2 article(s) from Riel, Heike

Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire

  1. Tino Wagner,
  2. Fabian Menges,
  3. Heike Riel,
  4. Bernd Gotsmann and
  5. Andreas Stemmer
  • Full Research Paper
  • Published 11 Jan 2018

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2018, 9, 129–136, doi:10.3762/bjnano.9.15

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  1. Tino Wagner,
  2. Hannes Beyer,
  3. Patrick Reissner,
  4. Philipp Mensch,
  5. Heike Riel,
  6. Bernd Gotsmann and
  7. Andreas Stemmer
  • Full Research Paper
  • Published 23 Nov 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

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