4 article(s) from Temmen, Matthias

Noise in NC-AFM measurements with significant tip–sample interaction

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Philipp Rahe and
  4. Michael Reichling
  • Full Research Paper
  • Published 01 Dec 2016

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

Understanding interferometry for micro-cantilever displacement detection

  1. Alexander von Schmidsfeld,
  2. Tobias Nörenberg,
  3. Matthias Temmen and
  4. Michael Reichling
  • Full Research Paper
  • Published 10 Jun 2016

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

Determining cantilever stiffness from thermal noise

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Philipp Rahe,
  4. Angelika Kühnle and
  5. Michael Reichling
  • Full Research Paper
  • Published 28 Mar 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Sebastian Rode,
  4. Philipp Rahe,
  5. Angelika Kühnle and
  6. Michael Reichling
  • Full Research Paper
  • Published 17 Jan 2013

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

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