

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Figure 8: Mediation logic state machine. Here, we transition from the default “No Problem, No Control” state ...

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Figure 9: System diagrams of the translators for various integtrated microscope controllers: (a) SPECS Nanoni...

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Figure 10: Drift offset x_tot tracked over time during the experiment (i.e., online) with drift correction enab...

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Figure 11: Sample scans collected over the duration of the experiment, at (a) 0 h, (b) 5 h, (c) 10 h, and (d) ...

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Full Research Paper

Published 18 May 2026

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Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Aaron Mascaro,
Yoichi Miyahara,
Tyler Enright,
Omur E. Dagdeviren and
Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

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Figure 1: Illustration of ionic transport measurements in the time domain. (a) A conducting AFM tip is brough...

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Figure 2: (a) AFM frequency shift response to stretched-exponential voltage pulses (from 0 to 5 V) with and w...

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Figure 3: (a) Schematic illustration of the voltage-pulse averaging EFM technique: the top shows the applied ...

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Figure 4: Measured tip–sample force as a function of the distance for a gold-coated tip over a grounded gold ...

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Figure 5: “(a) Schematic of the experimental setup: (i) Computer requests a trigger at a defined phase of the...

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Figure 6: Extracted FF-trEFM signals from numerical simulations of tip–sample interactions with a stretched-e...

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Figure 7: “(a) Calibration curve for a range of characteristic times of exponential decay (τ) (inset shows a ...

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Figure 8: “For three representative pulse times, we plot (A) cantilever amplitude; (B) cantilever drive volta...

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Figure 9: “Experiments and simulations demonstrating subcycle time resolution in pk-EFM. (A) Subcycle voltage...

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Figure 10: Synthetic data of cantilever deflection spectrum around the fundamental resonance frequency, ω₀ =2π...

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Figure 11: “Results from simulations and from the experimental validation for the proposed excitation schemes:...

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Review

Published 01 Mar 2019

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Improved atomic force microscopy cantilever performance by partial reflective coating

Zeno Schumacher,
Yoichi Miyahara,
Laure Aeschimann and
Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

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Figure 1: Q-factor of NCLR cantilever with different coating coverage percentages. A 30 nm Al coating was add...

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Figure 2: Noise spectra for soft cantilever with different coating coverage acquired in air. Fully coated can...

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Figure 3: (a) Force noise density spectra for the soft cantilevers obtained from Figure 2 by multiplying with the mea...

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Figure 4: Force–distance curves for an uncoated (red), partial coated (blue) and fully coated soft cantilever...

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Figure 5: Calculation of the change of Q-factor for a fully coated NCLR cantilever with different coating thi...

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Full Research Paper

Published 03 Jul 2015

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