Calibration of piezo actuators and systems by dynamic interferometry

• Knarik Khachatryan and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 2086–2091, doi:10.3762/bjnano.16.143

• ; Introduction Interferometric displacement detection stands as a cornerstone in high-precision techniques employed in cantilever-based atomic force microscopy (AFM), since its early days [1][2][3][4][5][6]. This method of cantilever displacement detection is specifically well suited for non-contact atomic force

• reflected light, affecting the amplitude calibration. Conclusion Our results demonstrate that a tube piezo, which is part of an interferometer for cantilever displacement detection, can precisely be calibrated by dynamic interferometry. However, care has to be taken in performing and analyzing experiments

• parts with high accuracy. This is commonly accomplished by piezo actuators, for instance, in the form of tube piezos for positioning the tip or optics. For their calibration, we propose an approach based on the dynamic response signal from a fiber interferometer used for cantilever displacement

Low-temperature AFM with a microwave cavity optomechanical transducer

• Ermes Scarano,
• Elisabet K. Arvidsson,
• August K. Roos,
• Erik Holmgren,
• Riccardo Borgani,
• Mats O. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

• by mechanical displacement noise and the force measurement is at the thermal limit. When T < T*, the measurement is dominated by detector noise and improvements to displacement detection will improve force sensitivity. Piezoelectric sensors with transimpedance amplifier detectors as reported by

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• . Khachartryan et al. highlight the strength of cantilever displacement detection with a Michelson-type fibre interferometer and provide a model for interferometric signal generation [4]. The interferometer response is slightly nonlinear under typical NC-AFM working conditions, while a large cantilever

Signal generation in dynamic interferometric displacement detection

• Knarik Khachatryan,
• Simon Anter,
• Michael Reichling and
• Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

• . Keywords: amplitude calibration; displacement detection; force microscopy; interferometer signal; NC-AFM; Introduction Optical interferometry is a reliable technique utilizing light waves to measure distance and displacement with high precision [1][2]. With the light wavelength as the length standard, a

• curve, where the slope of IM(d) is a maximum. Such an adjustment facilitates a most sensitive displacement detection. Note, that it is not possible to adjust the interferometer to d0 with a small number m because of limitations in positioning the fiber end face parallel to the cantilever surface. Upon

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• measured using the displacement detection system was controlled by an automatic gain control (AGC) circuit to keep the cantilever vibration amplitude A constant, and the frequency shift Δf of the cantilever was measured using a phase-locked loop (PLL) circuit (SPECS GmbH: Nanonis OC4). AFM measurements

Understanding interferometry for micro-cantilever displacement detection

• Alexander von Schmidsfeld,
• Tobias Nörenberg,
• Matthias Temmen and
• Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

• Alexander von Schmidsfeld Tobias Norenberg Matthias Temmen Michael Reichling Fachbereich Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany 10.3762/bjnano.7.76 Abstract Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM

• effects; Introduction A common method for measuring the displacement of a micro-cantilever or another micro-mechanical device is interferometric displacement detection. The most basic interferometer setup is the Michelson interferometer using two mirrors for the superposition of two light beams [1][2]. A

• measurement makes the interferometer a suitable system for displacement detection in a cantilever based non-contact atomic force microscope (NC-AFM) [7]. In contrast to a classical interferometer, the setup commonly involving a fiber end and a cantilever is characterized by a significant beam divergence and a