Ultrathin water layers on mannosylated gold nanoparticles

• Maiara A. Iriarte Alonso,
• Jorge H. Melillo,
• Silvina Cerveny,
• Yujin Tong and
• Alexander M. Bittner

Beilstein J. Nanotechnol. 2025, 16, 2183–2198, doi:10.3762/bjnano.16.151

• light scattering, and infrared spectroscopy. We probed particles adsorbed on hydrophilic and hydrophobic surfaces with atomic force microscopy (AFM) and vibrational sum frequency generation (VSFG) spectroscopy, both operated under variable air humidity. For AFM, we additionally tested hydrophilic and

• hydrophobic tips. While VSFG indicated preferential hydration of the dimannoside and proved conformational changes in the organic ligands, AFM provided sub-nanometer changes in particle topography due to water adsorption. In general, the dimannoside nanoparticles condense ultrathin water layers upon humidity

• transmission of airborne viruses, such as influenza. Keywords: AFM; humidity; hydrophilicity; hydrophobicity; nanoparticles; sum frequency generation spectroscopy; viruses; water; wetting; Introduction Gold nanoparticles (AuNPs) have been a staple in biomedical and biophysical research [1][2] for almost a

Calibration of piezo actuators and systems by dynamic interferometry

• Knarik Khachatryan and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143

• oscillation amplitude calibration under conditions of various amounts of tube piezo contraction and extension. The merits and limits of accuracy for such type of calibration are discussed. Keywords: cantilever excitation; fiber interferometer; NC-AFM; piezo calibration; non-contact atomic force microscopy

• ; Introduction Interferometric displacement detection stands as a cornerstone in high-precision techniques employed in cantilever-based atomic force microscopy (AFM), since its early days [1][2][3][4][5][6]. This method of cantilever displacement detection is specifically well suited for non-contact atomic force

• microscopy (NC-AFM) operation in an ultrahigh-vacuum (UHV) environment at low temperature and has been developed tremendously over the last three decades [7][8][9][10][11][12]. In frequency-modulated NC-AFM, the cantilever is kept at oscillation with constant amplitude, yielding an interferometric signal

Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization

• Yanping Wei,
• Jiafeng Shen,
• Yirong Yao,
• Xuke Li,
• Ming Li and
• Peiling Ke

Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142

• Yanping Wei Jiafeng Shen Yirong Yao Xuke Li Ming Li Peiling Ke Public Technology Center, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China 10.3762/bjnano.16.142 Abstract This study introduces a multifrequency atomic force microscopy (AFM

• ) technique that synergistically integrates PeakForce tapping mode with higher eigenmode vibrations to achieve simultaneous high-resolution topographical imaging and to access additional contrast channels for distinguishing material regions or compositions. Unlike conventional multimodal AFM, our method

• . Keywords: atomic force microscopy (AFM); high eigenmodes; multifrequency AFM; nanoscale material analysis; surface characterization; Introduction Atomic force microscopy (AFM) has become an indispensable tool for characterizing the morphology and surface properties of materials at the micro- and the

Molecular and mechanical insights into gecko seta adhesion: multiscale simulations combining molecular dynamics and the finite element method

• Yash Jain,
• Saeed Norouzi,
• Tobias Materzok,
• Stanislav N. Gorb and
• Florian Müller-Plathe

Beilstein J. Nanotechnol. 2025, 16, 2055–2076, doi:10.3762/bjnano.16.141

• microscopy (AFM) experiments. Our investigation into how gecko keratin interacts with hydrophilic and hydrophobic substrates [12] supported the importance of the water-mediating effect [10] and elucidated mechanistic differences depending on surface chemistry. A particle-based mesoscale model of a single

• gecko spatula was then used to bridge molecular interactions and macroscopic adhesion behavior. This mesoscale model accurately simulated spatula detachment from various substrates and matched experimental pull-off forces observed in AFM studies and pull-off pressures from united atom simulations of

• protocol We aimed to replicate the protocol used in AFM experiments on gecko spatulae and setae as reported in [23][57]: (1) Initially, all spatulae were positioned at a minimum distance of 13 nm above the substrate, which is higher than the non-bonded interaction cutoff of 12 nm. (2) In the preloading

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• Contact resonance atomic force microscopy (CR-AFM) has been used in many studies to characterize variations in the elastic and viscoelastic constants of materials along a heterogeneous surface. In almost all experimental work, the quantitative modulus of the surface is calculated in reference to a known

• stiffness demonstrate that existing models cannot capture the physics of this problem. While concrete solutions to use analytical models to interpret CR-AFM data have not been found, a possible solution may include revisiting the analytical model to capture a potentially more complex system than the current

• ); mechanical property measurements; surface science; Introduction Atomic force microscopy (AFM) has become an indispensable tool for imaging the surface topography on a variety of surfaces [1]. Since the invention of the AFM [2], several other modes of AFM have been developed, including friction force

Evaluating metal-organic precursors for focused ion beam-induced deposition through solid-layer decomposition analysis

• Benedykt R. Jany,
• Katarzyna Madajska,
• Aleksandra Butrymowicz-Kubiak,
• Franciszek Krok and
• Iwona B. Szymańska

Beilstein J. Nanotechnol. 2025, 16, 1942–1951, doi:10.3762/bjnano.16.135

• the fabrication or modification of cantilevers in AFM and scanning optical near-field microscopy, and as plasmonic materials [15][16][17][18][19]. FEBID/FIBID techniques combine the advantages of direct-write lithographic processes, for example, high spatial resolution, site-specificity, no need for

Low-temperature AFM with a microwave cavity optomechanical transducer

• Ermes Scarano,
• Elisabet K. Arvidsson,
• August K. Roos,
• Erik Holmgren,
• Riccardo Borgani,
• Mats O. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

• /bjnano.16.130 Abstract We demonstrate atomic force microscopy (AFM) imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector responsivity and added

• force-sensor design is a significant improvement over piezoelectric force sensors commonly used in low-temperature AFM. We discuss the potential for further improvement of the sensor design to achieve optimal detection at the standard quantum limit. We demonstrate AFM operation with surface-tracking

• fulfills the specific requirements of the application. The latter is indeed the case for force sensing in atomic force microscopy (AFM). Force transduction at maximum sensitivity requires detecting the position of a “test mass”, while minimizing the added noise introduced by the detection itself [14][15

Self-assembly and adhesive properties of Pollicipes pollicipes barnacle cement protein cp19k: influence of pH and ionic strength

• Shrutika Sawant,
• Anne Marie Power and
• J. Gerard Wall

Beilstein J. Nanotechnol. 2025, 16, 1863–1872, doi:10.3762/bjnano.16.129

• observed before and after the pH switch, and no observable difference in adhesion was noted, suggesting that cp19k fibrils remain stable and retain their adhesion ability after the pH switch. To further correlate these observations with the natural life cycle of barnacle adhesion, more detailed AFM- or

Electrical, photocatalytic, and sensory properties of graphene oxide and polyimide implanted with low- and medium-energy silver ions

• Josef Novák,
• Eva Štěpanovská,
• Petr Malinský,
• Vlastimil Mazánek,
• Jan Luxa,
• Ulrich Kentsch and
• Zdeněk Sofer

Beilstein J. Nanotechnol. 2025, 16, 1794–1811, doi:10.3762/bjnano.16.123

• amorphization of the material and probably to the carbonization of the polyimide. Surface morphology studied by AFM Changes in the surface morphology of PI implanted with 20 keV and 1.5 MeV Ag ions at different fluences were examined by atomic force microscopy (AFM). The basic parameters arithmetic average

• reduction in roughness is observable at any ion fluence relative to the reference condition. The lowest roughness in this instance was achieved with an ion fluence of 3.75 × 1012 cm−2. One possible explanation for the change in surface roughness measured by AFM may be surface sputtering. When there is

• from the AFM readings. Implantation of 20 keV Ag ions showed a significant increase in roughness compared to implantation with 1.5 MeV Ag ions. The degradation rate constant was also increased in the case of PI implantation (Figure 11), but the increase is not as significant as in the case of GO. The

Prospects of nanotechnology and natural products for cancer and immunotherapy

• Jan Filipe Andrade Santos,
• Marcela Bernardes Brasileiro,
• Pamela Danielle Cavalcante Barreto,
• Ligiane Aranha Rocha and
• José Adão Carvalho Nascimento Júnior

Beilstein J. Nanotechnol. 2025, 16, 1644–1667, doi:10.3762/bjnano.16.116

• aptamer, sorafenib, and ursolic acid as an API at 4 mg·mL−1 in methanol. Physicochemical tests showed that the nanoparticles have a spherical shape, confirmed by atomic force microscopy (AFM), and are stable in ultrapure water and Dulbecco’s modified eagle medium (DMEM) with 10% FBS. Procedures to

Venom-loaded cationic-functionalized poly(lactic acid) nanoparticles for serum production against Tityus serrulatus scorpion

• Philippe de Castro Mesquita,
• Karla Samara Rocha Soares,
• Manoela Torres-Rêgo,
• Emanuell dos Santos-Silva,
• Mariana Farias Alves-Silva,
• Alianda Maira Cornélio,
• Matheus de Freitas Fernandes-Pedrosa and
• Arnóbio Antônio da Silva-Júnior

Beilstein J. Nanotechnol. 2025, 16, 1633–1643, doi:10.3762/bjnano.16.115

• corroborates the high encapsulation efficiency obtained by the BCA assay. Field emission gun scanning electron microscopy and atomic force microscopy analyses Field emission gun scanning electron microscopy (FEGSEM) and atomic force microscopy (AFM) analyses were realized to access shape and surface features

• cationic nanoparticles prepared by ionic gelation with 100% encapsulation efficiency [1][2]. Additionally, PEI with high branching density has been shown to enhance complexation and transfection efficiency [23]. The morphology obtained by AFM and FEGSEM showed particles with a smooth surface, spherical

• data expressed as mean ± standard deviation. The shape and surface of nanoparticles were assessed by AFM (SPM-9700 Shimadzu, Tokyo, Japan) and FEGSEM (Zeiss Microscopy, Auriga, Jena, Germany) images. For the AFM analyzes, a drop of dispersion was placed on a clean microscope slide and dried under a

Laser processing in liquids: insights into nanocolloid generation and thin film integration for energy, photonic, and sensing applications

• Akshana Parameswaran Sreekala,
• Pooja Raveendran Nair,
• Jithin Kundalam Kadavath,
• Bindu Krishnan,
• David Avellaneda Avellaneda,
• M. R. Anantharaman and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 1428–1498, doi:10.3762/bjnano.16.104

• photodetectors, and the film surface coverage was improved by multiple layer depositions and condensation of colloidal suspension. Irregular particle shapes and sizes were visible in 3D atomic force microscopy (AFM) images with sizes ranging between 60 and 80 nm. The NPs agglomerated to form submicroparticles

• , which were clusters of many individual In2O3 NPs. A discrepancy was observed between the grain size measurements from XRD and AFM. This discrepancy arises because AFM directly visualizes the grains but does not account for structural defects, while XRD measurement determines the size of the defect-free

• morphological features [118][119]. A 3D AFM image of ZnO NPs drop-cast on a glass substrate is shown in Figure 11b, revealing the surface morphology. Their photodetection and photovoltaic properties are discussed in the later sections of this review. Research articles provide limited information on the

Automated collection and categorisation of STM images and STS spectra with and without machine learning

• Dylan Stewart Barker and
• Adam Sweetman

Beilstein J. Nanotechnol. 2025, 16, 1367–1379, doi:10.3762/bjnano.16.99

• number of STS measurements can be obtained over various molecules automatically with optimised tips and the quality of the spectra and image assessed automatically. Methods Experimental details We used a third-generation commercial low-temperature (LT) STM NC-AFM instrument (Scienta Omicron GmbH), which

Ferroptosis induction by engineered liposomes for enhanced tumor therapy

• Alireza Ghasempour,
• Mohammad Amin Tokallou,
• Mohammad Reza Naderi Allaf,
• Mohsen Moradi,
• Hamideh Dehghan,
• Mahsa Sedighi,
• Mohammad-Ali Shahbazi and
• Fahimeh Lavi Arab

Beilstein J. Nanotechnol. 2025, 16, 1325–1349, doi:10.3762/bjnano.16.97

• light scattering (DLS) is commonly used to determine liposome size and size distribution. Transmission electron microscopy (TEM) and atomic force microscopy (AFM) can be used to image liposome morphology and determine lamellarity. Zeta potential measurements assess the surface charge of liposomes, which

• ]. Different techniques are used to evaluate the characteristics of liposomes [122][123][124]. In the case of average particle size, DLS and microscopy techniques such as scanning electron microscopy (SEM), TEM, cryogenic TEM, and AFM are used to determine the size of liposomes [122]. The size of liposomes is

Mechanical stability of individual bacterial cells under different osmotic pressure conditions: a nanoindentation study of Pseudomonas aeruginosa

• Lizeth García-Torres,
• Idania De Alba Montero,
• Eleazar Samuel Kolosovas-Machuca,
• Facundo Ruiz,
• Sumati Bhatia,
• Jose Luis Cuellar Camacho and
• Jaime Ruiz-García

Beilstein J. Nanotechnol. 2025, 16, 1171–1183, doi:10.3762/bjnano.16.86

• within the first stages of nanoindentation, similar values in the slopes of the curves reflected a stable stiffness of about kB = 20 mN/m and turgor pressures of Pt = 12.1 kPa. Interestingly, a change in the nonlinear regime of the force curves and a gradual increase in maximal deformation by the AFM tip

• provided Young’s moduli in the range of 0.7–1.1 kPa. Implications of the presented results with previously reported data in the literature are discussed. Keywords: AFM; force spectroscopy; membrane rigidity; nanomechanical mapping; osmotic shock; Introduction Pseudomonas aeruginosa (PA) is a Gram

• specific molecular agents is critical in generating strategies to control their undesired propagation. Atomic force microscopy (AFM) is a powerful, sensitive technique that scans the surface topography of a sample with an ultra-sharp tip while monitoring the interaction forces between this tip and the

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• deep learning models to improve resolution and quality of low-resolution AFM images made under standard ambient scanning. Both traditional methods and deep learning models were benchmarked and quantified regarding fidelity, quality, and a survey taken by AFM experts. The deep learning models outperform

• the traditional methods and yield better results. Additionally, some common AFM artifacts, such as streaking, are present in the ground truth high-resolution images. These artifacts are partially attenuated by the traditional methods but are completely eliminated by the deep learning models. This work

• shows deep learning models to be superior for super-resolution tasks and enables significant reduction in AFM measurement time, whereby low-pixel-resolution AFM images are enhanced in both resolution and fidelity through deep learning. Keywords: atomic force microscopy; deep learning; fast scanning

Single-layer graphene oxide film grown on α-Al₂O₃(0001) for use as an adsorbent

• Shiro Entani,
• Mitsunori Honda,
• Masaru Takizawa and
• Makoto Kohda

Beilstein J. Nanotechnol. 2025, 16, 1082–1087, doi:10.3762/bjnano.16.79

• Figure 1 shows an atomic force microscopy (AFM) image of SLG and SLGO on α-Al2O3(0001) substrates. The as-grown SLG film has an atomically flat surface and wrinkles with its height less than 0.4 nm [18]. The single layer of graphene was confirmed through X-ray photoelectron spectroscopy (XPS) peak

• was removed from the SLGO surface by water rinsing and then the Cs-adsorbed SLGO specimen was introduced in the XPS chamber kept at ultra-high vacuum. The surface morphology of SLGO was examined using atomic force microscopy (AFM, SII SAP300). AFM images of (a) SLG/α-Al2O3(0001) and (b) SLGO/α-Al2O3

Soft materials nanoarchitectonics: liquid crystals, polymers, gels, biomaterials, and others

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2025, 16, 1025–1067, doi:10.3762/bjnano.16.77

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• processes and warrants further investigation. Scanning probe microscopy (SPM) methods, such as atomic force microscopy (AFM), have been employed to image mitochondria in liquid, showing features of both the inner and outer membrane [22][23][24]. However, AFM measurements are influenced by the cantilever

• thus preventing the intermittency effect. A convolution effect, similar to the tip–sample convolution known from AFM, cannot account for the observed intermittency effect. The nanopipette tip exhibits an extremely high aspect ratio, in contrast to conventional AFM cantilever tips. A surface feature to

• characterised using a AFM, see Supporting Information File 1, Section S7, Figure S19. The bioinert and hydrophilic polymer surface exhibited height variations up to 3 nm. Scanning ion conductance microscopy Mitochondria were examined using a SICM, a SPM technique employing an ion current through a nanopipette

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• Bob Kyeyune Philipp Rahe Michael Reichling Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany 10.3762/bjnano.16.72 Abstract We investigate the impact of tip changes on atomic-scale non-contact atomic force microscopy (NC-AFM) contrast formation when imaging a

• . Keywords: atomic resolution imaging; calcium fluoride surface; interaction force; non-contact atomic force microscopy (NC-AFM); tip change; Introduction Non-contact atomic force microscopy (NC-AFM) [1] is a surface science tool that has been used to atomically resolve surfaces of semiconductor and

• insulator materials in real space with unprecedented spatial resolution [2][3][4][5][6]. Besides high-resolution imaging of molecular structures [7], NC-AFM has demonstrated its ability to identify sublattices of atomic surfaces [8][9][10]. In these studies, the knowledge of the tip’s atomic structure plays

Focused ion beam-induced platinum deposition with a low-temperature cesium ion source

• Thomas Henning Loeber,
• Bert Laegel,
• Meltem Sezen,
• Feray Bakan Misirlioglu,
• Edgar J. D. Vredenbregt and
• Yang Li

Beilstein J. Nanotechnol. 2025, 16, 910–920, doi:10.3762/bjnano.16.69

• magnetic or superconductive structures can be created [1][2][3][4]. Also, specific mechanical structures on atomic force microscopy (AFM) cantilevers can be made [5][6]. In the literature, four mechanisms are used to explain the complex process of focused ion beam-induced deposition (FIBID) [5][7]; the

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• , Urbach energy, and optical bandgap. The low reflectance values of implanted films assure their suitability as transparent windows and anti-reflective coating in various optoelectronic devices. Keywords: AFM; diffuse reflectance; GXRD; polycrystalline; ZnO films; Introduction Zinc oxide has emerged as a

• using a WITec alpha300 RA Raman spectrometer under excitation with a 532 nm solid-state diode laser operated at 10 mW. The topography of the films is examined using atomic force microscopy (AFM) with a Bruker Multimode 8 instrument. The surface morphology of pristine and implanted films is further

• surface morphology of pristine and 30 keV Ar+ ion-implanted ZnO films is studied using AFM. Figure 7 represents 2D and 3D AFM images at the scale 2 µm × 2 µm of the pristine film (Figure 7a) and films implanted at four different fluences, viz. 1 × 1015 (Figure 7b), 5 × 1015 (Figure 7c), 1 × 1016 (Figure

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• Cl and Cr core levels at room temperature (RT). By monitoring the core levels and valence band spectra at various spatial resolutions (≥0.13 μm), we obtained quantitative maps of the chemical composition to correlate these maps with the thicknesses measured by AFM. Additionally, we investigated the

• correlation between the microscopic results and the surface potential of CrCl3 flakes at the nanoscale level using Kelvin probe force microscopy (KPFM) [28]. KPFM is mainly employed to measure the local contact potential difference between the conductive AFM tip and the sample, allowing for high-resolution

• mapping of the work function and surface atomic states [29]. This technique establishes a correlation between the valence band photoemission data and the morphological information, offering insights into the position of the conduction band [30]. Results and Discussion Optical contrast and AFM It is well

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• suitable substrates for characterization by scanning probe microscopy and SPEM. An atomic force microscopy (AFM) image of a typical InP p–n junction nanowire is shown in Figure 2a, confirming a homogeneous shape with a nanowire length of about 2.5 µm and a diameter of about 200 nm, fluctuating only by a

• . Titov, “Morphology and composition of nanoinclusions in (Fe, Ni)0.25TiSe2“, article no. 115821, Copyright (2022), with permission from Elsevier. This content is not subject to CC BY 4.0. Surface characterization of InP p–n junction nanowires: a) sketched structure (top), AFM image (middle), and

High-temperature epitaxial growth of tantalum nitride thin films on MgO: structural evolution and potential for SQUID applications

• Michelle Cedillo Rosillo,
• Oscar Contreras López,
• Jesús Antonio Díaz,
• Agustín Conde Gallardo and
• Harvi A. Castillo Cuero

Beilstein J. Nanotechnol. 2025, 16, 690–699, doi:10.3762/bjnano.16.53

• . Atomic force microscopy (AFM, XE-70 Park Systems) in contact mode was used to study the surface morphology of the films. The synthesis protocol used in this study was modified from the work reported by Quintanar-Zamora et al. [15] by varying the substrate temperature and the nitrogen pressure. Results

• makes this film an excellent candidate for superconducting applications, particularly in devices such as superconducting quantum interference devices (SQUIDs). Figure 7 presents an AFM image revealing the low surface roughness (2.2 nm) of even the film deposited at an elevated growth temperature of 850

• potential of thin TaN films for integration into advanced superconducting applications. AFM analysis confirmed the smooth surface morphology of the films, suggesting that the deposition parameters significantly influence both the structural and superconducting properties of the TaN thin films, but not the