Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

• Aaron Kobler and
• Christian Kübel

Beilstein J. Nanotechnol. 2018, 9, 602–607, doi:10.3762/bjnano.9.56

• . Keywords: ACOM-TEM; 3D reconstruction; in situ testing; quantitative crystallographic analysis; STEM; Findings For the study of nanostructured material with feature sizes <100 nm, transmission electron microscopy (TEM) is the method of choice due to its high spatial resolution [1][2][3][4]. Even though

• combination with template matching for the creation of crystal orientation maps, mostly referred to as automated crystal orientation mapping transmission electron microscopy (ACOM-TEM), has become the most prominent method [22][23][27][28][29][30][31][32]. The template matching, which cross-correlates the

• experimental diffraction pattern with a database of simulated diffraction patterns covering all crystal orientations and phases for the investigated material, is a fast and robust evaluation routine. Moreover, ACOM-TEM is a quantitative method with respect to sample parameters like grain size, twin density

In situ observation of deformation processes in nanocrystalline face-centered cubic metals

• Aaron Kobler,
• Christian Brandl,
• Horst Hahn and
• Christian Kübel

Beilstein J. Nanotechnol. 2016, 7, 572–580, doi:10.3762/bjnano.7.50

• behavior for different alloy compositions [28][48]. In situ XRD studies also showed evidence on the concentration-dependent deformation behavior in the Pd–Au alloy [49]. Despite the good grain statistics of ACOM-TEM in comparison to HRTEM, synchrotron-based in situ XRD studies offer better temporal

• resolution in comparison to ACOM-TEM with far better grain statistics. Both good statistics and temporal resolution are necessary to reveal small differences in the deformation mechanism with the alloy content. With ACOM-TEM, the multiple concurrent mechanisms in all alloy systems are apparent. The twin

Deformation-induced grain growth and twinning in nanocrystalline palladium thin films

• Aaron Kobler,
• Jochen Lohmiller,
• Jonathan Schäfer,
• Michael Kerber,
• Anna Castrup,
• Ankush Kashiwar,
• Patric A. Gruber,
• Karsten Albe,
• Horst Hahn and
• Christian Kübel

Beilstein J. Nanotechnol. 2013, 4, 554–566, doi:10.3762/bjnano.4.64

• density was found during straining. On the other hand, starting from a higher twin density, the twins were depleted with increasing strain. The findings from ACOM-TEM were confirmed by results from molecular dynamics (MD) simulations and from conventional and in-situ synchrotron X-ray diffraction (CXRD

• , SXRD) experiments. Keywords: ACOM-TEM; deformation mechanism; nanostructured metals; tensile testing; XRD; Introduction Nanocrystalline (nc) metals and alloys exhibit different mechanical behavior compared to their coarse-grained counterparts [1]. They show extraordinary strength but often lack

• active in ncPd films deposited by magnetron sputtering onto compliant substrates. The microstructural analysis is mainly performed by quantitative automated crystal orientation mapping TEM (ACOM-TEM) [23][24] and supplemented with grain size measurement using dark-field TEM (DF-TEM) and conventional X