Hybridization vs decoupling: influence of an h-BN interlayer on the physical properties of a lander-type molecule on Ni(111)

• Maximilian Schaal,
• Takumi Aihara,
• Marco Gruenewald,
• Felix Otto,
• Jari Domke,
• Roman Forker,
• Hiroyuki Yoshida and
• Torsten Fritz

Beilstein J. Nanotechnol. 2020, 11, 1168–1177, doi:10.3762/bjnano.11.101

• a promising n-type contact for molecular electronics. Core level spectroscopy Finally, we investigated the chemical structure by means of X-ray photoelectron spectroscopy (XPS) at normal emission. In Figure 5 the N 1s, the C 1s and the B 1s spectra for DBP on bare Ni(111) as well as on h-BN/Ni(111

• 1s, (b) C 1s, and (c) B 1s X-ray photoelectron spectra of DBP on bare Ni(111) (approx. 1.0 MLE) as well as of h-BN on Ni(111), and of DBP on h-BN/Ni(111) (less ordered (approx. 1.0 MLE) and highly ordered (approx. 1.6 MLE)). The intensity is normalized to the peak maxima of the N 1s core levels and

Scanning tunneling microscopy and spectroscopy of rubrene on clean and graphene-covered metal surfaces

• Karl Rothe,
• Alexander Mehler,
• Nicolas Néel and
• Jörg Kröger

Beilstein J. Nanotechnol. 2020, 11, 1157–1167, doi:10.3762/bjnano.11.100

• near-edge X-ray absorption fine structure spectroscopy [15]. The observed chirality, R-C42H28 and L-C42H28, therefore results from the left or right pair of phenyl groups of a twisted C42H28 molecule being closer to the surface. On Au(111) the formation of homochiral clusters led to remarkable

Gram-scale synthesis of splat-shaped Ag–TiO₂ nanocomposites for enhanced antimicrobial properties

• Mohammad Jaber,
• Asim Mushtaq,
• Kebiao Zhang,
• Jindan Wu,
• Dandan Luo,
• Zihan Yi,
• M. Zubair Iqbal and
• Xiangdong Kong

Beilstein J. Nanotechnol. 2020, 11, 1119–1125, doi:10.3762/bjnano.11.96

• with ethanol and centrifuged for further use. Pure TiO2 NPs were also prepared by using the above method without the addition of Ag as a precursor. Sample characterizations The crystal structure of the samples was investigated through X-ray diffraction (XRD, ARL X'TRA, Thermo Techno, USA) using a

• Rigaku D/Max 2500 powder diffractometer with Cu Kα radiation (λ = 1.5406 Å). Scanning electron microscopy (SEM, JSM5610LV, JEOL, Japan) was used to observed the morphology of the Ag–TiO2 NPs. The sample components were examined by energy-dispersive X-ray spectroscopy. Fourier-transform infrared

• nanocomposites may also have potential to be used in wound healing, photocatalytic and toxic dye removal applications. X-ray diffraction (XRD) patterns of pure TiO2 NPs and Ag–TiO2 nanocomposites at different ratios. SEM and EDS images of the synthesized splat-shaped nanoparticles: (a) pure TiO2 NPs, (b, c) Ag

Straightforward synthesis of gold nanoparticles by adding water to an engineered small dendrimer

• Sébastien Gottis,
• Régis Laurent,
• Vincent Collière and
• Anne-Marie Caminade

Beilstein J. Nanotechnol. 2020, 11, 1110–1118, doi:10.3762/bjnano.11.95

• when the powdered form of this dendrimer was dissolved in water, as shown by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX) analyses. The dendrimers acted simultaneously as mild reducers and as nanoreactors, favoring the self-assembly of gold atoms and promoting

• -controlled nanoparticles (triangles and associated triangles) in an unprecedented way. Characterization of gold nanoparticles by energy-dispersive X-ray spectroscopy In order to determine the presence and location of the different elements energy-dispersive X-ray spectroscopy (EDX) analysis was also

• performed in parallel with TEM. All the characteristic X-ray lines expected from the gold L and M series were observed when focusing on the gold nanoparticles (Figure 4A). The signals obtained from the background (close to the nanoparticles) showed phosphorus and sulfur atoms both coming from the dendrimers

Plant growth regulation by seed coating with films of alginate and auxin-intercalated layered double hydroxides

• Vander A. de Castro,
• Valber G. O. Duarte,
• Danúbia A. C. Nobre,
• Geraldo H. Silva,
• Vera R. L. Constantino,
• Frederico G. Pinto,
• Willian R. Macedo and
• Jairo Tronto

Beilstein J. Nanotechnol. 2020, 11, 1082–1091, doi:10.3762/bjnano.11.93

• analytical techniques, including powder X-ray diffraction, thermogravimetric analysis coupled to differential scanning calorimetry and mass spectrometry, specific surface area measurement, and scanning electron microscopy. Bioassays were performed with the seeds coated with the composite film to assess the

• seeds to evaluate germination rate and germination speed index (GSI), and biometric analyses with the values of root area, root fresh matter, and shoot length of the plants. Results and Discussion Characterization of ZnAl-NAA-LDH The powder X-ray diffraction (XRD) patterns of neat NAA and ZnAl-NAA-LDH

• software by image) [33]. Root fresh matter determination was performed with the aid of a high-precision analytical scale (Shimadzu AUY 220). The length of the shoot of the plants was measured directly with a high-grade ruler (1:1.000). Characterizations techniques Powder X-ray diffraction patterns (XRD

A few-layer graphene/chlorin e6 hybrid nanomaterial and its application in photodynamic therapy against Candida albicans

• Selene Acosta,
• Carlos Moreno-Aguilar,
• Dania Hernández-Sánchez,
• Beatriz Morales-Cruzado,
• Erick Sarmiento-Gomez,
• Carla Bittencourt,
• Luis Octavio Sánchez-Vargas and
• Mildred Quintana

Beilstein J. Nanotechnol. 2020, 11, 1054–1061, doi:10.3762/bjnano.11.90

• graphene lattice. In the Raman spectrum of the FLG-Ce6 hybrid nanomaterial, the D band is overshadowed by the Raman signals of Ce6. Figure 1c shows the X-ray photoelectron spectroscopy (XPS) spectra of the hybrid nanomaterial and Ce6. The O 1s core level spectrum of the hybrid nanomaterial FLG-Ce6 is

• -ray photoelectron spectroscopy (XPS) with a VERSAPROBE PHI 5000 instrument from Physical Electronics, equipped with a monochromatic Al Kα X-ray source under ultrahigh vacuum conditions. The energy resolution was 0.7 eV. For the compensation of built-up charge on the sample surface during the

• power impinging on the sample was between 5 and 10 mW, the spatial resolution was 2 cm−1 and the spot size was ≈1 µm2. The samples were recorded from drops of the dispersions deposited on clean silicon wafers and left to dry under vacuum. The chemical composition of the samples was investigated using X

Excitonic and electronic transitions in Me–Sb₂Se₃ structures

• Nicolae N. Syrbu,
• Victor V. Zalamai,
• Ivan G. Stamov and
• Stepan I. Beril

Beilstein J. Nanotechnol. 2020, 11, 1045–1053, doi:10.3762/bjnano.11.89

• μm) could also be obtained from the crystal with the aid of adhesive tape. X-ray diffraction was performed in order to verify the quality of the crystalline sheets and their spatial crystalline groups. Optical transmission and reflection spectra were obtained on a double-grating spectrometer SDL-1

• a 1:2 aperture and 7 Å/mm linear dispersion. Results and Discussion The quality and composition of the single crystals were verified by optical and X-ray diffraction (XRD) analysis. The position of the atoms relative to the crystal lattice axes and the crystal XRD pattern is shown in Figure 1. A

• typical Sb2Se3 diffractogram is shown in Figure 1B. This result indicates the complete miscibility of the components during the synthesis process. The Sb2Se3 lattice parameters were determined based on the XRD analysis. The experimental interplanar distances dhkl, obtained from the X-ray data for Sb2Se3

Microwave-induced electric discharges on metal particles for the synthesis of inorganic nanomaterials under solvent-free conditions

• Vijay Tripathi,
• Harit Kumar,
• Anubhav Agarwal and
• Leela S. Panchakarla

Beilstein J. Nanotechnol. 2020, 11, 1019–1025, doi:10.3762/bjnano.11.86

• treatment is essential before using metal particles in further microwave arc experiments. All metal powders were treated with 0.5 M nitric acid under sonication for 10 min to create rough surfaces. In this process, copper partially gets oxidized to Cu2O. The X-ray diffraction (XRD) patterns show reflections

• copper. Graphitic carbon nitride (g-C3N4) or graphite powder (commercially available) are used as carbon source. g-C3N4 is synthesized and characterized according to [18]. X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) confirms the formation of g-C3N4 (Figure S1 in Supporting

• supernatant solution is collected for further characterization. Characterization of products The reaction products are characterized by X-ray diffraction (PANanalytical X’pert PRO), field-emission scanning electron microscopy (JEOL JSM 7600F, combined with energy-dispersive spectroscopy (EDS)), transmission

Gas-sensing features of nanostructured tellurium thin films

• Dumitru Tsiulyanu

Beilstein J. Nanotechnol. 2020, 11, 1010–1018, doi:10.3762/bjnano.11.85

• different operating temperatures with respect to scanning electron microscopy and X-ray diffraction analyses. It was shown that both types of films interacted with nitrogen dioxide, which resulted in a decrease of electrical conductivity. The gas sensitivity, as well as the response and recovery times

• (PhotoniTech Pte Ltd., Singapore) atomic force microscope. The surface morphology of the films was investigated using either a TESLA BS 340 or a VEGA TESCAN TS 5130 MM (TESCAN, Czech Republic) scanning electron microscope (SEM). To investigate the structural features of the grown films, X-ray analysis was

• one another. No Te crystallites were observed in this case. The structural phase state of the grown films was adequately confirmed by X-ray diffraction (XRD). Figure 2 shows the XRD patterns of Te films grown on either Pyrex glass (Figure 2A) or nanostructured Al2O3 substrates (Figure 2B). According

Uniform Fe₃O₄/Gd₂O₃-DHCA nanocubes for dual-mode magnetic resonance imaging

• Miao Qin,
• Yueyou Peng,
• Mengjie Xu,
• Hui Yan,
• Yizhu Cheng,
• Xiumei Zhang,
• Di Huang,
• Weiyi Chen and
• Yanfeng Meng

Beilstein J. Nanotechnol. 2020, 11, 1000–1009, doi:10.3762/bjnano.11.84

• (about 6.33 ± 0.09 nm) but were still monodisperse (Figure 2b,e). The change in size might have happened due to changes in the surface when the FGOA nanocubes were converted into FGDA nanocubes. In order to verify the composition and distribution of elements in the FGDA nanocubes, energy-dispersive X-ray

• . Characterization of nanocubes and nanoparticles A high-resolution transmission electron microscope (HRTEM, JEM-2010F, Japan), operated at an acceleration voltage of 200 kV, was used to investigate the morphology and size of the nanocubes. Energy-dispersive X-ray spectroscopy (EDS, Oxford, X-MaxN, UK) was used to

• analyze the distribution of the elements within the samples. The samples were ultrasonically homogenized for 30 minutes and an 8 μL aliquot was collected in a copper mesh and kept at 55 °C for 2 h. After drying, the samples were placed in the HRTEM for imaging. X-ray diffraction (XRD, UltimalV, Japan; Cu

Electrochemical nanostructuring of (111) oriented GaAs crystals: from porous structures to nanowires

• Elena I. Monaico,
• Eduard V. Monaico,
• Veaceslav V. Ursaki,
• Shashank Honnali,
• Vitalie Postolache,
• Karin Leistner,
• Kornelius Nielsch and
• Ion M. Tiginyanu

Beilstein J. Nanotechnol. 2020, 11, 966–975, doi:10.3762/bjnano.11.81

• mounted on the cold station of a LTS-22-C-330 cryogenic system. X-ray diffraction analysis of the samples was performed with a Philips X-Pert MPD System with Cu Kα1 radiation. Electrical contacts to GaAs nanowires. The contacts were realized using laser leam lithography (µPG 101, Heidelberg Instruments

Atomic layer deposition for efficient oxygen evolution reaction at Pt/Ir catalyst layers

• Stefanie Schlicht,
• Korcan Percin,
• Stefanie Kriescher,
• André Hofer,
• Claudia Weidlich,
• Matthias Wessling and
• Julien Bachmann

Beilstein J. Nanotechnol. 2020, 11, 952–959, doi:10.3762/bjnano.11.79

• particular, we have determined particle sizes by transmission electron microscopy (TEM), investigated the homogeneously mixed nature of the Pt/Ir catalyst by X-ray diffraction (XRD), selected-area electron diffraction (SAED), and X-ray photoelectron spectroscopy (XPS). We have also examined various ALD

• ), a rather thick layer of the order of 1 μm is observed. Some cracks can be detected on the egdes of the coating where the fibers cross, due to low transport rates at these locations and high mechanical stress. The existence of the noble metals is proven by energy-dispersive X-ray analysis (EDX

• this, a Pt/Ir mixture can be deposited along the TiO2 tube walls by atomic layer deposition (ALD). Energy-dispersive X-ray analysis confirms the presence of all elements expected (Figure 3d). The metallic nature of the ALD deposits, the lack of any segregation between Pt and Ir, and the metal oxide

Band tail state related photoluminescence and photoresponse of ZnMgO solid solution nanostructured films

• Vadim Morari,
• Aida Pantazi,
• Nicolai Curmei,
• Vitalie Postolache,
• Emil V. Rusu,
• Marius Enachescu,
• Ion M. Tiginyanu and
• Veaceslav V. Ursaki

Beilstein J. Nanotechnol. 2020, 11, 899–910, doi:10.3762/bjnano.11.75

• unavoidable in the structure transformation process, in a certain interval of Mg concentrations. The phase segregation process was investigated in detail by means of X-ray diffraction, element-specific near-edge X-ray absorption fine structure (NEXAFS), electron dispersive spectroscopy (EDS), atomic force

• substrate. The composition of the prepared films was determined by energy dispersive X-ray analysis (EDAX). Examples of the elemental composition analysis are presented in Figure 3 for ZnO and Zn0.6Mg0.4O films. The results of measurements demonstrate stoichiometric compositions within limits of the errors

• nanoparticles embedded into the ZnMgO matrix are useful for fast electron transport and high charge balance in quantum dot light emitting diodes [22]. The multiphase composition of films prepared by spin coating and annealed at temperatures lower that 450 °C was revealed by X-ray diffraction (XRD) analysis. As

Three-dimensional solvation structure of ethanol on carbonate minerals

• Hagen Söngen,
• Ygor Morais Jaques,
• Peter Spijker,
• Christoph Marutschke,
• Stefanie Klassen,
• Ilka Hermes,
• Ralf Bechstein,
• Lidija Zivanovic,
• John Tracey,
• Adam S. Foster and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2020, 11, 891–898, doi:10.3762/bjnano.11.74

• investigated in a combined X-ray reflectivity and MD study [15]. As a result, ethanol was found to form layers above the calcite surface. However, due to the lack of lateral resolution in the X-ray reflectivity measurements, no experimental information on the lateral order within the first layer has been

Key for crossing the BBB with nanoparticles: the rational design

• Sonia M. Lombardo,
• Marc Schneider,
• Akif E. Türeli and
• Nazende Günday Türeli

Beilstein J. Nanotechnol. 2020, 11, 866–883, doi:10.3762/bjnano.11.72

• interesting properties. They can be easily synthetized and coated or conjugated to carry various cargos, from small molecules to proteins and nucleic acids [174]. Furthermore, AuNPs show low immunogenicity and toxicity due to their inert core [78]. Finally, AuNPs could be used as X-ray contrast agent if their

Adsorption behavior of tin phthalocyanine onto the (110) face of rutile TiO₂

• Lukasz Bodek,
• Mads Engelund,
• Aleksandra Cebrat and
• Bartosz Such

Beilstein J. Nanotechnol. 2020, 11, 821–828, doi:10.3762/bjnano.11.67

• the position of a tin atom protruding from the macrocycle: “Sn-up” and “Sn-down”. Switching from the Sn-up to the Sn-down geometry can be realized by annealing the sample at 200 °C or by tip-induced manipulation (bias pulse). X-ray photoelectron spectroscopy (XPS) measurements reveal a lack of strong

• UHV system. Electrochemically etched Pt–Ir tips were used as probes. Stable empty-state STM images were collected in a constant-current mode (tunneling current It < 15 pA; bias voltage Utip < 2 V). X-ray photoelectron spectroscopy (XPS) was carried out by using a VG Scientific X-ray source Mark II (Mg

Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine

• K. Priya Madhuri,
• Abhay A. Sagade,
• Pralay K. Santra and
• Neena S. John

Beilstein J. Nanotechnol. 2020, 11, 814–820, doi:10.3762/bjnano.11.66

• Technology, Kattankulathur 603 203, Tamil Nadu, India 10.3762/bjnano.11.66 Abstract The influence of single-layer graphene on top of a SiO2/Si surface on the orientation of nonplanar lead phthalocyanine (PbPc) molecules is studied using two-dimensional grazing incidence X-ray diffraction. The studies

• specific device applications. Keywords: conducting atomic force microscopy (C-AFM); lead phthalocyanine (PbPc); molecular orientation; single-layer graphene; substrate effect; two-dimensional grazing incidence X-ray diffraction (2D-GIXRD); Introduction Organic semiconductors have been extensively used in

• molecules such as FePc, CoPc, CuPc and ZnPc, which form layers in a face-on configuration [16][17][18][19]. A combination of brilliant synchrotron radiation and a highly sensitive 2D X-ray detector are employed to establish the structure and orientation of organic molecules such as MPcs, pentacene and P3HT

Epitaxial growth and superconducting properties of thin-film PdFe/VN and VN/PdFe bilayers on MgO(001) substrates

• Wael M. Mohammed,
• Igor V. Yanilkin,
• Amir I. Gumarov,
• Airat G. Kiiamov,
• Roman V. Yusupov and
• Lenar R. Tagirov

Beilstein J. Nanotechnol. 2020, 11, 807–813, doi:10.3762/bjnano.11.65

• composition were controlled by X-ray photoelectron spectroscopy. In situ low-energy electron diffraction and ex situ X-ray diffraction show that the 30 nm thick single-layer VN as well as the double-layer VN(30 nm)/Pd0.92Fe0.08(12 nm) and Pd0.96Fe0.04(20 nm)/VN(30 nm) structures have grown cube-on-cube

• −xFex were taken at each deposition step using low-energy electron diffraction (LEED) and X-ray photoelectron spectroscopy (XPS). Finally, all structures were capped with 10 nm layer of undoped Si by magnetron sputtering to prevent sample deterioration. Thus, a VN film and stacks of Pd0.96Fe0.04/VN and

• , VN and Pd: aMgO = 421.2 pm, aVN = 413.7 pm [35] and aPd = 389.1 pm. Thus, the lattice mismatch between MgO and VN is only about 1.7%, and between Pd and VN it is as small as 5.95%. The in situ LEED analysis was corroborated with ex situ X-ray diffraction (XRD, BRUKER D8, Germany) measurements using

Nickel nanoparticles supported on a covalent triazine framework as electrocatalyst for oxygen evolution reaction and oxygen reduction reactions

• Secil Öztürk,
• Yu-Xuan Xiao,
• Dennis Dietrich,
• Beatriz Giesen,
• Juri Barthel,
• Jie Ying,
• Xiao-Yu Yang and
• Christoph Janiak

Beilstein J. Nanotechnol. 2020, 11, 770–781, doi:10.3762/bjnano.11.62

• Information File 1). As expected, both CTF-1-400 and CTF-1-600 (as-synthesized) showed limited long-range order according to powder X-ray diffraction (PXRD) measurements (Figure S1, Supporting Information File 1) [32][42]. Nitrogen sorption measurements for CTF-1-400 showed a type-I isotherm with 954 m2/g

• the activity of the CTF-1-600. X-ray photoelectron spectroscopy (XPS) provides information about the chemical composition and chemical state of elements. The Ni 2p and N 1s spectra of the materials are shown in Figure 5 and Figure S15–S18, Supporting Information File 1. The Ni 2p spectrum of Ni/CTF-1

• bis(trifluoromethylsulfonyl)imide ([BMIm][NTf2]) was synthesized in two steps following a literature procedure [67]. The anion purity of IL by ion chromatography was found to be above 99% and the water content of the IL by Karl-Fischer titration was less than 10 ppm. Methods Powder X-ray diffraction

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

• means, such as optical reflectance and absorption, electron energy loss spectroscopy, X-ray absorption, emission, and inelastic scattering. Regarding luminescence studies, PL is the light emission, i.e., the electromagnetic radiation from matter after the absorption of photons. It is originated by

Effect of Ag loading position on the photocatalytic performance of TiO₂ nanocolumn arrays

• Jinghan Xu,
• Yanqi Liu and
• Yan Zhao

Beilstein J. Nanotechnol. 2020, 11, 717–728, doi:10.3762/bjnano.11.59

• structures were observed using a field emission scanning electron microscope (FE-SEM, FEI, Tecnai G2 F30). The elemental composition and valence distribution of the film were measured by X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, ESCALAB 250Xi). The photoluminescence (PL) intensity of

• structure. Figure 2c shows the energy-dispersive X-ray spectroscopy (EDS) spectrum of TNC, and we find that the elements of the array are mainly composed of C, O, and Ti. Among them, C comes from organic substrates. Figure 2d, 2e, and 2f are AFT structures with thickness of Ag deposition of 10, 20, and 40

Structural optical and electrical properties of a transparent conductive ITO/Al–Ag/ITO multilayer contact

• Aliyu Kabiru Isiyaku,
• Ahmad Hadi Ali and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2020, 11, 695–702, doi:10.3762/bjnano.11.57

• pure ITO layer (as reference) were prepared by RF and DC sputtering. The microstructural, optical and electrical properties of the ITO/Al–Ag/ITO (IAAI) films were investigated before and after annealing at 400 °C. X-ray diffraction measurements show that the insertion of the Al–Ag intermediate bilayer

• –Ag/ITO) are examined. Moreover, annealing was carried out at 400 °C with an ITO/Al–Ag/ITO (IAAI) multilayer film and a pure ITO film for comparison. Results and Discussion Figure 1 shows the X-ray diffraction (XRD) patterns for as-deposited and annealed IAAI multilayer films. The as-deposited film

• annealing on the Si substrate obtained using energy-dispersive X-ray spectroscopy (EDXS) are displayed in Table 1. A reduction of the oxygen content was observed after annealing. The content of metal and semiconductor materials accordingly increases. Si as substrate material shows the highest content. The

Correction: An advanced structural characterization of templated meso-macroporous carbon monoliths by small- and wide-angle scattering techniques

• Felix M. Badaczewski,
• Marc O. Loeh,
• Torben Pfaff,
• Dirk Wallacher,
• Daniel Clemens and
• Bernd M. Smarsly

Beilstein J. Nanotechnol. 2020, 11, 678–679, doi:10.3762/bjnano.11.54

• structure; small-angle neutron scattering (SANS); wide-angle X-ray scattering (WAXS); The following graph (A) should be implemented in Figure 4 of the original article, since it was part of the manuscript and was accidently removed during the revision process. No other change in the corresponding text and

Exfoliation in a low boiling point solvent and electrochemical applications of MoO₃

• Matangi Sricharan,
• Bikesh Gupta,
• Sreejesh Moolayadukkam and
• H. S. S. Ramakrishna Matte

Beilstein J. Nanotechnol. 2020, 11, 662–670, doi:10.3762/bjnano.11.52

• the MoO3 layers were recorded using a 532 nm excitation laser. X-ray diffractograms (XRD; Rigaku Smart lab) of the bulk and exfoliated MoO3 were obtained using a Cu Kα (1.54 Å) X-ray source. The surface potential of MoO3 dispersions was determined by zeta potential measurements using a Malvern

Observation of unexpected uniaxial magnetic anisotropy in La_2/3Sr_1/3MnO₃ films by a BaTiO₃ overlayer in an artificial multiferroic bilayer

• John E. Ordóñez,
• Lorena Marín,
• Luis A. Rodríguez,
• Pedro A. Algarabel,
• José A. Pardo,
• Roger Guzmán,
• Luis Morellón,
• César Magén,
• Etienne Snoeck,
• María E. Gómez and
• Manuel R. Ibarra

Beilstein J. Nanotechnol. 2020, 11, 651–661, doi:10.3762/bjnano.11.51

• using the pulsed-laser deposition technique. We analyzed the films structurally through X-ray reciprocal space maps and high-angle annular dark field microscopy, and magnetically via thermal demagnetization curves and in-plane magnetization versus applied magnetic field loops at room temperature. Our

• varied the layer thicknesses. We structurally analyzed samples by reciprocal space maps (RSMs) around the pseudocubic (103) reflection in an X-ray diffractometer and high-angle annular dark field in scanning transmission electron microscopy (HAADF-STEM). Local strain maps were reconstructed by the

• thickness of the LSMO layer systematically varied with tLSMO = 20, 27, and 40 nm, maintaining the thickness of the BTO layer constant at tBTO = 140 nm. The thickness of each individual layer was determined by X-ray reflectivity (not shown). The crystal structure analysis of each film was performed by means