Ultrathin water layers on mannosylated gold nanoparticles

• Maiara A. Iriarte Alonso,
• Jorge H. Melillo,
• Silvina Cerveny,
• Yujin Tong and
• Alexander M. Bittner

Beilstein J. Nanotechnol. 2025, 16, 2183–2198, doi:10.3762/bjnano.16.151

• light scattering, and infrared spectroscopy. We probed particles adsorbed on hydrophilic and hydrophobic surfaces with atomic force microscopy (AFM) and vibrational sum frequency generation (VSFG) spectroscopy, both operated under variable air humidity. For AFM, we additionally tested hydrophilic and

• inorganic surfaces, usually modified with organic layers, and probed by Fourier-transform infrared spectroscopy (FTIR), vibrational sum frequency generation (VSFG), and atomic force microscopy (AFM). For VSFG and AFM, we systematically varied the relative air humidity (RH). DLS and ZP yield particle size

Calibration of piezo actuators and systems by dynamic interferometry

• Knarik Khachatryan and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143

• ; Introduction Interferometric displacement detection stands as a cornerstone in high-precision techniques employed in cantilever-based atomic force microscopy (AFM), since its early days [1][2][3][4][5][6]. This method of cantilever displacement detection is specifically well suited for non-contact atomic force

Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization

• Yanping Wei,
• Jiafeng Shen,
• Yirong Yao,
• Xuke Li,
• Ming Li and
• Peiling Ke

Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142

• Yanping Wei Jiafeng Shen Yirong Yao Xuke Li Ming Li Peiling Ke Public Technology Center, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China 10.3762/bjnano.16.142 Abstract This study introduces a multifrequency atomic force microscopy (AFM

• . Keywords: atomic force microscopy (AFM); high eigenmodes; multifrequency AFM; nanoscale material analysis; surface characterization; Introduction Atomic force microscopy (AFM) has become an indispensable tool for characterizing the morphology and surface properties of materials at the micro- and the

Molecular and mechanical insights into gecko seta adhesion: multiscale simulations combining molecular dynamics and the finite element method

• Yash Jain,
• Saeed Norouzi,
• Tobias Materzok,
• Stanislav N. Gorb and
• Florian Müller-Plathe

Beilstein J. Nanotechnol. 2025, 16, 2055–2076, doi:10.3762/bjnano.16.141

• scales involved. In previous research, we used molecular dynamics simulations to explore various aspects of gecko adhesion [10][11][12][13]. We found that humidity increases the force required to pull a spatula off from a substrate [10][12], a phenomenon also observed in high-humidity atomic force

• microscopy (AFM) experiments. Our investigation into how gecko keratin interacts with hydrophilic and hydrophobic substrates [12] supported the importance of the water-mediating effect [10] and elucidated mechanistic differences depending on surface chemistry. A particle-based mesoscale model of a single

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• ); mechanical property measurements; surface science; Introduction Atomic force microscopy (AFM) has become an indispensable tool for imaging the surface topography on a variety of surfaces [1]. Since the invention of the AFM [2], several other modes of AFM have been developed, including friction force

Low-temperature AFM with a microwave cavity optomechanical transducer

• Ermes Scarano,
• Elisabet K. Arvidsson,
• August K. Roos,
• Erik Holmgren,
• Riccardo Borgani,
• Mats O. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

• /bjnano.16.130 Abstract We demonstrate atomic force microscopy (AFM) imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector responsivity and added

• fulfills the specific requirements of the application. The latter is indeed the case for force sensing in atomic force microscopy (AFM). Force transduction at maximum sensitivity requires detecting the position of a “test mass”, while minimizing the added noise introduced by the detection itself [14][15

Electrical, photocatalytic, and sensory properties of graphene oxide and polyimide implanted with low- and medium-energy silver ions

• Josef Novák,
• Eva Štěpanovská,
• Petr Malinský,
• Vlastimil Mazánek,
• Jan Luxa,
• Ulrich Kentsch and
• Zdeněk Sofer

Beilstein J. Nanotechnol. 2025, 16, 1794–1811, doi:10.3762/bjnano.16.123

• amorphization of the material and probably to the carbonization of the polyimide. Surface morphology studied by AFM Changes in the surface morphology of PI implanted with 20 keV and 1.5 MeV Ag ions at different fluences were examined by atomic force microscopy (AFM). The basic parameters arithmetic average

Prospects of nanotechnology and natural products for cancer and immunotherapy

• Jan Filipe Andrade Santos,
• Marcela Bernardes Brasileiro,
• Pamela Danielle Cavalcante Barreto,
• Ligiane Aranha Rocha and
• José Adão Carvalho Nascimento Júnior

Beilstein J. Nanotechnol. 2025, 16, 1644–1667, doi:10.3762/bjnano.16.116

• aptamer, sorafenib, and ursolic acid as an API at 4 mg·mL−1 in methanol. Physicochemical tests showed that the nanoparticles have a spherical shape, confirmed by atomic force microscopy (AFM), and are stable in ultrapure water and Dulbecco’s modified eagle medium (DMEM) with 10% FBS. Procedures to

Venom-loaded cationic-functionalized poly(lactic acid) nanoparticles for serum production against Tityus serrulatus scorpion

• Philippe de Castro Mesquita,
• Karla Samara Rocha Soares,
• Manoela Torres-Rêgo,
• Emanuell dos Santos-Silva,
• Mariana Farias Alves-Silva,
• Alianda Maira Cornélio,
• Matheus de Freitas Fernandes-Pedrosa and
• Arnóbio Antônio da Silva-Júnior

Beilstein J. Nanotechnol. 2025, 16, 1633–1643, doi:10.3762/bjnano.16.115

• corroborates the high encapsulation efficiency obtained by the BCA assay. Field emission gun scanning electron microscopy and atomic force microscopy analyses Field emission gun scanning electron microscopy (FEGSEM) and atomic force microscopy (AFM) analyses were realized to access shape and surface features

Laser processing in liquids: insights into nanocolloid generation and thin film integration for energy, photonic, and sensing applications

• Akshana Parameswaran Sreekala,
• Pooja Raveendran Nair,
• Jithin Kundalam Kadavath,
• Bindu Krishnan,
• David Avellaneda Avellaneda,
• M. R. Anantharaman and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 1428–1498, doi:10.3762/bjnano.16.104

• photodetectors, and the film surface coverage was improved by multiple layer depositions and condensation of colloidal suspension. Irregular particle shapes and sizes were visible in 3D atomic force microscopy (AFM) images with sizes ranging between 60 and 80 nm. The NPs agglomerated to form submicroparticles

Ferroptosis induction by engineered liposomes for enhanced tumor therapy

• Alireza Ghasempour,
• Mohammad Amin Tokallou,
• Mohammad Reza Naderi Allaf,
• Mohsen Moradi,
• Hamideh Dehghan,
• Mahsa Sedighi,
• Mohammad-Ali Shahbazi and
• Fahimeh Lavi Arab

Beilstein J. Nanotechnol. 2025, 16, 1325–1349, doi:10.3762/bjnano.16.97

• light scattering (DLS) is commonly used to determine liposome size and size distribution. Transmission electron microscopy (TEM) and atomic force microscopy (AFM) can be used to image liposome morphology and determine lamellarity. Zeta potential measurements assess the surface charge of liposomes, which

Mechanical stability of individual bacterial cells under different osmotic pressure conditions: a nanoindentation study of Pseudomonas aeruginosa

• Lizeth García-Torres,
• Idania De Alba Montero,
• Eleazar Samuel Kolosovas-Machuca,
• Facundo Ruiz,
• Sumati Bhatia,
• Jose Luis Cuellar Camacho and
• Jaime Ruiz-García

Beilstein J. Nanotechnol. 2025, 16, 1171–1183, doi:10.3762/bjnano.16.86

• specific molecular agents is critical in generating strategies to control their undesired propagation. Atomic force microscopy (AFM) is a powerful, sensitive technique that scans the surface topography of a sample with an ultra-sharp tip while monitoring the interaction forces between this tip and the

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• ; low resolution; super resolution; Introduction The capability of atomic force microscopy (AFM) to achieve high resolution at the nanometer level in plane (xy) and at the angstrom level in height (z), on a variety of surfaces, is one of its major advantages. AFM topographical imaging enables high

Single-layer graphene oxide film grown on α-Al₂O₃(0001) for use as an adsorbent

• Shiro Entani,
• Mitsunori Honda,
• Masaru Takizawa and
• Makoto Kohda

Beilstein J. Nanotechnol. 2025, 16, 1082–1087, doi:10.3762/bjnano.16.79

• Figure 1 shows an atomic force microscopy (AFM) image of SLG and SLGO on α-Al2O3(0001) substrates. The as-grown SLG film has an atomically flat surface and wrinkles with its height less than 0.4 nm [18]. The single layer of graphene was confirmed through X-ray photoelectron spectroscopy (XPS) peak

• was removed from the SLGO surface by water rinsing and then the Cs-adsorbed SLGO specimen was introduced in the XPS chamber kept at ultra-high vacuum. The surface morphology of SLGO was examined using atomic force microscopy (AFM, SII SAP300). AFM images of (a) SLG/α-Al2O3(0001) and (b) SLGO/α-Al2O3

Soft materials nanoarchitectonics: liquid crystals, polymers, gels, biomaterials, and others

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2025, 16, 1025–1067, doi:10.3762/bjnano.16.77

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• processes and warrants further investigation. Scanning probe microscopy (SPM) methods, such as atomic force microscopy (AFM), have been employed to image mitochondria in liquid, showing features of both the inner and outer membrane [22][23][24]. However, AFM measurements are influenced by the cantilever

Focused ion beam-induced platinum deposition with a low-temperature cesium ion source

• Thomas Henning Loeber,
• Bert Laegel,
• Meltem Sezen,
• Feray Bakan Misirlioglu,
• Edgar J. D. Vredenbregt and
• Yang Li

Beilstein J. Nanotechnol. 2025, 16, 910–920, doi:10.3762/bjnano.16.69

• magnetic or superconductive structures can be created [1][2][3][4]. Also, specific mechanical structures on atomic force microscopy (AFM) cantilevers can be made [5][6]. In the literature, four mechanisms are used to explain the complex process of focused ion beam-induced deposition (FIBID) [5][7]; the

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• using a WITec alpha300 RA Raman spectrometer under excitation with a 532 nm solid-state diode laser operated at 10 mW. The topography of the films is examined using atomic force microscopy (AFM) with a Bruker Multimode 8 instrument. The surface morphology of pristine and implanted films is further

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• suitable substrates for characterization by scanning probe microscopy and SPEM. An atomic force microscopy (AFM) image of a typical InP p–n junction nanowire is shown in Figure 2a, confirming a homogeneous shape with a nanowire length of about 2.5 µm and a diameter of about 200 nm, fluctuating only by a

High-temperature epitaxial growth of tantalum nitride thin films on MgO: structural evolution and potential for SQUID applications

• Michelle Cedillo Rosillo,
• Oscar Contreras López,
• Jesús Antonio Díaz,
• Agustín Conde Gallardo and
• Harvi A. Castillo Cuero

Beilstein J. Nanotechnol. 2025, 16, 690–699, doi:10.3762/bjnano.16.53

• . Atomic force microscopy (AFM, XE-70 Park Systems) in contact mode was used to study the surface morphology of the films. The synthesis protocol used in this study was modified from the work reported by Quintanar-Zamora et al. [15] by varying the substrate temperature and the nitrogen pressure. Results

The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination

• Konstantinos Bidinakis and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52

• scanning electron microscopy (SEM) and atomic force microscopy (AFM) images (See Supporting Information File 1, Section 4). The lateral resolution for both AFM and SEM measurements is a few nanometers. The AFM channel that exhibited the clearest contrast between the layers was the amplitude error signal

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• features. Scanning probe techniques have revolutionized nanoscale material characterization. Since the invention of scanning tunneling microscopy (STM) [16] and atomic force microscopy (AFM) [17], various electric force-based methods, called electrostatic force microscopy (EFM) methods, have emerged to

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• Oxford Instruments. EDX was performed with 6 keV electron beam at 500 pA, and the signals were collected for 60 s. Atomic force microscopy (AFM) measurements were conducted on an NT-MDT NTEGRA Spectra system, and data was analyzed using Gwyddion and Origin software. To accurately obtain the composition

N₂⁺-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films

• Usha Rani,
• Kafi Devi,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 495–509, doi:10.3762/bjnano.16.38

• of 1.5405 Å. Measurements were conducted with a fixed incident angle of 0.5°, and the X-ray tube was operated at 40 kV and 40 mA. The surface morphology was analyzed using a Bruker Multimode-8 atomic force microscopy (AFM). The optical characteristics of the molybdenum thin films were analyzed using

Performance optimization of a microwave-coupled plasma-based ultralow-energy ECR ion source for silicon nanostructuring

• Joy Mukherjee,
• Safiul Alam Mollick,
• Tanmoy Basu and
• Tapobrata Som

Beilstein J. Nanotechnol. 2025, 16, 484–494, doi:10.3762/bjnano.16.37

• confirm the formation of nanostructures as observed from atomic force microscopy (AFM) images. The thickness of the amorphous thin layer is in good agreement with Monte Carlo simulations (SRIM) [31]. The article further investigates and explains the optical response (by UV–vis spectrometry) of the