2 article(s) from Riel, Heike
Scanning thermal measurements of the InAs nanowire. (a) Setup for SThM measurements. (b) Topography...
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Surface potential measurements of the InAs nanowire. (a) Setup for KFM measurements. (b) Topography...
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Electrical characteristics extracted from KFM measurements. (a) Two-terminal I–V characteristics of...
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Temperature profiles along the nanowire simulated from its electrical characteristics. The nanowire...
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Beilstein J. Nanotechnol. 2018, 9, 129–136, doi:10.3762/bjnano.9.15
Contributions of apex, cone, and cantilever to the first (AM, left) and second (FM, right) order ca...
a) Sideband amplitude (blue) and phase (red) relative to the carrier oscillation measured during a ...
In-phase (red) and quadrature (blue) sideband amplitudes, normalised to the carrier oscillation amp...
Modulation indices of the sidebands at ωm (a) and 2ωm (b) against for different modulation amplitu...
Block diagram of a Kelvin controller based on a) a proportional–integral–differential (PID) control...
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Closed-loop response of the Kelvin observer (black) and a proportional-integral controller (red) to...
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Normalised closed-loop bandwidth (−3 dB) of the steady-state Kelvin observer as a function of the n...
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Schematic of the modified KFM setup. For topography feedback, the cantilever is excited at a consta...
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a) Topography, b) tip–sample capacitance gradient, C'', and c) local contact potential difference, U...
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a), b) Kelvin and c), d) error signal of an InAs nanowire similar to the device shown in Figure 9, measured...
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One-dimensional power spectral densities of the error signals in Figure 10c,d. Integral feedback works well a...
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Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225
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